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Development of electric field sensor with optically modulated scatterer

Research Project

Project/Area Number 23560430
Research Category

Grant-in-Aid for Scientific Research (C)

Allocation TypeMulti-year Fund
Section一般
Research Field Electron device/Electronic equipment
Research InstitutionAkita Research and Development Center

Principal Investigator

KUROSAWA Takahiro  秋田県産業技術センター, その他部局等, 主任研究員 (60370243)

Project Period (FY) 2011 – 2013
Project Status Completed (Fiscal Year 2013)
Budget Amount *help
¥5,200,000 (Direct Cost: ¥4,000,000、Indirect Cost: ¥1,200,000)
Fiscal Year 2013: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2012: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2011: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
Keywords電界計測 / 変調散乱 / 光変調 / 誘電体 / 高周波 / 電磁環境両立性 / 誘電体散乱 / 半導体 / EMC
Research Abstract

Electric field measurement sensor based on the modulated scattering technique with optically modulated scatterer had developed. A semiconductor is used as the scatterer, and illumination of the semiconductor with photons of energy larger than the band-gap energy of the scatterer, the scattering cross section can modulate. Undoped germanium
is used as the optically modulated scatterer, time response of the detection is ten times faster than the previously developed dielectric scatterer system. This sensor obtained almost the same sensitivity of optical electric field sensor with metallic dipole elements in microwave region. This sensor can measure the direction, amplitude, and phase of electric field and can change the spatial resolution with varying the diameter of illuminated light.

Report

(4 results)
  • 2013 Annual Research Report   Final Research Report ( PDF )
  • 2012 Research-status Report
  • 2011 Research-status Report
  • Research Products

    (19 results)

All 2014 2013 2012 2011 Other

All Journal Article (6 results) (of which Peer Reviewed: 6 results) Presentation (12 results) Patent(Industrial Property Rights) (1 results) (of which Overseas: 1 results)

  • [Journal Article] 光学的変調散乱素子を用いた高周波電界計測システム2014

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Journal Title

      電子情報通信学会誌B

      Volume: Vol. J97-B, No.3 Pages: 279-285

    • Related Report
      2013 Final Research Report
    • Peer Reviewed
  • [Journal Article] 光学的変調散乱素子を用いた高周波電界計測システム2014

    • Author(s)
      黒澤 孝裕,駒木根 隆士
    • Journal Title

      電子情報通信学会論文誌B

      Volume: J97-B Pages: 279-285

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Electric Field Intensity of Cylindrical Dielectric Probe in Scattering Method for EM Field Measurement2012

    • Author(s)
      T. Komakine, T. Kurosawa, H. Inoue
    • Journal Title

      2012 Proceedings of SICE Annual Conference

      Volume: Vol. 12PR0001 Pages: 412-415

    • Related Report
      2013 Final Research Report
    • Peer Reviewed
  • [Journal Article] Electric Field Measurement by using Cylindrical Dielectric Scatterer2012

    • Author(s)
      T. Kurosawa, T. Komakine
    • Journal Title

      2012 Proceedings of SICE Annual Conference

      Volume: Vol. 12PR0001 Pages: 407-411

    • Related Report
      2013 Final Research Report
    • Peer Reviewed
  • [Journal Article] Electric Field Measurement by using Cylindrical Dielectric Scatterer2012

    • Author(s)
      Takahiro Kurosawa and Takashi Komakine
    • Journal Title

      2012 Proceedings of SICE Annual Conference

      Volume: 12PR0001 Pages: 407-411

    • Related Report
      2012 Research-status Report
    • Peer Reviewed
  • [Journal Article] Electric Field Intensity of Cylindrical Dielectric Probe in Scattering Method for EM Field Measurement2012

    • Author(s)
      Takashi Komakine, Takahiro Kurosawa, and Hiroshi Inoue
    • Journal Title

      2012 Proceedings of SICE Annual Conference

      Volume: 12PR0001 Pages: 412-415

    • Related Report
      2012 Research-status Report
    • Peer Reviewed
  • [Presentation] マイクロストリップラインの近傍界を利用した光学的変調散乱素子の空間分解能評価2013

