Study of Plasmon-enhanced Photoelectron-excitaion in Nanosscale Cavity
Project/Area Number |
23540373
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Research Category |
Grant-in-Aid for Scientific Research (C)
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Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Condensed matter physics I
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Research Institution | Kyushu Institute of Technology |
Principal Investigator |
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Project Period (FY) |
2011-04-28 – 2015-03-31
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Project Status |
Completed (Fiscal Year 2014)
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Budget Amount *help |
¥4,940,000 (Direct Cost: ¥3,800,000、Indirect Cost: ¥1,140,000)
Fiscal Year 2013: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2012: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2011: ¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000)
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Keywords | 局所光電子放出 / STM / 空気中光電子分光 / ナノスケール / プラズモン / プラズモン共鳴 / ニアフィールド / SPR / 局所光電子励起 / 光励起トンネル電流 / ナノキャビティ / トンネル発光 / 時間分解測定 / プラズモン増強 / トンネル顕微鏡 / 分子発光 / 光電子励起 / STM |
Outline of Final Research Achievements |
Basic research for nano scale material analysis has been carried out to establish local photoemission and optical reflection on a nanoscale. The electromagnetic field enhancement in a small cavity of STM has been utilized to detect the enhanced signal in a nano scale are. Firstly, the photo-excited current can be detected by STM, where the material in the STM tunnel junction is excited by laser beam. We have studied the photo-excitation in the electromagnetic cavity of STM surrounded by STM tip and noble metal sample using pulse laser with high photon density. We have measured the current as a function of the gap distance between STM tip and sample(~1-2nm) with various power of incident laser up to 30mW. We obtained the current change as a function of gap distance, which is different from the current change in ordinary STM tunneling current.
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Report
(5 results)
Research Products
(11 results)
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[Journal Article] Inelastic electron-tunneling spectroscopy of nanoporous gold films2014
Author(s)
H. W. Liu, R. Nishitani, T. Fujita, W. Li, L. Zhang, X. Y. Lang, P. Richard, K. S. Nakayama, X. Chen, M. W. Chen, and Q. K. Xue
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Journal Title
PHYSICAL REVIEW B
Volume: 89
Issue: 3
Pages: 035426-035426
DOI
Related Report
Peer Reviewed
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