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Charge separation of photo-excited electric charge carriers and its interaction with internal electric filed induced by crystalline polarity

Research Project

Project/Area Number 23651081
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Environmental technology/Environmental materials
Research InstitutionNational Institute for Materials Science

Principal Investigator

OHASHI Naoki  独立行政法人物質・材料研究機構, 環境・エネルギー材料部門, 部門長 (60251617)

Co-Investigator(Renkei-kenkyūsha) HANEDA Hajime  独立行政法人物質・材料研究機構, 企画部門, 部門長 (70354420)
SAKAGUCHI Isao  独立行政法人物質・材料研究機構, 環境・エネルギー材料部門, 主幹研究員 (20343866)
ADACHI Yutaka  独立行政法人物質・材料研究機構, 環境・エネルギー材料部門, 主任研究員 (30354418)
HISHITA Shunichi  独立行政法人物質・材料研究機構, 環境・エネルギー材料部門, グループリーダー (40354419)
OHGAKI Takeshi  独立行政法人物質・材料研究機構, 環境・エネルギー材料部門, 主任研究員 (80408731)
Project Period (FY) 2011 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥3,900,000 (Direct Cost: ¥3,000,000、Indirect Cost: ¥900,000)
Fiscal Year 2012: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2011: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
Keywords酸化物半導体 / 極性表面 / 電子状態 / 極性結晶 / 自発分極 / 光電子分光
Research Abstract

Characterization of surface electronic structure of oxide crystal was investigated by means of x-ray photoelectron spectroscopy. The surface of specimen was well polished to obtain damage free surface by chemical mechanical polishing using colloidal silica nano-particles. As a result, we obtained the trace of specific electronic states originated in the polarity of crystal and identification of the electronic states by using density functional theory calculation has been done. Deposition of polarity controlled crystals was also demonstrated.

Report

(3 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Research-status Report
  • Research Products

    (22 results)

All 2013 2012 2011

All Journal Article (10 results) (of which Peer Reviewed: 10 results) Presentation (12 results) (of which Invited: 3 results)

  • [Journal Article] Determination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission2012

    • Author(s)
      N. Ohashi, H. Yoshikawa, Y. Yamashita, S. Ueda, J. Li, H. Okushi, K. Kobayashi and H. Haneda
    • Journal Title

      Appl. Phys. Lett

      Volume: 101 Issue: 25 Pages: 251911-251911

    • DOI

      10.1063/1.4772628

    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Influence of substrate nitridation on GaN and InN growth by plasma-assisted molecular-beam epitaxy2012

    • Author(s)
      Yao, Y., Sekiguchi, T., Ohgaki, T., Adachi, Y., Ohashi, N.
    • Journal Title

      Nippon Seramikkusu Kyokai Gakujutsu Ronbunshi/Journal of the Ceramic Society of Japan

      Volume: 120 (1407) Pages: 513-519

    • NAID

      130004480114

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] An aqueous solution process and subsequent UV treatment for highly transparent conductive ZnO films2012

    • Author(s)
      Hajime Wagata
    • Journal Title

      Journal of Materials Chemistry

      Volume: 22 Issue: 38 Pages: 20706-20712

    • DOI

      10.1039/c2jm33584k

    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Oxygen diffusion phenomena and hydrogen incorporation in reducing BaTiO_3 ceramics doped with ho below solubility limit2012

    • Author(s)
      Sakaguchi, I., Watanabe, K., Hishita, S., Ohashi, N., Haneda, H.
    • Journal Title

      Japanese Journal of Applied Physics

      Volume: 51 (10) Issue: 10R Pages: 101801-101801

    • DOI

      10.1143/jjap.51.101801

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains2012

    • Author(s)
      Jesse R. Williams
    • Journal Title

      Journal of Applied Physics

      Volume: 111 Issue: 3 Pages: 33525-33525

    • DOI

      10.1063/1.3682088

    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] Polarity-dependent photoemission spectra of wurtzite-type zinc oxide2012

    • Author(s)
      J. Williams, H. Yoshikawa, S. Ueda, Y. Yamashita, K. Kobayashi, Y. Adachi, H. Haneda, T. Oogaki, H. Miyazaki, Takamasa Ishigaki, N. Ohash
    • Journal Title

      Appl. Phys. Lett

      Volume: 100 Issue: 5 Pages: 51902-51902

    • DOI

      10.1063/1.3673553

    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] Photocatalytic Activity and Related Surface Properties of Transparent ZnO Films Prepared by a Low-temperature Aqueous Route2011

    • Author(s)
      Hajime Wagata, Naoki Ohashi, Ken-ichi Katsumata, Kiyoshi Okada, Nobuhiro Matsushita
    • Journal Title

      Photochemistry and Photobiology

      Volume: 87 Issue: 5 Pages: 1009-1015

    • DOI

      10.1111/j.1751-1097.2011.00964.x

    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] The Effect of Citric Ion on the Spin-Sprayed ZnO Films : IR and XPS Study For the Organic Impurities2011

    • Author(s)
      Hajime Wagata, Naoki Ohashi, Ken-ichi Katsumata, Kiyoshi Okada, Nobuhiro Matsushita
    • Journal Title

