Liquid phase growth of nitride semiconductors by using plasma mixture of nitrogen and hydrogen
Project/Area Number |
23560014
|
Research Category |
Grant-in-Aid for Scientific Research (C)
|
Allocation Type | Multi-year Fund |
Section | 一般 |
Research Field |
Applied materials science/Crystal engineering
|
Research Institution | Shizuoka Institute of Science and Technology |
Principal Investigator |
OZAWA Tesuo 静岡理工科大学, 理工学部, 教授 (90247578)
|
Project Period (FY) |
2011 – 2013
|
Project Status |
Completed (Fiscal Year 2013)
|
Budget Amount *help |
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2012: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2011: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
|
Keywords | 窒化物 / 液相成長 / プラズマ / バルク成長 / 混晶 / 半導体 / AlN / GaN / 溶液成長 / 結晶成長 / マイク波プラズマ / InGaN / 窒素プラズマ / 窒化物半導体 / 低温低圧成長 |
Research Abstract |
GaN single crystals of wurtzite structure were grown on the AlN/Al2O3 substrate by reacting gallium metal with atomic nitrogen-hydrogen in a microwave plasma. AlN/Al2O3 substrates were prepared by nitriding (0001) sapphire substrates with atomic nitrogen in a microwave plasma. GaN layer of about 10 m was grown on AlN/Al2O3 substrate with a growth rate of 2.5 m/h. It was found that the layer was nearly oriented to (0001)GaN//(0001) sapphire by X-ray diffraction (XRD) measurement. PL spectrum showed a strong band edge emission at 3.3 eV at room temperature without a yellow emission due to deep level. A full-width at half-maximum was approximately 230 meV. These properties suggest high crystalline GaN was grown on the AlN/Al2O3 substrate by solution growth under nitrogen and hydrogen plasma mixture. InxGa1-xN(x<0.15)single crystals were also grown by our methods.
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Report
(4 results)
Research Products
(3 results)