Research Project
Grant-in-Aid for Young Scientists (B)
Use of low energy electron beam (~1 keV) in analytical electron microscopy significantly reduces the surface charge-up of semi-insulating wide bandgap materials and realizes high spatial resolution. We developed SEM-cathodoluminescence (CL) system for 1keV observation and realized CL nanospectroscopy of semi-insulating materials without metal-coating. We also visualized growth direction domains within ZnO nanorod single crystal and observed strain-induced bandgap shrinkage of ZnO.
All 2013 2012 2011 Other
All Journal Article (1 results) (of which Peer Reviewed: 1 results) Presentation (11 results) Remarks (1 results)