| Project/Area Number |
23656038
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | 財団法人高輝度光科学研究センター |
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Principal Investigator |
TAJIRI Hiroo 財団法人高輝度光科学研究センター, 利用研究促進部門, 研究員 (70360831)
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| Project Period (FY) |
2011
|
| Project Status |
Completed (Fiscal Year 2011)
|
| Budget Amount *help |
¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2011: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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| Keywords | 表面フォノン / X線散乱 / ビスマス超薄膜 / シリコン単結晶 |
|---|
| Research Abstract |
The atoms in crystals are arranged with regularity, making lattices, and they are thermally vibrating(lattice dynamics). The lattice dynamics of crystal surfaces and ultra-thin films are different from that in crystals. We developed the methodology to detect elastically scattered X-rays from lattice vibrations of surface and ultra-thin films. We prepared bismuth ultra-thin films with thickness less than 10 nm on silicon substrates, and succeeded in observing diffuse X-ray scattering from phonons of ultra-thin films.
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