| Project/Area Number |
23760040
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Japan Atomic Energy Agency |
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Principal Investigator |
IMAZONO Takashi 独立行政法人日本原子力研究開発機構, 量子ビーム応用研究部門, 研究職 (50370359)
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| Project Period (FY) |
2011 – 2012
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| Project Status |
Completed (Fiscal Year 2012)
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| Budget Amount *help |
¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
Fiscal Year 2012: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2011: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
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| Keywords | 軟X線多層膜 / 偏光解析 / X線レーザー / 偏光子 / 移相子 / 偏光制御 / 多層膜 / 偏光 / 軟Ｘ線 / 軟Ｘ線多層膜 / Ｘ線レーザー |
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| Research Abstract |
The purpose of this study is to verify that a Mo/Si multilayer mirror acts as a reflection phase shifter having a retardation of 90 degrees, i.e., quarter-wave plate, for laser-driven soft x-ray laser (XRL). The Mo/Si multilayer phase shifter allows us to control the state of polarization of XRL. A reflection-type Mo/Si multilayer phase shifter is designed and fabricated, and of which the polarization property is characterized by using synchrotron radiation light. The experimental results clearly show that a circularly polarized XRL light is created by means of the phase shifter.
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