| Budget Amount *help |
¥4,940,000 (Direct Cost: ¥3,800,000、Indirect Cost: ¥1,140,000)
Fiscal Year 2013: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2012: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2011: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
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| Outline of Final Research Achievements |
Basic research for nano scale material analysis has been carried out to establish local photoemission and optical reflection on a nanoscale. The electromagnetic field enhancement in a small cavity of STM has been utilized to detect the enhanced signal in a nano scale are. Firstly, the photo-excited current can be detected by STM, where the material in the STM tunnel junction is excited by laser beam. We have studied the photo-excitation in the electromagnetic cavity of STM surrounded by STM tip and noble metal sample using pulse laser with high photon density. We have measured the current as a function of the gap distance between STM tip and sample(~1-2nm) with various power of incident laser up to 30mW. We obtained the current change as a function of gap distance, which is different from the current change in ordinary STM tunneling current.
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