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二原子間に生ずる相互作用力とトンネル電流との普遍的関係性の検証

Research Project

Project/Area Number 22760028
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeSingle-year Grants
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionOsaka University

Principal Investigator

杉本 宜昭  Osaka University, 工学(系)研究科(研究院), その他 (00432518)

Project Period (FY) 2010 – 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2011: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2010: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
Keywords原子間力顕微鏡 / 走査型トンネル顕微鏡
Research Abstract

・原子間力顕微鏡,(AFM)で原子分解能を得るには、カンチレバーを共振周波数で振動させる周波数変調法が使われる。本研究では、カンチレバーを小さい振幅で振動させるほど、空間分解能と相互作用力測定のS/N比が向上することを理論計算で明らかにした。AFMを小振幅で動作させるためには、バネ定数が大きいカンチレバーを使う必要があるが、水晶カンチレバーをピエゾ電気で検出する従来の方式では、感度があまり上がらないことが知られている。そこで、水晶カンチレバーと光干渉方式変位検出型を組み合わせたAFMを開発し、実際に小振幅動作が可能であることを確かめた。これにより、原子分解能の像の取得に加えて、フォーススペクトロスコピーが高感度に行えることを実証した。
・Pb/si(111)-(7x7)表面上のSi原子と置換原子であるPb原子の上でトンネル電流と相互作用力の同時測定を行った。実験には、金属コートされたSiカンチレバーを使用し、室温での熱ドリフトを補償して精密な実験を行った。その結果、Si,Pb両方の原子共に、トンネル電流と相互作用力が探針-試料間距離に対して指数関数的に増大することが明らかになった。また、トンネル電流と相互作用力の距離依存性の関係であるが、距離範囲によって依存性が変化し、過去の理論で予想されるよりも複雑なものとなった。一方、理論計算では、トンネル電流と相互作用力はほぼ、同じ減衰距離を持つ指数関数で書けることが分かった。

Report

(1 results)
  • 2010 Annual Research Report
  • Research Products

    (28 results)

All 2011 2010 Other

All Journal Article (9 results) (of which Peer Reviewed: 9 results) Presentation (18 results) Remarks (1 results)

  • [Journal Article] Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope2011

    • Author(s)
      Insook Yi
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: Vol.50

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Observation of Subsurface Atoms of the Si(111)-(7×7) Surface by Atomic Force Microscopy2010

    • Author(s)
      Daisuke Sawada
    • Journal Title

      Appl.Phys.Express

      Volume: Vol.3

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Accurate formula for conversion of tunneling current in dynamic atomic force spectroscopy2010

    • Author(s)
      J.E.Sader
    • Journal Title

      Appl.Phys.Lett.

      Volume: Vol.97

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer2010

    • Author(s)
      Kenichi Morita
    • Journal Title

      Nanotechnology

      Volume: Vol.21

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy2010

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Applied Physics Letters

      Volume: Vol.96

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Simultaneous AFM and STM measurements on the Si(111)-(7x7) surface2010

    • Author(s)
      Yoshiaki Sugimoto
    • Journal Title

      Physical Review B

      Volume: Vol.81

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Simultaneous atomic force and scanning tunneling microscopy study of the Ge(111)-c(2×8) surface2010

    • Author(s)
      Daisuke Sawada
    • Journal Title

      Journal of Vacuum Science & Technology B

      Volume: Vol.28

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] NC-AFM imaging of the TiO_2(110)-(1×1) surface at low temperature2010

    • Author(s)
      Ayhan Yurtsever
    • Journal Title

      Nanotechnology

      Volume: Vol.21

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Journal Article] 単原子ペンによるナノパターンニング2010

    • Author(s)
      森田清三
    • Journal Title

      顕微鏡

      Volume: Vol.45 Pages: 51-54

    • Related Report
      2010 Annual Research Report
    • Peer Reviewed
  • [Presentation] 走査型プローブ顕微鏡を用いたナノテクノロジー2010

    • Author(s)
      杉本宜昭
    • Organizer
      日本顕微鏡学会関西支部特別企画講演会
    • Place of Presentation
      大阪府(池田市)
    • Year and Date
      2010-12-18
    • Related Report
      2010 Annual Research Report
  • [Presentation] Simultaneous AFM and STM measurements at room temperature2010

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      The 18th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Sizuoka, Japan (Atagawa Haitsu)(Oral ; S5-3, p.11)
    • Year and Date
      2010-12-10
    • Related Report
      2010 Annual Research Report
  • [Presentation] Simultaneous force and current mapping of the Si(111)-(7x7) surface by dynamic force microscopy2010

    • Author(s)
      Keiichi Ueda
    • Organizer
      The 18th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Sizuoka, Japan (Atagawa Haitsu)(Poster ; S4-2, p.39)
    • Year and Date
      2010-12-10
    • Related Report
      2010 Annual Research Report
  • [Presentation] Force spectroscopy on hydrogen adsorbed Si(111)-(7x7) surface using dynamic force microscopy2010

    • Author(s)
      Masaki Fukumoto
    • Organizer
      The 18th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Sizuoka, Japan (Atagawa Haitsu)(Poster ; S4-3, p.40)
    • Year and Date
      2010-12-10
    • Related Report
      2010 Annual Research Report
  • [Presentation] High spring constant cantilever for small amplitude dynamic force microscopy using an optical interferometer2010

    • Author(s)
      Kenichi Morita
    • Organizer
      The 18th International Colloquium on Scanning Probe Microscopy
    • Place of Presentation
      Sizuoka, Japan (Atagawa Haitsu)(Oral ; S5-2, p.10)
    • Year and Date
      2010-12-10
    • Related Report
      2010 Annual Research Report
  • [Presentation] 原子間力顕微鏡を用いた水平原子操作に関わる相互作用力測定2010

