| Budget Amount *help |
¥44,980,000 (Direct Cost: ¥34,600,000、Indirect Cost: ¥10,380,000)
Fiscal Year 2015: ¥8,320,000 (Direct Cost: ¥6,400,000、Indirect Cost: ¥1,920,000)
Fiscal Year 2014: ¥8,580,000 (Direct Cost: ¥6,600,000、Indirect Cost: ¥1,980,000)
Fiscal Year 2013: ¥12,090,000 (Direct Cost: ¥9,300,000、Indirect Cost: ¥2,790,000)
Fiscal Year 2012: ¥15,990,000 (Direct Cost: ¥12,300,000、Indirect Cost: ¥3,690,000)
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| Outline of Final Research Achievements |
We extended the performance of scanning probe microscopy (SPM) techniques developed with our bases, such as the combined instrument of SPM and scanning electron microscopy(SEM), and bias non-contact atomic force microscopy (nc-AFM). We carried out the followings: fabrication of SPM probes of WOx nanorods on W tips by bringing the tips closer to the source of WO3 powers supported on a W filament heated by use of the SEM-SPM setup; development of retuned two-prong quartz tuning forks for a high sensitivity force sensor; measurements of energy dissipation through the interaction between a tip and a sample; nanoscale electric measurements such as electric capacitance, contact potential difference, and charge transfer using a charge sensitive amplifier installed in the nc-AFM setup. We contributed to a scientific and technological field of surfaces and interfaces on atomic scale by applying them to π-conjugated molecules, and to the films and surfaces of oxides.
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