Development of cathodoluminescence nanospectroscopy for the insulating nanostructures
Project/Area Number |
23760022
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Research Category |
Grant-in-Aid for Young Scientists (B)
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Allocation Type | Multi-year Fund |
Research Field |
Applied materials science/Crystal engineering
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Research Institution | University of Tsukuba (2012) National Institute for Materials Science (2011) |
Principal Investigator |
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Project Period (FY) |
2011 – 2012
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Project Status |
Completed (Fiscal Year 2012)
|
Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2012: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2011: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
|
Keywords | 結晶評価 / ワイドギャップ半導体 / 低速電子線 / 走査電子顕微鏡 / カソードルミネッセンス |
Research Abstract |
Use of low energy electron beam (~1 keV) in analytical electron microscopy significantly reduces the surface charge-up of semi-insulating wide bandgap materials and realizes high spatial resolution. We developed SEM-cathodoluminescence (CL) system for 1keV observation and realized CL nanospectroscopy of semi-insulating materials without metal-coating. We also visualized growth direction domains within ZnO nanorod single crystal and observed strain-induced bandgap shrinkage of ZnO.
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Report
(3 results)
Research Products
(13 results)
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[Presentation] ErドープしたSi過剰SiO2膜のカソードルミネッセンス評価2011
Author(s)
渡辺健太郎,Sebastien Cueff, Benjamin Dierre, Christophe Labbe, Filippo Fabbri, Xavier Portier, Richard Rizk, 関口隆史
Organizer
2011 年秋季<第72回>応用物理学会
Place of Presentation
山形大学小石川キャンパス
Year and Date
2011-08-31
Related Report
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[Presentation] ErドープしたSi過剰SiO2膜のカソードルミネッセンス評価2011
Author(s)
渡辺健太郎,Sébastien Cueff, Benjamin Dierre, Christophe Labbé, Filippo Fabbri, Xavier Portier, Richard Rizk, 関口隆史
Organizer
2011年秋季<第72回>応用物理学会
Place of Presentation
山形大学小石川キャンパス
Related Report
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