Study of defect in insulator material by using soft x-ray
| Project/Area Number |
23560034
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (C)
|
| Allocation Type | Multi-year Fund |
|---|
| Section | 一般 |
|---|
| Research Field |
Thin film/Surface and interfacial physical properties
|
|---|
| Research Institution | SAGA Light Source, Kyushu Synchrotron Light Research Center |
|---|
Principal Investigator |
KOBAYASHI EIICHI 公益財団法人佐賀県地域産業支援センター九州シンクロトロン光研究センター, ビームライングループ, 主任研究員 (80319376)
|
|---|
| Project Period (FY) |
2011 – 2013
|
| Project Status |
Completed (Fiscal Year 2013)
|
| Budget Amount *help |
¥5,460,000 (Direct Cost: ¥4,200,000、Indirect Cost: ¥1,260,000)
Fiscal Year 2013: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2012: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2011: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
|
|---|
| Keywords | 軟X線吸収分光 / 絶縁体 / 欠陥 / 軟Ｘ線吸収分光 / 表面 |
|---|
| Research Abstract |
Defect of Magnesium oxide (MgO) was studied by using near-edge X-ray absorption fine structure (NEXAFS). NEXAFS spectra for the O K-edge region of MgO thin film created defects by argon ion sputtering were broader than that of before sputtering because the amorphous layer is formed on the surface. The intensities of peaks in the NEXAFS spectra of MgO powder were changed by annealing in hydrogen atmosphere. These results indicate that the oxygen vacancies were induced by hydrogen reduction and the number of vacancies was dependent on the treatment temperature. NEXAFS spectra were measured while applying a voltage to the MgO and changed with near the breakdown voltage.
|
Report
(4 results)
Research Products
(27 results)
