| Budget Amount *help |
¥4,290,000 (Direct Cost: ¥3,300,000、Indirect Cost: ¥990,000)
Fiscal Year 2013: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2012: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2011: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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| Research Abstract |
Toroidal profiles of the microscopic damage, erosion and deposition on the Large Helical Device (LHD) first-wall (SUS316L) were simultaneously evaluated by using focused ion beam (FIB) fabrication technique and transmission electron microscope (TEM) observation.
Sputtering erosion of the first-wall surfaces was mainly caused by glow discharge cleanings (GDCs) and not main plasma discharges, and the erosion depths of each toroidal section were varied from 50 nm to 1000 nm. Characteristics of the deposition layers and microscopic damages on the SUS316L matrix were different in each toroidal section. If we would want to reduce the amount of the hydrogen isotope retention on the first-wall surface, suppression of the formation of the mixed-material deposition layer is necessary.
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