Project/Area Number |
23655167
|
Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
Allocation Type | Multi-year Fund |
Research Field |
Functional materials/Devices
|
Research Institution | Hokkaido University |
Principal Investigator |
MURAKOSHI Kei 北海道大学, 大学院・理学研究院, 教授 (40241301)
|
Co-Investigator(Kenkyū-buntansha) |
YASUDA Satoshi 北海道大学, 大学院・理学研究院, 講師 (90400639)
|
Project Period (FY) |
2011 – 2012
|
Project Status |
Completed (Fiscal Year 2012)
|
Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2011: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
|
Keywords | フラーレン / ナノチューブ / グラフェン / 単層カーボンナノチューブ / 金属ナノダイマー / カイラリティ / 光化学反応 / 欠陥 / プラズモン / カーボンナノチューブ / 表面増強ラマン / 電気化学 / ラマン |
Research Abstract |
We demonstrated photo nano engineering of single-walled carbon nanotube (SWNT) using plasmon enhanced field at metal nano gap as photo chemical reaction field. Defect formation in SWNT occurred by photo reaction in plasmon enhanced field, and, furthermore, we found that the amount of defect formation could be controlled by electrochemical potential and chirarity of SWNT.
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