Developing in-situ measurement for probing and analyzing carrier behavior in multilayer organic light-emitting diodes
Project/Area Number |
22760227
|
Research Category |
Grant-in-Aid for Young Scientists (B)
|
Allocation Type | Single-year Grants |
Research Field |
Electronic materials/Electric materials
|
Research Institution | Tokyo Institute of Technology |
Principal Investigator |
TAGUCHI Dai 東京工業大学, 大学院・理工学研究科, 産学官連携研究員 (00531873)
|
Project Period (FY) |
2010 – 2012
|
Project Status |
Completed (Fiscal Year 2012)
|
Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2012: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2011: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2010: ¥2,210,000 (Direct Cost: ¥1,700,000、Indirect Cost: ¥510,000)
|
Keywords | 電気 / 電子材料(半導体、誘電体、磁性体、超誘電体、有機物、絶縁体、超伝導体など) / 解析・評価 / 電子・電気材料 / 誘電体物性 / 電子デバイス・機器 / 長寿命化 / 有機EL / 有機薄膜太陽電池 / 劣化 / 電界誘起光第2次高調波発生法 / マックスウェル・ワグナー効果 / 有機EL / 空間電荷電界 / 誘電物性 / 電界計測 / フィルタリング / 時間分解測定 |
Research Abstract |
The electric-field-induced optical second-harmonic generation (EFISHG) measurement, which can directly probe carrier behavior in organic multilayer light-emitting diodes (OLEDs), was studied. The EFISHG measurement system is capable of catching carrier processes in the time range from 10 ns to 25 ms with carrier density > 10-7 C/cm2.
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Report
(4 results)
Research Products
(49 results)