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Analysis of promoted oxidation reaction just below ultrathin films of transition metals grown on Si surfaces

Research Project

Project/Area Number 23760027
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionYokohama National University

Principal Investigator

OHNO Shinya  横浜国立大学, 工学研究院, 特別研究教員 (00377095)

Project Period (FY) 2011 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2012: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2011: ¥3,510,000 (Direct Cost: ¥2,700,000、Indirect Cost: ¥810,000)
Keywordsシリコン / 光電子分光 / 酸化反応 / 遷移金属 / 酸素
Research Abstract

We found that promoted oxidation reaction occurs on titanium-covered silicon surfaces by oxygen exposure at room temperature. We investigated thickness and composition of the oxide layer in order to clarify this process. In the case of evaluation of the oxide thickness by photoelectron spectroscopy, it is desirable to use photon energies with large mean free path. We found that cautious analysis should be performed in order to evaluate the oxide composition. This viewpoint was obtained based on the analysis of titanium adsorption on oxidized silicon surfaces.

Report

(3 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Research-status Report
  • Research Products

    (11 results)

All 2012 2011

All Presentation (11 results)

  • [Presentation] 田中正俊シリコン酸化状態へのチタン吸着効果の解析2012

    • Author(s)
      大野真也 ,安部壮祐,高橋和敏,鎌田雅夫
    • Organizer
      真空に関する連合講演会
    • Place of Presentation
      甲南大学ポートアイランドキャンパス
    • Related Report
      2012 Final Research Report
  • [Presentation] 田中正俊Ti 吸着による Si(001)表面酸化促進反応の解析2012

    • Author(s)
      大野真也 ,安部壮祐,高橋和敏,鎌田雅夫
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      愛媛大学城北地区/松山大学文京キャンパス
    • Related Report
      2012 Final Research Report
  • [Presentation] 田中正俊Ti 吸着による酸化Si(001)表面電子状態変化の解析2012

    • Author(s)
      大野真也 ,安部壮祐,高橋和敏,鎌田雅夫
    • Organizer
      ナノ学会第10回大会
    • Place of Presentation
      大阪大学大阪大学会館
    • Related Report
      2012 Final Research Report
  • [Presentation] Ti吸着による酸化Si(001)表面電子状態変化の解析2012

    • Author(s)
      大野真也
    • Organizer
      ナノ学会第10回大会
    • Place of Presentation
      大阪大学
    • Related Report
      2012 Annual Research Report
  • [Presentation] Ti吸着によるSi(001)表面酸化促進反応の解析2012

    • Author(s)
      大野真也
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      松山大学
    • Related Report
      2012 Annual Research Report
  • [Presentation] シリコン酸化状態へのチタン吸着効果の解析2012

    • Author(s)
      大野真也
    • Organizer
      第53回真空に関する連合講演会
    • Place of Presentation
      甲南大学
    • Related Report
      2012 Annual Research Report
  • [Presentation] Si高指数面酸化過程のリアルタイム光電子分光による評価2011

    • Author(s)
      大野真也
    • Organizer
      シリコン材料・デバイス研究会(SDM)
    • Place of Presentation
      名古屋大学
    • Related Report
      2011 Research-status Report
  • [Presentation] 超音速分子線を用いたSi高指数面初期酸化過程の解析2011

    • Author(s)
      大野真也
    • Organizer
      応用物理学会学術講演会
    • Place of Presentation
      山形大学
    • Related Report
      2011 Research-status Report
  • [Presentation] Electronic structure of iron silicides grown on Si(001) surfaces by solid phase epitaxy2011

    • Author(s)
      大野真也
    • Organizer
      International Symposium on Surface Science (ISSS-6)
    • Place of Presentation
      Tower Hall Funabori, Funabori, Tokyo
    • Related Report
      2011 Research-status Report
  • [Presentation] 超音速分子線を用いたSi高指数面初期酸化過程の解析II2011

    • Author(s)
      大野真也
    • Organizer
      応用物理学関係連合講演会
    • Place of Presentation
      早稲田大学
    • Related Report
      2011 Research-status Report
  • [Presentation] Si高指数面熱酸化過程における温度依存性の解析2011

    • Author(s)
      安部壮祐
    • Organizer
      応用物理学関係連合講演会
    • Place of Presentation
      早稲田大学
    • Related Report
      2011 Research-status Report

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Published: 2011-08-05   Modified: 2019-07-29  

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