| Project/Area Number |
23560022
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | The University of Electro-Communications |
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Principal Investigator |
SUZUKI Masaru 電気通信大学, 情報理工学(系)研究科, 教授 (20196869)
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| Co-Investigator(Kenkyū-buntansha) |
MIURA Kouji 愛知教育大学, 教育学部, 教授 (50190583)
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| Project Period (FY) |
2011-04-28 – 2015-03-31
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| Project Status |
Completed (Fiscal Year 2014)
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| Budget Amount *help |
¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2013: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2012: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2011: ¥2,990,000 (Direct Cost: ¥2,300,000、Indirect Cost: ¥690,000)
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| Keywords | 摩擦 / QCM-AFM / グラファイト / C60 / ナノベアリング / トムリンソンモデル / 動摩擦 / Ｃ６０ / ＱＣＭ－ＡＦＭ |
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| Outline of Final Research Achievements |
We developed a new apparatus which combines an AFM tip with a quartz crystal resonator to study the dynamical frictional force of a nanoscale contact, and measured this force acting on C60 films at a small normal load as a function of sliding distance. It was found that this force for a small distance below 0.2 nm is significantly larger than that of HOPG. This difference means that C60 molecules easily tilt and/or rotate when the AFM tip slides on a C60 film, and the dynamic frictional arises from the tilting and/or rotating motions. In addition, these motions cause a smooth sliding of the AFM tip for a large distance.
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