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Dependable system with backup mechanism based on reconfigurable architecture

Research Project

Project/Area Number 23700059
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Computer system/Network
Research InstitutionKochi University of Technology

Principal Investigator

MITSUYAMA Yukio  高知工科大学, 工学部, 講師 (80346189)

Project Period (FY) 2011 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2012: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2011: ¥1,820,000 (Direct Cost: ¥1,400,000、Indirect Cost: ¥420,000)
Keywordsリコンフィギャラブルシステム / ディペンダブルコンピューティング / 計算機システム / 再構成可能アーキテクチャ / 信頼性 / 経年劣化 / 遅延故障
Research Abstract

This project developed a dependable system based on mixed-grained reconfigurable architecture, which can implement a dependable backup circuit of target applications dynamically. We also proposed a method for mitigating NBTI-induced performance degradation that exploits the recovery property by shifting random input through scan paths during standby time. In addition to this, we proposed a path delay testing method for predicting a timing error on a coarse-grained reconfigurable architecture. The proposed method can effectively identify the faulty component, which will cause a timing error, and a fault-free component for substitution.

Report

(3 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Research-status Report
  • Research Products

    (16 results)

All 2013 2012 2011 Other

All Journal Article (9 results) (of which Peer Reviewed: 9 results) Presentation (7 results)

  • [Journal Article] PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices2013

    • Author(s)
      D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEICE Electronics Express

      Volume: 10 Issue: 5 Pages: 20130081-20130081

    • DOI

      10.1587/elex.10.20130081

    • NAID

      130003364989

    • ISSN
      1349-2543
    • Related Report
      2012 Annual Research Report 2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture2013

    • Author(s)
      D. Alnajjar,H. Konoura,Y. Ko,Y. Mitsuyama,M. Hashimoto,T. Onoye
    • Journal Title

      IEEE Transactions on VLSI Systems

      Volume: 21 Issue: 12 Pages: 2165-2178

    • DOI

      10.1109/tvlsi.2012.2228015

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A Comparative Study on Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices2012

    • Author(s)
      D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Conference on ReConFigurable Computing and FPGAs (ReConFig)

      Pages: 1-7

    • DOI

      10.1109/reconfig.2012.6416787

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture2012

    • Author(s)
      T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Conference on Field Programmable Logic and Applications (FPL)

      Pages: 615-618

    • DOI

      10.1109/fpl.2012.6339220

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Stress Probability Computation for Estimating NBTI-Induced Delay Degradation2011

    • Author(s)
      H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: vol.E94-A, no.12 Pages: 2545-2553

    • DOI

      10.1109/fpl.2011.108

    • NAID

      10030533624

    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] NBTI Mitigation by Giving Random Scan-In Vectors during Standby Mode2011

    • Author(s)
      T. Kameda, H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      Proc. of Int'l Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS)

      Pages: 152-161

    • DOI

      10.1007/978-3-642-24154-3_16

    • ISBN
      9783642241536, 9783642241543
    • Related Report
      2012 Final Research Report 2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] Stress Probability Computation for Estimating NBTI-Induced Delay Degradation2011

    • Author(s)
      郡浦 宏明、密山 幸男、橋本 昌宜、尾上 孝雄
    • Journal Title

      IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

      Volume: E94-A Issue: 12 Pages: 2545-2553

    • DOI

      10.1587/transfun.E94.A.2545

    • NAID

      10030533624

    • ISSN
      0916-8508, 1745-1337
    • Related Report
      2011 Research-status Report
    • Peer Reviewed
  • [Journal Article] Implementing Flexible Reliability in a Coarse Grained Reconfigurable Architecture

    • Author(s)
      D. Alnajjar, H. Konoura, Y. Ko, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEEE Trans. on VLSI Systems

      Volume: (in press)

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Journal Article] Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices

    • Author(s)
      T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Journal Title

      IEICE Trans. on Information and Systems

      Volume: (in press)

    • NAID

      130003370944

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Presentation] 動的部分再構成による故障回避に関する一考察2012

    • Author(s)
      郡浦宏明, 今川隆司, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      電子情報通信学会技術研究報告
    • Place of Presentation
      福岡市
    • Related Report
      2012 Final Research Report
  • [Presentation] A Comparative Study on Static Voltage Over-Scaling and Dynamic Voltage Variation Tolerance with Replica Circuits and Time Redundancy in Reconfigurable Devices2012

    • Author(s)
      D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Organizer
      International Conference on ReConFigurable Computing and FPGAs
    • Place of Presentation
      Cancun, Mexico
    • Related Report
      2012 Annual Research Report
  • [Presentation] A Predictive Delay Fault Avoidance Scheme for Coarse-Grained Reconfigurable Architecture2012

    • Author(s)
      T. Kameda, H. Konoura, D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye
    • Organizer
      International Conference on Field Programmable Logic and Applications
    • Place of Presentation
      Oslo, Norway
    • Related Report
      2012 Annual Research Report
  • [Presentation] 動的部分再構成による故障回避に関する一考察2012

    • Author(s)
      郡浦宏明, 今川隆司, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      電子情報通信学会 リコンフィギャラブル研究会
    • Place of Presentation
      九州大学(福岡)
    • Related Report
      2012 Annual Research Report
  • [Presentation] スキャンパスを用いたNBTI 劣化抑制に関する研究2011

    • Author(s)
      亀田敏広, 郡浦宏明, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      情報処理学会DA シンポジウム
    • Place of Presentation
      下呂市
    • Related Report
      2012 Final Research Report
  • [Presentation] 動的再構成可能アーキテクチャによる故障回避機構の定量的信頼性評価2011

    • Author(s)
      郡浦宏明, 密山幸男, 橋本昌宜, 尾上孝雄
    • Organizer
      電子情報通信学会技術研究報告
    • Place of Presentation
      札幌市
    • Related Report
      2012 Final Research Report
  • [Presentation] 動的再構成可能アーキテクチャによる故障回避機構の定量的信頼性評価2011

    • Author(s)
      郡浦 宏明、密山 幸男、橋本 昌宜、尾上 孝雄
    • Organizer
      電子情報通信学会 リコンフィギャラブルシステム研究会
    • Place of Presentation
      北海道大学(北海道)
    • Related Report
      2011 Research-status Report

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Published: 2011-08-05   Modified: 2019-07-29  

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