Quantitative analysis method using a total-electron-yield soft X-ray absorption spectroscopy

• Project/Area Number: 23360291
• Research Category: Grant-in-Aid for Scientific Research (B)
• Allocation Type: Single-year Grants
• Section: 一般
• Research Field: Inorganic materials/Physical properties
• Research Institution: University of Hyogo
• Principal Investigator: MURAMATSU YASUJI 兵庫県立大学, 工学(系)研究科(研究院), 教授 (50343918)
• Project Period (FY): 2011-04-01 – 2014-03-31
• Project Status: Completed (Fiscal Year 2013)
• Budget Amount: ¥12,610,000 (Direct Cost: ¥9,700,000、Indirect Cost: ¥2,910,000); Fiscal Year 2013: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000); Fiscal Year 2012: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000); Fiscal Year 2011: ¥9,230,000 (Direct Cost: ¥7,100,000、Indirect Cost: ¥2,130,000)
• Keywords: 量子ビーム / 解析評価 / 複合材料 / ナノ材料 / 放射光 / 分析技術 / 炭素材料 / 解析•評価 / 複合材料・物性 / 複合材料・物性材料・物性 / 炭素材料材料

Research Abstract

To develop the quantitative analysis technique of carbon materials using X-ray absorption spectroscopy (XAS), we have investigated the total electron yield (TEY) of sp2/sp3 carbon atoms and hetero-atoms in carbon materials. TEY ratios between sp2 and sp3 carbon atoms of various carbon materials were successfully determined. It was found that the TEY ratios strongly depend on the electric conductivity of the components. Calibration curve for quantitative analysis sp2 carbon atoms have successfully obtained from the pi*/sigma* peak height ratio in the CK region of TEY-XANES (X-ray absorption near-edge structure). TEY-XAS technique has been successfully applied to evaluate the roof tiles on the Himeji Castle and the engine oils. CK-TEY-XANES of graphitic materials can also be well simulated by the first principle method of CASTEP. It is therefore concluded that high-resolution XAS and/or XANES measurements would be a powerful tool to finely analyze carbon materials.

Research Products

• [Journal Article] 姫路城いぶし瓦の劣化評価(1); 表面炭素膜の放射光軟X線吸収分析 (2014)
  • Author(s): 村松康司, 古川佳保, 村上竜平, 小林正治, Eric M. Gullikson
  • Journal Title: X線分析の進歩 Volume: 45 Pages: 149-171
  • NAID: 40020066360
• [Journal Article] ニュースバル多目的ビームライン BL10 における軟 X 線吸収分析(3); 液体有機化合物とエンジンオイルの状態分析 (2014)
  • Author(s): 植村智之, 村松康司, 南部啓太, 原田哲男, 木下博雄
  • Journal Title: X線分析の進歩 Volume: 45 Pages: 269-278
  • NAID: 40020066703
• [Journal Article] 姫路城いぶし瓦の劣化評価（１）； 表面炭素膜の放射光軟Ｘ線吸収分析 (2014)
  • Author(s): 村松康司，古川佳保，村上竜平，小林正治, E. M. Gullikson
  • Journal Title: Ｘ線分析の進歩 Volume: 45 Pages: 149-171
  • NAID: 40020066360
  • Peer Reviewed
• [Journal Article] ニュースバル多目的ビームラインBL10における軟X線吸収分析(3)； 液体有機化合物とエンジンオイルの状態分析 (2014)
  • Author(s): 植村智之, 村松康司, 南部啓太, 原田哲男, 木下博雄
  • Journal Title: Ｘ線分析の進歩 Volume: 45 Pages: 269-278
  • NAID: 40020066703
  • Peer Reviewed
• [Journal Article] Local structure analysis of heavily boron-doped diamond by soft X-ray spectroscopy (2013)
  • Author(s): Y. Muramatsu and Y. Yamamoto
  • Journal Title: Diamond Relat. Mater Volume: 39 Pages: 53-57
