| Project/Area Number |
23650269
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Biomedical engineering/Biological material science
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| Research Institution | Kumamoto University |
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Principal Investigator |
KAI Hirofumi 熊本大学, 大学院・生命科学研究部, 教授 (30194658)
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| Project Period (FY) |
2011 – 2012
|
| Project Status |
Completed (Fiscal Year 2012)
|
| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2012: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2011: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
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| Keywords | 微弱電流 / TRP family / ラフト構造 / インスリン受容体 / 糖尿病腎症 / 物理的ストレス / 脂質ラフト / ポドサイト |
|---|
| Research Abstract |
Our previous report showed that mild electrical stress (MES)enhanced the insulin-induced signaling pathway. However, the molecular mechanism of theeffect of MES remains unclear. We assessed the effect of MES, which is characterized bylow-intensity direct current, on insulin signaling in vitro and in vivo. Here we showedthat MES activated the insulin signaling in an insulin-independent manner, and improvedinsulin resistance in peripheral tissues of high fat-fed mice. Moreover, we found thatMES increased the localization of IR in lipid rafts and enhanced the level ofphosphorylated Akt in insulin-resistant hepatic cells. Ablation of lipid rafts disruptedthe effect of MES on Akt activation
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