| Project/Area Number |
24221007
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| Research Category |
Grant-in-Aid for Scientific Research (S)
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| Allocation Type | Single-year Grants |
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| Research Field |
Quantum beam science
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| Research Institution | High Energy Accelerator Research Organization |
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Principal Investigator |
Hyodo Toshio 大学共同利用機関法人高エネルギー加速器研究機構, 物質構造科学研究所, 特別教授 (90012484)
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| Co-Investigator(Kenkyū-buntansha) |
高橋 敏男 東京学芸大学, 教育学部, 研究員 (20107395)
深谷 有喜 国立研究開発法人日本原子力研究開発機構, その他部局等, 研究員 (40370465)
藤浪 眞紀 千葉大学, 工学(系)研究科(研究院), 教授 (50311436)
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| Co-Investigator(Renkei-kenkyūsha) |
WADA Ken 量子科学技術研究開発機構, 高崎量子応用研究所, 主幹研究員 (10401209)
SHIRASAWA Tetsuro 産業技術総合研究所, 物質計測標準研究部門, 主任研究員 (80451889)
KAWASUSO Atsuo 量子科学技術研究開発機構, 高崎量子応用研究所, プロジェクトリーダー (20354946)
MAEKAWA Masaki 量子科学技術研究開発機構, 高崎量子応用研究所, 主幹研究員 (10354945)
SHIDARA Tetsuo 高エネルギー加速器研究機構, 研究支援戦略推進部・研究支援企画室, 主任URA (50132684)
ICHIMIYA Ayahiko 高エネルギー加速器研究機構, 物質構造科学研究所, 協力研究員 (00023292)
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| Research Collaborator |
MOCHIZUKI Izume 高エネルギー加速器研究機構, 物質構造科学研究所, 特任助教 (30579058)
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| Project Period (FY) |
2012-05-31 – 2017-03-31
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| Project Status |
Completed (Fiscal Year 2016)
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| Budget Amount *help |
¥215,410,000 (Direct Cost: ¥165,700,000、Indirect Cost: ¥49,710,000)
Fiscal Year 2016: ¥26,780,000 (Direct Cost: ¥20,600,000、Indirect Cost: ¥6,180,000)
Fiscal Year 2015: ¥27,040,000 (Direct Cost: ¥20,800,000、Indirect Cost: ¥6,240,000)
Fiscal Year 2014: ¥33,670,000 (Direct Cost: ¥25,900,000、Indirect Cost: ¥7,770,000)
Fiscal Year 2013: ¥46,540,000 (Direct Cost: ¥35,800,000、Indirect Cost: ¥10,740,000)
Fiscal Year 2012: ¥81,380,000 (Direct Cost: ¥62,600,000、Indirect Cost: ¥18,780,000)
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| Keywords | 陽電子回折 / 高強度低速陽電子ビーム / TRHEPD / LEPD / 表面構造 / グラフェン / 第14族単原子層物質 / 二酸化チタン / シリセン / ゲルマネン / 電子・陽電子 / 量子ビーム / 表面・界面 / 表面構造解析 / 物性実験 / ナノワイヤ構造 / TEHEPD / 表面・界面物性 / 粒子線 / 全反射高速陽電子回折 / 低速陽電子回折 |
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| Outline of Final Research Achievements |
A total-reflection high-energy positron diffraction (TRHEPD) apparatus and a low-energy positron diffraction (LEPD) machine were developed using an accelerator-based high-intensity positron beam, followed by the first realization of positron diffraction data acquisition within a practical measurement time frame. The TRHEPD measurements demonstrated the exceedingly high sensitivity of positron diffraction to the details of the outermost and near surface atomic geometry. THREPD was used to determine the atomic arrangement of the Pt atomic nanowires on a Ge surface and that of the rutile-TiO2(110) (1×2) surface, matters which had not been settled for a decade and for more than 30 years, respectively. Particular efforts were made to determine the amount of buckling and the distance to the substrate surface of single layer sheets of the group 14 atoms in the periodic table, such as graphene, silicene, and germanene, which information is crucial to the understanding of these materials.
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| Assessment Rating |
Verification Result (Rating)
A-
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Assessment Rating |
Result (Rating)
A: Progress in the research is steadily towards the initial goal. Expected research results are expected.
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