      Key Engineering Materials, Electroceramics in Japan XIV

      Volume: 485 Pages: 291-294

    • DOI

      10.4028/www.scientific.net/kem.485.291

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Planarization of zinc oxide surface and evaluation of processing damage2011

    • Author(s)
      Miyazaki, H., Adachi, Y., Sakaguchi, I., Ishigaki, T., Ohashi, N.
    • Journal Title

      Key Engineering Materials

      Volume: 485 Pages: 215-218

    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction2011

    • Author(s)
      J.Williams, et al
    • Journal Title

      Surface Science

      Volume: 605 Issue: 13-14 Pages: 1336-1340

    • DOI

      10.1016/j.susc.2011.04.036

    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Presentation] 放射光硬X線光電子分光法によるPt/Nb:SrTiO3接合の電子状態評価2013

    • Author(s)
      大橋直樹, 廣瀬左京, 吉川英樹, 上田茂典, 古田朋大,渡邉賢, 李建永, 坂口勲
    • Organizer
      第60回 応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学,厚木市
    • Related Report
      2012 Final Research Report
  • [Presentation] 放射光硬X線光電子分光法によるPt/Nb:SrTiO3接合の電子状態評価2013

    • Author(s)
      大橋直樹, 廣瀬左京, 吉川英樹, 上田茂典, 古田朋大, 渡邉賢, 李建永, 坂口勲
    • Organizer
      第60回 応用物理学関係連合講演会
    • Place of Presentation
      神奈川工科大学
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] NIMS連携拠点2012

    • Author(s)
      大橋直樹
    • Organizer
      東工大元素戦略シンポジウム
    • Place of Presentation
      東京工業大学 すずかけ台キャンパス,横浜市,日本
    • Year and Date
      2012-10-01
    • Related Report
      2012 Final Research Report
  • [Presentation] セラミックスの物性と電荷補償2012

    • Author(s)
      大橋直樹
    • Organizer
      日本セラミックス協会関西支部第14回若手フォーラム
    • Place of Presentation
      大阪府立青少年海洋センター,大阪府泉南郡岬町
    • Related Report
      2012 Final Research Report
  • [Presentation] Defects and charge compensation in wide bandgap semiconductors2012

    • Author(s)
      OHASHI Naoki, SAKAGUCHI Isao, WATANABE Ken, ADACHI Yutaka, TAKESHI OGAKI, HISHITA Shunichi, MIYAZAKI Hiroki, Jesse Willia, ISHIGAKI Takamasa
    • Organizer
      Solid State Chemistry 2012 (Invited)
    • Place of Presentation
      University of Pardubice, Pardubice,チェコ
    • Related Report
      2012 Final Research Report
  • [Presentation] 酸化物の電荷補償と機能発現に関する研究2012

    • Author(s)
      大橋直樹
    • Organizer
      日本セラミックス協会2012年会
    • Place of Presentation
      京都大学,京都,日本(Japan)
    • Related Report
      2012 Final Research Report
  • [Presentation] Defects and charge compensation in wide bandgap semiconductors2012

    • Author(s)
      N. Ohashi, I. Sakaguchi, K. Watanabe, Y. Adachi, T. Ohgaki, S. Hishita, H. Miyazaki, T. Ishigaki, H. Haneda
    • Organizer
      Solid State Chemistry 2012
    • Place of Presentation
      Pardubice, Czech
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] セラミックスの物性と電荷補償2012

    • Author(s)
      大橋直樹
    • Organizer
      日本セラミックス協会関西支部第14回若手フォーラム
    • Place of Presentation
      大阪府立青少年海洋センター
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] 酸化物の電荷補償と機能発現に関する研究2012

    • Author(s)
      大橋直樹
    • Organizer
      日本セラミックス協会2012年会(招待講演)
    • Place of Presentation
      京都大学
    • Related Report
      2011 Research-status Report
  • [Presentation] ウルツ鉱型半導体薄膜の極性判定とその制御2011

    • Author(s)
      大橋直樹, Jesse Williams, 安達裕, 吉川英樹, 山下良之, 上田茂典, 大垣武, 坂口勲, 菱田俊一, 小林啓介
    • Organizer
      日本金属学会2011年度秋期講演大会
    • Place of Presentation
      沖縄コンベンションセンターおよびカルチャーリゾートフェストーネ,宜野湾
    • Related Report
      2012 Final Research Report
  • [Presentation] Electronic structure of oxide semiconductors and their related junction structures", Metal Oxide / Polymer Nanocomposites and Applications2011

    • Author(s)
      OHASHI Naoki
    • Organizer
      Hungarian Academy of Sciences
    • Place of Presentation
      ブダペスト,ハンガリー
    • Related Report
      2012 Final Research Report
  • [Presentation] Electronic structure of oxide semiconductors and their related junction structures2011

    • Author(s)
      OHASHI Naoki
    • Organizer
      bilateral cooperations between NIMS-MFA and LIOS-MFA(招待講演)
    • Place of Presentation
      Budapest, Hungary
    • Related Report
      2011 Research-status Report

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Published: 2011-08-05   Modified: 2019-07-29  

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