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Conductance measurement at nanoscale using face to face dual tip Scanning Tunneling Microscopy

Research Project

Project/Area Number 23760032
Research Category

Grant-in-Aid for Young Scientists (B)

Allocation TypeMulti-year Fund
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionKyoto University

Principal Investigator

KUROKAWA Shu  京都大学, 大学院・工学研究科, 准教授 (90303859)

Project Period (FY) 2011 – 2012
Project Status Completed (Fiscal Year 2012)
Budget Amount *help
¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
Fiscal Year 2012: ¥650,000 (Direct Cost: ¥500,000、Indirect Cost: ¥150,000)
Fiscal Year 2011: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Keywords走査プローブ顕微鏡 / 走査トンネル顕微鏡 / グラフェン
Research Abstract

Using very sharp tip of Scanning Tunneling Microscopy, one can measure the electric conductance of small objects. However, in conventional set up, we can’t measure the conductance of nanoscale-objects, because of “geometric restriction”. In this investigation, we have demonstrated that such measurement is possible by using very flat or very thin samples.

Report

(3 results)
  • 2012 Annual Research Report   Final Research Report ( PDF )
  • 2011 Research-status Report
  • Research Products

    (5 results)

All 2012 2011 Other

All Journal Article (1 results) (of which Peer Reviewed: 1 results) Presentation (3 results) Remarks (1 results)

  • [Journal Article] Admittance of Au/1,4-benzenedithiol/Ausingle-molecule junctions"

    • Author(s)
      Y. Kazumasa, S. Kurokawa, A. Sakai
    • Journal Title

      APPLIED PHYSICS LETTERS

      Volume: 101巻 25号 Pages: 253510-253510

    • Related Report
      2012 Final Research Report
    • Peer Reviewed
  • [Presentation] Ge 蒸着によって Si-SiO2 境界に形成されるナノギャップの STM 観察 II2012

    • Author(s)
      黒川 修,太田 靖,酒井 明
    • Organizer
      第73回応用物理学会学術講演会
    • Place of Presentation
      松山(12p-PA5-2)
    • Year and Date
      2012-09-12
    • Related Report
      2012 Final Research Report
  • [Presentation] Ge 蒸着によってSi-SiO2 境界に形成されるナノギャップのSTM 観察II2012

    • Author(s)
      黒川 修
    • Organizer
      応用物理学会
    • Place of Presentation
      愛媛大学
    • Related Report
      2012 Annual Research Report
  • [Presentation] Formation of the nanogap applicable for direct observation of single molecule junction2011

    • Author(s)
      Y. Ota, S. Kurokawa, and A. Sakai
    • Place of Presentation
      Tokyo(13-PN80)
    • Year and Date
      2011-12-13
    • Related Report
      2012 Final Research Report
  • [Remarks]

    • URL

      http://www.mtl.kyoto-u.ac.jp/groups/electronicshp/src/index.html

    • Related Report
      2012 Final Research Report

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Published: 2011-08-05   Modified: 2019-07-29  

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