| Project/Area Number |
23656036
|
|---|
| Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
| Allocation Type | Multi-year Fund |
|---|
| Research Field |
Thin film/Surface and interfacial physical properties
|
|---|
| Research Institution | High Energy Accelerator Research Organization |
|---|
Principal Investigator |
MASE Kazuhiko 大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 准教授 (40241244)
|
|---|
| Project Period (FY) |
2011 – 2012
|
| Project Status |
Completed (Fiscal Year 2012)
|
| Budget Amount *help |
¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2012: ¥780,000 (Direct Cost: ¥600,000、Indirect Cost: ¥180,000)
Fiscal Year 2011: ¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
|
|---|
| Keywords | オージェ電子分光 / 光電子分光 / コインシデンス分光 / 表面分析 / 原子間オージェ |
|---|
| Research Abstract |
We have developed an electron-electron-ion coincidence spectrometer with a high detection efficiency to identify atoms bonded to a specific surface atom and to analyze the adsorption state using interatomic Auger processes. Although the coincidence counting rate was improved in comparison with that of a previous analyzer, we could not detect interatomic Auger electrons. Using the coincidence analyzer we have studied decay processes of a Si-2s core hole on a Si(111) surface.
|
