Improvement of the quality and coverage for delay testing of high speed LSI

• Project/Area Number: 23700061
• Research Category: Grant-in-Aid for Young Scientists (B)
• Allocation Type: Multi-year Fund
• Research Field: Computer system/Network
• Research Institution: Kyushu Institute of Technology
• Principal Investigator: MIYASE Kohei 九州工業大学, 大学院・情報工学研究院, 助教 (30452824)
• Project Period (FY): 2011 – 2012
• Project Status: Completed (Fiscal Year 2012)
• Budget Amount: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000); Fiscal Year 2012: ¥910,000 (Direct Cost: ¥700,000、Indirect Cost: ¥210,000); Fiscal Year 2011: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
• Keywords: VLSI設計技術

Research Abstract

We could develop a　delay testing method to improve the quality and coverage for　high speed LSI. The method could combine the high quality testing technique and high coverage testing technique within a small increase of test application time. Also, we could develop a technique to visualize the coverage of selected paths with our own software.　We have published this work in one Japanese workshop and two international workshops.

Research Products

• [Presentation] Controllability Analysis of Local Switching Activity for Layout Design (2013)
  • Author(s): Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara
  • Organizer: South European Test Seminar 2013
  • Place of Presentation: オーストリア
  • Year and Date: 2013-02-27
• [Presentation] Additional Path Delay Fault Detection with Adaptive Test Data (2011)
  • Author(s): Kohei Miyase, Hiroaki Tanaka, Kazunari Enokimoto, Xiaoqing Wen, Seiji Kajihara
  • Organizer: IEEE Workshop on RTL and High Level Testing
  • Place of Presentation: インド
  • Year and Date: 2011-11-25
• [Presentation] パターンマージングによる遷移遅延故障用テストのパス遅延故障検出能力向上手法 (2011)
  • Author(s): 田中広彬、宮瀬紘平、榎元和成、温暁青、梶原誠司
  • Organizer: 電子情報通信学会技術研究報告、Vol.111、No.435、DC2011-78
  • Place of Presentation: 機械振興会館(東京)
  • Year and Date: 2011-02-13
• [Presentation] パターンマージングによる遷移遅延故障用テストのパス遅延故障検出能力向上手法 (2011)
  • Author(s): 田中広彬, 宮瀬紘平, 榎元和成, 温暁青, 梶原誠司
  • Organizer: 電子情報通信学会技術研究報告 vol. 111, no. 435, DC2011-78
  • Place of Presentation: 東京