Development of scanning phase measurement electron microscopy and its application to the potential observation in battery

• Project/Area Number: 23560031
• Research Category: Grant-in-Aid for Scientific Research (C)
• Allocation Type: Multi-year Fund
• Section: 一般
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: National Institute for Materials Science
• Principal Investigator: TAKEGUCHI Masaki 独立行政法人物質・材料研究機構, その他部局等, 電子顕微鏡ステーション・ステーション長 (30354327)
• Project Period (FY): 2011 – 2013
• Project Status: Completed (Fiscal Year 2013)
• Budget Amount: ¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000); Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000); Fiscal Year 2012: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000); Fiscal Year 2011: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
• Keywords: 電子線ホログラフィー / 試料走査 / 位相計測 / Li電池

Research Abstract

Stage-scanning phase measurement electron microscopy was developed. One-dimensional intensity profile along interference fringes was acquired on high-sensitive CCD camera by one time stage-scanning perpendicular to the fringe direction, followed by computer processing, resulting in the high-speed reconstruction of two-dimensional phase map. Likewise a fringe-scanning method, our technique enables to obtain a super-resolution phase map that spatial resolution is much smaller than the fringe spacing.

Research Products

• [Journal Article] Super- resolution phase reconstruction technique in electron holography with a stage-scanning system (2014)
  • Author(s): Dan Lei, Kazutaka Mitsuishi, Ken Harada, Masayuki Shimojo, Dongying Ju and Masaki Takeguchi
  • Journal Title: Japanese Journal of Applied Physics Volume: 53 Issue: 2S Pages: 02BC23-02BC23
  • DOI: 10.7567/jjap.53.02bc23
  • NAID: 210000143371
  • Peer Reviewed
• [Journal Article] Direct acquisition of interferogram by stage scanning in electron interferometry (2013)
  • Author(s): Dan Lei, Kazutaka Mitsuishi, Ken Harada, Masayuki Shimojo, Dongying Ju and Masaki Takeguchi
  • Journal Title: Microscopy Volume: 62巻 Pages: 563-570
  • Peer Reviewed
• [Presentation] Super-resolution phase reconstruction in stage-scanning electron holography (2013)
  • Author(s): Dan Lei、三石和貴、原田研、下条雅幸、巨東英、竹口雅樹
  • Organizer: EM-Nano 2013
  • Place of Presentation: 石川音楽堂,金沢市
• [Presentation] Super-resolution phase reconstruction in stage-scanning electron holography (2013)
  • Author(s): Dan Lei、三石和貴、原田研、下条雅幸、巨東英、竹口雅樹
  • Organizer: EM-Nano 2013
  • Place of Presentation: 石川音楽堂(金沢市)
• [Presentation] Direct phase acquisition in electron holography with a stage-scanning system (2012)
  • Author(s): Dan Lei、三石和貴、原田研、下条雅幸、巨東英、竹口雅樹
  • Organizer: 日本金属学会2012秋期大会
  • Place of Presentation: 愛媛大学
• [Presentation] 試料走査電子線ホログラフィー法によるMgO結晶の観察 (2012)
  • Author(s): Dan Lei、三石和貴、原田研、下条雅幸、巨東英、竹口雅樹
  • Organizer: 日本顕微鏡学会第68回学術講演会
  • Place of Presentation: つくば国際会議場,つくば
• [Presentation] Development of sample-scanning electron holography (2011)
  • Author(s): Masaki Takeguchi, Kazutaka Mitsuishi, Dan Lei,Masayuki Shimojo
  • Organizer: Microcsopy and Microanalysis 2011
  • Place of Presentation: Nashville Convention Center,Tennessee
  • Year and Date: 2011-08-09
• [Presentation] Electron holography combined with a stage-scanning system (2011)
  • Author(s): Masaki Takeguchi, Kazutaka Mitsuishi, Dan Lei,Masayuki Shimojo
  • Organizer: 5th International Union of Microbeam Analysis Society(IUMAS-V)
  • Place of Presentation: Seoul Olympic Parktel, Seoul
  • Year and Date: 2011-05-25
  • Invited
• [Presentation] 試料走査電子線ホログラフィーの開発 (2011)
  • Author(s): 竹口雅樹、三石和貴、Dan Lei、下条雅幸
  • Organizer: 日本顕微鏡学会第67回学術講演会
  • Place of Presentation: 福岡国際会議場
  • Year and Date: 2011-05-16
• [Presentation] Electron holography combined with a stage-scanning system (2011)
  • Author(s): Masaki Takeguchi, Kazutaka Mitsuishi, Dan Lei, Masayuki Shimojo
  • Organizer: 5th International Union of Microbeam Analysis Society(IUMAS-V)(招待講演)
  • Place of Presentation: Seoul Olympic Parktel, Seoul
• [Patent(Industrial Property Rights)] 透過型電子顕微鏡及び電子線干渉法 (2012)
  • Inventor(s): 竹口雅樹/三石和貴/原田研
  • Industrial Property Rights Holder: 物質・材料研究機構
  • Industrial Property Rights Type: 特許
  • Patent Publication Number: 2013-229244
  • Filing Date: 2012-04-26
  • Overseas
• [Patent(Industrial Property Rights)] 透過型電子顕微鏡及び電子線干渉法 (2012)
  • Inventor(s): 竹口雅樹/三石和貴//原田研
  • Industrial Property Rights Holder: 竹口雅樹/三石和貴//原田研
  • Industrial Property Rights Type: 特許
  • Industrial Property Number: 2012-101654
  • Filing Date: 2012-04-26