• [Journal Article] 放射光軟X線分光による軽元素材料の精密状態分析 (2013)
  • Author(s): 村松康司
  • Journal Title: まてりあ Volume: 52 Pages: 558-562
  • NAID: 130003388690
• [Journal Article] Identification of edge- and inner-carbon atoms in hexagonal carbon layers by X-ray absorption near-edge structure (XANES) and the first principle calculations (2013)
  • Author(s): Y. Muramatsu, T. Ooe, T. Okada, and E. M. Gullikson
  • Journal Title: Proceedins of the 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13 Volume: 13 Pages: 516-518
• [Journal Article] Quantitative and fingerprint analysis method of nitrogen in graphitic carbon materials using total-electron-yield soft X-ray absorption spectroscopy (2013)
  • Author(s): T. Amano, K. Shirode, Y. Muramatsu, E. M. Gullikson
  • Journal Title: Jpn. J. Appl. Phys Volume: 52 Pages: 41304-41304
  • NAID: 40019636923
• [Journal Article] Local structure analysis of heavily boron-doped diamond by soft X-ray spectroscopy (2013)
  • Author(s): Y. Muramatsu, Y. Yamamoto
  • Journal Title: Diamond Relat. Mater. Volume: 39 Pages: 53-57
  • DOI: 10.1016/j.diamond.2013.07.005
  • Peer Reviewed
• [Journal Article] Identification of edge- and inner-carbon atoms in hexagonal carbon layers by X-ray absorption near-edge structure (XANES) and the first principle calculations (2013)
  • Author(s): Y. Muramatsu, T. Ooe , T. Okada, E. M. Gullikson
  • Journal Title: Proceedins of the 9th International Symposium on Atomic Level Characterizations for New Materials and Devices ’13, ALC'13 Volume: no Pages: 516-518
• [Journal Article] 放射光軟Ｘ線分光による軽元素材料の精密状態分析 (2013)
  • Author(s): 村松康司
  • Journal Title: まてりあ Volume: 52 Pages: 558-562
  • NAID: 130003388690
  • Peer Reviewed
• [Journal Article] Quantitative and fingerprint analysis method of nitrogen in graphitic carbon materials using total-electron-yield soft X-ray absorption spectroscopy (2013)
  • Author(s): T. Amano, K. Shirode, Y. Muramatsu, E. M. Gullikson
  • Journal Title: Jpn. J. Appl. Phys. Volume: 52 Issue: 4R Pages: 41304-41304
  • DOI: 10.7567/jjap.52.041304
  • NAID: 40019636923
  • Peer Reviewed
• [Journal Article] Chemical-state analysis of organic semiconductors using soft X-ray absorption spectroscopy combined with first-principles calculation (2012)
  • Author(s): Y. Natsume, T. Kohno, T. Minakata, T. Konishi, E. M. Gullikson, Y. Muramatsu
  • Journal Title: J. Phys. Chem. A Volume: 116 Pages: 1527-1531
• [Journal Article] 炭素系試料の全電子収量 CK 端 XANES におけるπ*/σ*ピーク強度比の考察; sp^2 炭素と sp^3炭素からなる粒子混合系と分子系の比較 (2012)
  • Author(s): 村松康司, Eric M. Gullikson
  • Journal Title: X線分析の進歩 Volume: 43 Pages: 425-436
• [Journal Article] 金属基板上に蒸発乾固した液体有機化合物の全電子収量XANES測定 (2012)
  • Author(s): 村松康司, Eric M. Gullikson
  • Journal Title: X線分析の進歩 Volume: 43 Pages: 415-424
  • NAID: 40019263839
• [Journal Article] 金属基板上に蒸発乾固した液体有機化合物の全電子収量XANES測定 (2012)
  • Author(s): 村松康司, Eric M. Gullikson
  • Journal Title: Ｘ線分析の進歩 Volume: 43 Pages: 415-424
  • NAID: 40019263839
