Development of high-resolution Near field magnetic force microscopy which enables to detect the direction and amplitude of static magnetic field near sample surface
| Project/Area Number |
23656026
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Akita University |
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Principal Investigator |
SAITO Hitoshi 秋田大学, 工学資源学研究科, 教授 (00270843)
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| Co-Investigator(Renkei-kenkyūsha) |
YOSHIMURA Satoru 秋田大学, 工学資源学研究科, 准教授 (40419429)
KINOSHITA Yukinori 秋田大学, ベンチャービジネスラボラトリー, 特任助教 (10635501)
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| Project Period (FY) |
2011 – 2012
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| Project Status |
Completed (Fiscal Year 2012)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2012: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000)
Fiscal Year 2011: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
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| Keywords | 磁気力顕微鏡 / 表面磁場 / 高分解能 / 磁場極性計測 / 磁場強度計測 / 磁場計測 / 磁性探針 / 磁気記録媒体 / 永久磁石材料 / プローブ顕微鏡 / 直流磁場計測 / 表面近傍計測 / 高空間分解能 / 高密度磁気記録媒体 / ベクトル磁場計測 |
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| Research Abstract |
We have newly developed a novel Near-field magnetic force microscopy (NF-MFM) which enables us to measure DC magnetic fields with field polarity near a sample surface. The sensitivity and spatial resolution of NF-MFM are drastically increased with reducing the tip-sample distance. The sensitivity is ten times larger than that of conventional MFM and 6 nm spatial resolution was obtained for high density perpendicular recording media. We have applied this method to analyze the nano-scale magnetic domain structure and demonstrated the effectiveness for various magnetic materials.
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Report
(3 results)
Research Products
(41 results)
