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Surface phonon dispersion studied by X-ray thermal diffuse scattering

Research Project

Project/Area Number 23656038
Research Category

Grant-in-Aid for Challenging Exploratory Research

Allocation TypeMulti-year Fund
Research Field Thin film/Surface and interfacial physical properties
Research Institution財団法人高輝度光科学研究センター

Principal Investigator

TAJIRI Hiroo  財団法人高輝度光科学研究センター, 利用研究促進部門, 研究員 (70360831)

Project Period (FY) 2011
Project Status Completed (Fiscal Year 2011)
Budget Amount *help
¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2011: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Keywords表面フォノン / X線散乱 / ビスマス超薄膜 / シリコン単結晶
Research Abstract

The atoms in crystals are arranged with regularity, making lattices, and they are thermally vibrating(lattice dynamics). The lattice dynamics of crystal surfaces and ultra-thin films are different from that in crystals. We developed the methodology to detect elastically scattered X-rays from lattice vibrations of surface and ultra-thin films. We prepared bismuth ultra-thin films with thickness less than 10 nm on silicon substrates, and succeeded in observing diffuse X-ray scattering from phonons of ultra-thin films.

Report

(2 results)
  • 2011 Annual Research Report   Final Research Report ( PDF )
  • Research Products

    (2 results)

All 2012 Other

All Presentation (1 results) Remarks (1 results)

  • [Presentation] プリズム型集光レンズを利用した表面X線回折2012

    • Author(s)
      田尻寛男
    • Organizer
      日本放射光学会
    • Place of Presentation
      鳥栖市民文化会館(佐賀県)
    • Year and Date
      2012-01-09
    • Related Report
      2011 Annual Research Report 2011 Final Research Report
  • [Remarks]

    • URL

      http://sss.spring8.or.jp/

    • Related Report
      2011 Final Research Report

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Published: 2011-08-05   Modified: 2019-07-29  

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