  • Peer Reviewed
• [Journal Article] 炭素系試料の全電子収量CK端XANESにおけるpi*/sigma*ピーク強度比の考察； sp2炭素とsp3炭素からなる粒子混合系と分子系の比較 (2012)
  • Author(s): 村松康司, Eric M. Gullikson
  • Journal Title: Ｘ線分析の進歩 Volume: 43 Pages: 425-436
  • Peer Reviewed
• [Presentation] 第一原理計算CASTEPによる炭素六角網面のCK端XANESシミュレーション (2014)
  • Author(s): 岡田融, 村松康司
  • Organizer: 第27回日本放射光学会年会・放射光科学合同シンポジウム
  • Place of Presentation: 広島国際会議場, 広島市
• [Presentation] CK端XANESにおける機械研磨黒鉛と縮合多環式芳香族化合物の類似点 (2014)
  • Author(s): 村山健太郎, 山田和俊, 村松康司
  • Organizer: 第27回日本放射光学会年会・放射光科学合同シンポジウム
  • Place of Presentation: 広島国際会議場, 広島市
• [Presentation] Local structure analysis of the highly-boron-doped diamond by soft X-ray spectroscopy (2013)
  • Author(s): Y. Muramatsu, Y. Yamamoto
  • Organizer: New Diamond and Nano Carbons Conference, NDNC 2013
  • Place of Presentation: Novotel Clarke Quay, Singapore
• [Presentation] Soft X-ray emission and absorption spectroscopy for electronic and local structure analysis of device materials (2013)
  • Author(s): Y. Muramatsu
  • Organizer: Pre-symposium of 33 ICSC (Wakita Symposium)
  • Place of Presentation: 福岡大学, 福岡市
  • Invited
• [Presentation] XANES Simulations of 1,4,7,10-Alkyltetracenes by the First-Principle Calculation, CASTEP (2013)
  • Author(s): Y. Muramatsu, T. Ooe
  • Organizer: The 12th Asian Conference on Analytical Sciences, ASIANALYSIS XII
  • Place of Presentation: 九州大学, 福岡市
• [Presentation] Evaluation of the Weathered Japanese Roof Tiles of the Himeji Castle; Soft X-Ray Absorption Analysis and SEM-EDX Observation (2013)
  • Author(s): R. Murakami, K. Furukawa, M. Kobayashi, E. M. Gullikson, Y. Muramatsu
  • Organizer: The 12th Asian Conference on Analytical Sciences, ASIANALYSIS XII
  • Place of Presentation: 九州大学, 福岡市
• [Presentation] X-Ray absorption near-edge structure (XANES) in the C K region of 1,4,7,10-alkyltetracenes (2013)
  • Author(s): Y. Muramatsu, T. Ooe, C. Kitamura. T. Kawase, E. M. Gullikson
  • Organizer: The 15th International Conference on Total Reflection X-Ray Fluorescence Analysis (TXRF2013) and Related Methods
  • Place of Presentation: 大阪市立大学, 大阪市
• [Presentation] Thickness measurements by SEM-EDX of carbon films on the weathered Japanese roof tiles in Himeji Castle (2013)
  • Author(s): R. Murakami, Y. Muramatsu
  • Organizer: The 15th International Conference on Total Reflection X-Ray Fluorescence Analysis (TXRF2013) and Related Methods
  • Place of Presentation: 大阪市立大学, 大阪市
• [Presentation] Identification of edge- and inner-carbon atoms in Hexagonal Carbon Layers by X-ray absorption near-edge structure (XANES) and by the first principle calculations (2013)
  • Author(s): Y. Muramatsu, T. Ooe, T. Okada, E. M. Gullikson
  • Organizer: The 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13, ALC'13
  • Place of Presentation: Sheraton Kona, Hawaii, USA
• [Presentation] CASTEPとDV-XαによるアルキルテトラセンのCK端XANES解析 (2013)
  • Author(s): 大江剛志, 村松康司
  • Organizer: 第26回DV-Xa研究会
  • Place of Presentation: 龍谷大学, 京都市
