| Project/Area Number |
23651137
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Microdevices/Nanodevices
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| Research Institution | Nagoya Institute of Technology |
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Principal Investigator |
KAMIYA Shoji 名古屋工業大学, 工学研究科, 教授 (00204628)
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| Co-Investigator(Renkei-kenkyūsha) |
IZUMI Hayato 名古屋工業大学, 工学研究科, 助教 (90578337)
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| Project Period (FY) |
2011 – 2012
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| Project Status |
Completed (Fiscal Year 2012)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2012: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2011: ¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
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| Keywords | シリコン / MEMS / 長期信頼性 / 水 / 環境効果 / NEMS |
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| Research Abstract |
For those structures in medical MEMS (Microelectromechanical Systems) devices, especially the case of implantable devices, evaluation and improvement of mechanical reliability under humid environment including underwater become an issue of importance. In this study, static strength test and fatigue lifetime test were carried out under wet and humid environment aiming at the establishment of strength design scheme for those silicon MEMS structures in the presence of water molecular and restraint of degradation in living body. For this purpose, static/fatigue testing system coping with liquid water environment was developed. Using this experimental setup, the fracture behavior and mechanical properties of single crystal silicon thin film was investigated under liquid water. Crystal defects in silicon were also observed using EBIC (Electron Beam Induced Current) to survey the correlation between damage accumulation process and environment during the fatigue process. On the other hands, possible deterioration of mechanical properties with proton and hydrogen dissociated from the surface water molecular and trapped in silicon crystal was investigated by using nano-indentation technique. Based on these results, prediction models for the fatigue lifetime in various environments were also surveyed.
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