    • Author(s)
      黒澤孝裕
    • Organizer
      電子情報通信学会2013年ソサイエティ大会
    • Place of Presentation
      福岡工業大学
    • Year and Date
      2013-09-19
    • Related Report
      2013 Final Research Report
  • [Presentation] 光学的変調散乱素子を用いた電界センサのGHz帯における性能評価2013

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Organizer
      電子情報通信学会2013年総合大会
    • Place of Presentation
      岐阜大学
    • Year and Date
      2013-03-20
    • Related Report
      2013 Final Research Report
  • [Presentation] マイクロストリップラインの近傍界を利用した光学的変調散乱素子の空間分解能評価2013

    • Author(s)
      黒澤 孝裕
    • Organizer
      2013年電子情報通信学会ソサイエティ大会
    • Place of Presentation
      福岡工業大学
    • Related Report
      2013 Annual Research Report
  • [Presentation] 光学的変調散乱素子を用いた高周波電界の計測2012

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Organizer
      電子情報通信学会2012年ソサイエティ大会
    • Place of Presentation
      富山大学
    • Year and Date
      2012-09-12
    • Related Report
      2013 Final Research Report
  • [Presentation] Electric Field Intensity of Cylindrical Dielectric Probe in Scattering Method for EM Field Measurement2012

    • Author(s)
      T. Komakine, T. Kurosawa, H. Inoue
    • Organizer
      2012 SICE Annual Conference
    • Place of Presentation
      Akita University
    • Year and Date
      2012-08-21
    • Related Report
      2013 Final Research Report
  • [Presentation] Electric Field Measurement by using Cylindrical Dielectric Scatterer2012

    • Author(s)
      T. Kurosawa, T. Komakine
    • Organizer
      2012 SICE Annual Conference
    • Place of Presentation
      Akita University
    • Year and Date
      2012-08-21
    • Related Report
      2013 Final Research Report
  • [Presentation] 電界分布計測による放射ノイズ源の可視化およびノイズ対策事例2012

    • Author(s)
      黒澤孝裕, 駒木根隆士
    • Organizer
      電子情報通信学会2012年総合大会
    • Place of Presentation
      岡山大学
    • Year and Date
      2012-03-23
    • Related Report
      2013 Final Research Report 2011 Research-status Report
  • [Presentation] 変調散乱手法による電界計測における干渉波を用いる変調法2011

    • Author(s)
      駒木根隆士, 黒澤孝裕, 宮永和明, 井上浩
    • Organizer
      電子情報通信学会2011年ソサイエティ大会
    • Place of Presentation
      北海道大学
    • Year and Date
      2011-09-13
    • Related Report
      2013 Final Research Report 2011 Research-status Report
  • [Presentation] Electric Field Measurement by using Cylindrical Dielectric Scatterer

    • Author(s)
      Takahiro Kurosawa and Takashi Komakine
    • Organizer
      SICE 2012 Annual Conference
    • Place of Presentation
      秋田大学
    • Related Report
      2012 Research-status Report
  • [Presentation] Electric Field Intensity of Cylindrical Dielectric Probe in Scattering Method for EM Field Measurement

    • Author(s)
      Takashi Komakine, Takahiro Kurosawa, and Hiroshi Inoue
    • Organizer
      SICE 2012 Annual Conference
    • Place of Presentation
      秋田大学
    • Related Report
      2012 Research-status Report
  • [Presentation] 光学的変調散乱素子を用いた高周波電界の計測

    • Author(s)
      黒澤孝裕,駒木根隆士
    • Organizer
      電子情報通信学会2012年ソサイエティ大会
    • Place of Presentation
      富山大学
    • Related Report
      2012 Research-status Report
  • [Presentation] 光学的変調散乱素子を用いた電界センサのGHz帯における性能評価

    • Author(s)
      黒澤孝裕,駒木根隆士
    • Organizer
      電子情報通信学会2013年総合大会
    • Place of Presentation
      岐阜大学
    • Related Report
      2012 Research-status Report
  • [Patent(Industrial Property Rights)] 電磁界計測システム2012

    • Inventor(s)
      黒澤 孝裕
    • Industrial Property Rights Type
      特許
    • Acquisition Date
      2012-02-03
    • Related Report
      2013 Final Research Report
    • Overseas

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Published: 2011-08-05   Modified: 2019-07-29  

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