• [Presentation] 第一原理計算CASTEPによるアルキルテトラセンのCK端XANES解析 (2013)
  • Author(s): 大江剛志, 村松康司
  • Organizer: 第16回XAFS討論会
  • Place of Presentation: 東京大学, 東京都文京区
• [Presentation] 放射光軟Ｘ線吸収分光法と第一原理計算CASTEPによる機械研磨黒鉛の局所構造解析 (2013)
  • Author(s): 村山健太郎, 岡田融, 村上竜平, 村松康司
  • Organizer: 第40回炭素材料学会年会
  • Place of Presentation: 京都大学, 京都市
• [Presentation] 放射光軟Ｘ線吸収分光法による炭素材料の局所構造解析と化学状態分析 (2013)
  • Author(s): 村松康司
  • Organizer: 日本真空学会2013年12月例会
  • Place of Presentation: SPring-8, 兵庫県佐用郡
  • Invited
• [Presentation] ジカルボン酸における分子内sp2/sp3炭素の全電子収量比の計測 (2012)
  • Author(s): 竹綱一貴, 村松康司
  • Organizer: 第15回XAFS討論会
  • Place of Presentation: 鳥取市白兎会館
• [Presentation] CK端Ｘ線吸収における分子内sp2炭素/sp3炭素の全電子収量比 (2012)
  • Author(s): 村松康司, 竹綱一貴, 安藤奈々
  • Organizer: 第48回Ｘ線分析討論会
  • Place of Presentation: 名古屋大学
• [Presentation] 縮合多環芳香族化合物におけるCK端XANESの多変量解析 (2012)
  • Author(s): 玉谷幸代，村松康司
  • Organizer: 第48回Ｘ線分析討論会
  • Place of Presentation: 名古屋大学
• [Presentation] 平成の姫路城大天主保存修理における姫路城いぶし瓦の劣化分析 (2012)
  • Author(s): 古川佳保, 村上竜平, 松尾吉晃, 村松康司
  • Organizer: 関西分析研究会平成23年度第二回例会
  • Place of Presentation: 大阪市立大学
• [Presentation] Total-electron-yield (TEY) soft X-ray absorption spectroscopy of the sp2/sp3-carbon mixtures; Relationship between the TEY efficiency and electrical conductivity (2011)
  • Author(s): Y. Muramatsu, Y. Yoshinaga, H. Tanaka, and E. M. Gullikson
  • Organizer: International Workshop on Improving Data Quality and Quantity for XAFS Experiments, Q2XAFS2011
  • Place of Presentation: 高エネルギー加速器研究機構
• [Presentation] 全電子収量軟 X 線吸収分光法と第一原理計算を用いた有機半導体材料の酸化务化解析 (2011)
  • Author(s): 夏目穣, 河野禎市郎, 南方尚, 小西徳三, 村松康司
  • Organizer: 第47回X線分析討論会
  • Place of Presentation: 九州大学
• [Presentation] Sp2/sp3炭素の組成比定量に対する全電子収量軟Ｘ線吸収分光法の可能性 (2011)
  • Author(s): 村松康司
  • Organizer: 第38回炭素材料学会年会
  • Place of Presentation: 名古屋大学
• [Presentation] 第一原理計算CASTEP による炭素六角網面の CK 端XANES シミュレーション
  • Author(s): 岡田融, 村松康司
  • Organizer: 第27回日本放射光学会年会・放射光科学合同シンポジウム
• [Presentation] CK端 XANES における機械研磨黒鉛と縮合多環式芳香族化合物の類似点
  • Author(s): 村山健太郎, 山田和俊, 村松康司
  • Organizer: 第27回日本放射光学会年会・放射光科学合同シンポジウム
• [Presentation] CASTEP と DV-Xαによるアルキルテトラセンの CK 端 XANES解析
  • Author(s): 大江剛志, 村松康司
  • Organizer: 第26回DV-Xa 研究会
• [Presentation] 第一原理計算CASTEP によるアルキルテトラセンの CK端 XANES 解析
  • Author(s): 大江剛志, 村松康司
  • Organizer: 第16回XAFS 討論会
• [Presentation] 放射光軟X線吸収分光法と第一原理計算 CASTEP による機械研磨黒鉛の局所構造解析
  • Author(s): 村山健太郎, 岡田融, 村上竜平, 村松康司
  • Organizer: 第40回炭素材料学会年会
• [Presentation] 放射光軟X線吸収分光法による炭素材料の局所構造解析と化学状態分析
  • Author(s): 村松康司
  • Organizer: 日本真空学会 2013年12月例会
• [Presentation] Local structure analysis of the highly-boron-doped diamond by soft X-ray spectroscopy
  • Author(s): Y. Muramatsu and Y. Yamamoto
  • Organizer: New Diamond and Nano Carbons Conference, NDNC 2013
  • Place of Presentation: Singapore
• [Presentation] Soft X-ray emission and absorption spectroscopy for electronic and local structure analysis of device materials
  • Author(s): Y. Muramatsu
  • Organizer: Pre-symposium of 33 ICSC(Wakita Symposium)
