Element-Selective Eecognition and Control of Metal-containing Organic Molecules using SR-based STM
| Project/Area Number |
23656033
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka University |
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Principal Investigator |
SAITO Akira 大阪大学, 工学(系)研究科(研究院), 准教授 (90294024)
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| Project Period (FY) |
2011 – 2013
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| Project Status |
Completed (Fiscal Year 2013)
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| Budget Amount *help |
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2013: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2012: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2011: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
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| Keywords | 走査型トンネル顕微鏡 / 放射光 / X線 / 元素分析 / 金属 / 有機分子 / 内殻励起 / 元素選択 / 走査プローブ顕微鏡 |
|---|
| Research Abstract |
I attempted to extend "SR-STM" that is a method of elemental-analysis having an atomic resolution. SR-STM is to analyze the elemental composition of samples by giving the inner-shell information derived from the excitation to STM that observes only the shallow electronic level. In this project, SR-STM, which has long served only to semiconductors, was applied to new systems (metal, metal-containing organic molecules (phthalocyanine: Pc)). Although there were difficulties such as measurement instability and radiation damages, after improvement of light source, the element-contrast on metals has been observed for the first time. Finally, SR-STM was applied to the analysis of metal-Pc. The clear modification of the contrast was not observed across the metal-absorption-edge of the incident X-ray energy, whereas a specific radiation effect was newly observed for a metal-Pc, which gives hope to enable the element-specific analysis and/or reaction control of molecules in future.
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Report
(4 results)
Research Products
(39 results)
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[Journal Article] Direct observation of X-ray induced Atomic Motion using STM combined with Synchrotron Radiation2011
Author(s)
A. Saito, T . Tanaka, Y . Takagi, H. Hosokawa, H.Notsu, G .Ohzeki, Y .Tanaka, Y .Kohmura, M.Akai-Kasaya, T .Ishikawa, Y .Kuwahara, S.Kikuta, and M. Aono
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Journal Title
J. Nanosc. Nanotechnol
Volume: 11
Issue: 4
Pages: 2873-2881
DOI
Related Report
Peer Reviewed
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[Presentation] Pico-imaging of Element Contrast using SR-STM2014
Author(s)
Akira Saito, H. Miki, Y. Furudate, Y. Kusui, M. Akai-Kasaya, Y. Tanaka, Y. Kohmura, T. Ishikawa, Y. Kuwahara and M. Aono
Organizer
NSS-8 Nanoscience Conference
Place of Presentation
Gleacher Center, Chicago, USA
Related Report
Invited
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[Presentation] Pico-imaging of Element Contrast & X-ray-Induced Atomic Motion using SR-STM2013
Author(s)
Akira Saito, H. Miki, Y. Furudate, Y. Kusui, M. Akai-Kasaya, Y. Tanaka, Y. Kohmura, T. Ishikawa, Y. Kuwahara and M. Aono
Organizer
12th Symposium on X-ray Imaging Optics
Place of Presentation
Nakanoshima-Center, Osaka University, Japan
Related Report
Invited
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[Presentation] Nano-scale Elemental Analysis and applications by Synchrotron-Radiation-based STM2011
Author(s)
A. Saito, G. Ohzeki, H. Matsuno, Y. Takagi, Y. Tanaka, Y. Kohmura, M. Akai-Kasaya, T. Ishikawa, Y. Kuwahara, and M. Aono
Organizer
Nano-S & T (BIT's 1st World Annual Congress)(招待講演)
Place of Presentation
World Expo Center, Dalian, China
Related Report
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[Presentation] Elemental Analysis at 1 nm Scale by STM combined with Highly Brilliant Hard X-rays2011
Author(s)
齋藤彰, 野津浩史, 田中武拓, 高木康多, 大関豪三, 田中義人, 香村芳樹, 赤井恵, 石川哲也, 辛埴, 桑原裕司, 青野正和
Organizer
第66回物理学会年次大会 領域9，領域5合同シンポジウムNanoscience by the fusion of light and scanning probe microscopy (光と走査プローブ顕微鏡の融合によるナノサイエンス)28aTG(招待講演)
Place of Presentation
富山大学
Related Report
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