| Project/Area Number |
23860019
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| Research Category |
Grant-in-Aid for Research Activity Start-up
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| Allocation Type | Single-year Grants |
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| Research Field |
Materials/Mechanics of materials
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| Research Institution | Tokyo Institute of Technology |
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Principal Investigator |
AONO Yuko 東京工業大学, 大学院・理工学研究科, 助教 (20610033)
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| Project Period (FY) |
2011
|
| Project Status |
Completed (Fiscal Year 2011)
|
| Budget Amount *help |
¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2011: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Keywords | 薄膜機能性材料 / コンビナトリアル手法 / ハイスループット評価 / 薄膜形状記憶合金 |
|---|
| Research Abstract |
High-throughput characterization method for thermal properties of functional thin films were proposed. The proposed method used thin film library which is compositionally distributed multiple samples, and thermography detects emissivity change caused by transformation of each sample on the thin film library. It is revealed that the higher surface roughness of the thin film library increase sensitivity of the detection. Thin film libraries with samples of shape memory alloys were fabricated and characterized by the proposed method. Two-way transformation and thermal hysteresis of shape memory alloys can be characterized at once.
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