    • Author(s)
      杉本宜昭
    • Organizer
      第30回表面科学学術講演会
    • Place of Presentation
      大阪府(吹田市)(口頭発表;6Ap-11、p.366)
    • Year and Date
      2010-11-06
    • Related Report
      2010 Annual Research Report
  • [Presentation] AFM/STM同時測定における化学結合とトンネル電流の相関2010

    • Author(s)
      澤田大輔
    • Organizer
      真空・表面科学合同講演会(第30回表面科学学術講演会・第51回真空に関する連合講演会)
    • Place of Presentation
      大阪府(吹田市)(Poster ; 5P-064Y、p.303)
    • Year and Date
      2010-11-05
    • Related Report
      2010 Annual Research Report
  • [Presentation] 水晶カンチレバーと光干渉計を用いた小振幅原子間力顕微鏡測定2010

    • Author(s)
      森田健一
    • Organizer
      第30回表面科学学術講演会
    • Place of Presentation
      大阪府(吹田市)(口頭発表;4Da-01S、p.58)
    • Year and Date
      2010-11-04
    • Related Report
      2010 Annual Research Report
  • [Presentation] 水晶カンチレバーと光干渉計を用いた小振幅原子間力顕微鏡2010

    • Author(s)
      森田健一
    • Organizer
      第71回応用物理学会学術講演会
    • Place of Presentation
      長崎県長崎市(長崎大学)(ポスター;P9-19)
    • Year and Date
      2010-09-16
    • Related Report
      2010 Annual Research Report
  • [Presentation] AFM/STM Simultaneous Imaging of the Si4 Tetramer2010

    • Author(s)
      Daisuke Sawada
    • Organizer
      13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
    • Place of Presentation
      Ishikawa, Japan (Kanazawa)(Poster ; P2-1-10, p.112)
    • Year and Date
      2010-08-02
    • Related Report
      2010 Annual Research Report
  • [Presentation] Impact of asymmetry tip structure on NC-AFM force mapping2010

    • Author(s)
      Hong Jing Chung
    • Organizer
      13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
    • Place of Presentation
      Ishikawa, Japan (Kanazawa)(Poster ; P2-2-16, p.136)
    • Year and Date
      2010-08-02
    • Related Report
      2010 Annual Research Report
  • [Presentation] Atom manipulation and force measurement by atomic force microscopy2010

    • Author(s)
      Hideki Tanaka
    • Organizer
      13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
    • Place of Presentation
      Ishikawa, Japan (Kanazawa)(Poster ; P2-1-14, p.116)
    • Year and Date
      2010-08-02
    • Related Report
      2010 Annual Research Report
  • [Presentation] Measurement of atom hopping probability and interaction force during atom manipulation on the Si(111)-(7x7) surface2010

    • Author(s)
      Yoshiaki Sugimoto
    • Organizer
      13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
    • Place of Presentation
      Ishikawa, Japan (Kanazawa)(Oral ; Su-1440, p.9)
    • Year and Date
      2010-08-01
    • Related Report
      2010 Annual Research Report
  • [Presentation] Small-amplitude dynamic force microscopy using a quartz cantilever combined with an optical interferometer2010

    • Author(s)
      Kenichi Morita
    • Organizer
      13th International Conference on Non-Contact Atomic Force Microscopy (NC-AFM2010)
    • Place of Presentation
      Ishikawa, Japan (Kanazawa)(Oral ; Su-1200, p.7)
    • Year and Date
      2010-08-01
    • Related Report
      2010 Annual Research Report
  • [Presentation] Small-amplitude dynamic force microscopy using a quartz cantilever and an optical interferometer2010

    • Author(s)
      Kenichi Morita
    • Organizer
      2nd Global COE Student Conference on Innovative Electronic Topics SCIENT2010
    • Place of Presentation
      Osaka, Japan (Suita)(Poster ; Po-01, p.50)
    • Year and Date
      2010-07-28
    • Related Report
      2010 Annual Research Report
  • [Presentation] NC-AFM/STM Measurements on the Semiconductor Surface2010

    • Author(s)
      Daisuke Sawada
    • Organizer
      13th International Conference on Intergranular and Interphase Boundaries in Materials
    • Place of Presentation
      Mie, Japan (Shima)(Poster ; P-C37, p.205)
    • Year and Date
      2010-07-01
    • Related Report
      2010 Annual Research Report
  • [Presentation] High spring constant cantilever with metal tip for small amplitude NC-AFM operation2010

    • Author(s)
      Kenichi Morita
    • Organizer
      International Conference on Core Research and Engineering Science of Advanced Materials (PSI-45)
    • Place of Presentation
      Osaka, Japan (Suita)
    • Year and Date
      2010-06-01
    • Related Report
      2010 Annual Research Report
  • [Presentation] 半導体表面におけるAFMISTM同時測定2010

    • Author(s)
      杉本宜昭
    • Organizer
      社団法人日本顕微鏡学会第66回学術講演会
    • Place of Presentation
      愛知県名古屋市(名古屋国際会議場)(招待講演;26aC04-S)
    • Year and Date
      2010-05-26
    • Related Report
      2010 Annual Research Report
  • [Remarks]

    • URL

      http://www.wakate.frc.eng.osaka-u.ac.jp/sugimoto/

    • Related Report
      2010 Annual Research Report

URL: 

Published: 2010-08-23   Modified: 2016-04-21  

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