  • Place of Presentation: Fukuoka
• [Presentation] XANES Simulations of 1,4,7,10-Alkyltetracenes by the First-Principle Calculation, CASTEP
  • Author(s): Y. Muramatsu and T. Ooe
  • Organizer: The 12th Asian Conference on Analytical Sciences, ASIANALYSIS XII
  • Place of Presentation: Fukuoka
• [Presentation] Evaluation of the Weathered Japanese Roof Tiles of the Himeji Castle; Soft X-Ray Absorption Analysis and SEM-EDX Observation
  • Author(s): R. Murakami, K. Furukawa, M. Kobayashi, E. M. Gullikson, and Y. Muramatsu
  • Organizer: The 12th Asian Conference on Analytical Sciences, ASIANALYSIS XII
  • Place of Presentation: Fukuoka
• [Presentation] X-Ray absorption near-edge structure (XANES) in the C K region of 1,4,7,10-alkyltetracenes
  • Author(s): Y. Muramatsu, T. Ooe, C. Kitamura. T. Kawase, and E. M. Gullikson
  • Organizer: The 15th International Conference on Total Reflection X-Ray Fluorescence Analysis (TXRF2013) and Related Methods, and the 49th Annual Conference on X-Ray Chemical Analysis
  • Place of Presentation: Osaka
• [Presentation] Thickness measurements by SEM-EDX of carbon films on the weathered Japanese roof tiles in Himeji Castle
  • Author(s): R. Murakami and Y. Muramatsu
  • Organizer: The 15th International Conference on Total Reflection X-Ray Fluorescence Analysis (TXRF2013) and Related Methods, and the 49th Annual Conference on X-Ray Chemical Analysis
  • Place of Presentation: Osaka
• [Presentation] Identification of edge- and inner-carbon atoms in Hexagonal Carbon Layers by X-ray absorption near-edge structure (XANES) and by the first principle calculations
  • Author(s): Y. Muramatsu, T. Ooe, T. Okada, and E. M. Gullikson
  • Organizer: The 9th International Symposium on Atomic Level Characterizations for New Materials and Devices '13
  • Place of Presentation: Hawaii, USA
• [Presentation] ジカルボン酸における分子内 sp^2 /sp^3 炭素の全電子収量比の計測
  • Author(s): 竹綱一貴, 村松康司
  • Organizer: 第15回XAFS討論会
• [Presentation] CK 端X線吸収における分子内 sp2 炭素/sp3 炭素の全電子収量比
  • Author(s): 村松康司, 竹綱一貴, 安藤奈々
  • Organizer: 第48回X線分析討論会
• [Presentation] 縮合多環芳香族化合物における CK 端 XANES の多変量解析
  • Author(s): 玉谷幸代, 村松康司
  • Organizer: 第48回X線分析討論会
• [Presentation] 全電子収量軟 X 線吸収分光法と第一原理計算を用いた有機半導体材料の酸化劣化解析
  • Author(s): 夏目穣, 河野禎市郎, 南方尚, 小西徳三, 村松康司
  • Organizer: 第47回X線分析討論会
• [Presentation] Sp2/sp3 炭素の組成比定量に対する全電子収量軟X線吸収分光法の可能性
  • Author(s): 村松康司
  • Organizer: 第38回炭素材料学会年会
• [Presentation] Total-electron-yield (TEY) soft X-ray absorption spectroscopy of the sp^2 /sp^3 -carbon mixtures; Relationship between the TEY efficiency and electrical conductivity
  • Author(s): Y. Muramatsu, Y. Yoshinaga, H. Tanaka, and E. M. Gullikson
  • Organizer: International Workshop on Improving Data Quality and Quantity for XAFS Experiments
  • Place of Presentation: Tsukuba
• [Book] 放射光軟X線吸収分光法による軽元素半導体材料の電子・化学状態解析, 『高分子破壊・劣化時の破壊写真・データ集』 第16章 (2014)
  • Author(s): 村松康司, 夏目穣
  • Publisher: 技術情報協会
• [Remarks] 研究室ホームページ
  • URL: http://www.eng.u-hyogo.ac.jp/msc/msc7/