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Elucidation of dynamic characters of dislocations and their electronic and optical properties in wide bandgap semiconductors

Research Project

Project/Area Number 24246103
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Physical properties of metals
Research InstitutionTohoku University

Principal Investigator

YONENAGA Ichiro  東北大学, 金属材料研究所, 教授 (20134041)

Co-Investigator(Kenkyū-buntansha) OHNO Yutaka  東北大学, 金属材料研究所, 准教授 (80243129)
TOKUMOTO Yuki  東北大学, 金属材料研究所, 助教 (20546866)
KUTSUKAKE Kentaro  東北大学, 金属材料研究所, 助教 (00463975)
DEURA Momoko  東北大学, 金属材料研究所, 助教 (90609299)
沓掛 健太朗  東北大学, 金属材料研究所, 助教 (00463795)
Project Period (FY) 2012-04-01 – 2015-03-31
Project Status Completed (Fiscal Year 2014)
Budget Amount *help
¥47,840,000 (Direct Cost: ¥36,800,000、Indirect Cost: ¥11,040,000)
Fiscal Year 2014: ¥6,110,000 (Direct Cost: ¥4,700,000、Indirect Cost: ¥1,410,000)
Fiscal Year 2013: ¥9,230,000 (Direct Cost: ¥7,100,000、Indirect Cost: ¥2,130,000)
Fiscal Year 2012: ¥32,500,000 (Direct Cost: ¥25,000,000、Indirect Cost: ¥7,500,000)
Keywords半導体物性 / 転位ナノ物性 / ワイドギャップ半導体 / 転位動特性 / 転位電子光学物性 / 転位電子光学特性
Outline of Final Research Achievements

In various wide bandgap semiconductors as III-nitrides, II-VI zinc compounds and IV-IV compounds, dislocations are one of the detrimental defects affecting the device functions and at present, crucial for controlling in order to improve device efficiencies. Thus, various intrinsic properties of dislocations in the semiconductors were comprehensively investigated in terms of dynamic, electrical and optical properties together with the atomic structures and discussed a new ability to functional devices.

Report

(4 results)
  • 2014 Annual Research Report   Final Research Report ( PDF )
  • 2013 Annual Research Report
  • 2012 Annual Research Report
  • Research Products

    (37 results)

All 2015 2014 2013 2012

All Journal Article (17 results) (of which Peer Reviewed: 9 results,  Acknowledgement Compliant: 2 results) Presentation (19 results) (of which Invited: 3 results) Book (1 results)

  • [Journal Article] Evaluation of dislocation mobility in wurtzite semiconductors2015

    • Author(s)
      I. Yonenaga
    • Journal Title

      Materials Research Society Symposium Proceedings of Synthesis "Processing and mechanical properties of functional hexagonal materials"

      Volume: 1741

    • DOI

      10.1557/opl.2015.61

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Optical and electrical properties of dislocations in plastically deformed GaN2014

    • Author(s)
      I. Yonenaga, Y. Ohno, T. Yao, K. Edagawa
    • Journal Title

      Journal of Crystal Growth

      Volume: 403 Pages: 72-76

    • DOI

      10.1016/j.jcrysgro.2014.06.021

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] InNの硬度とヤング率2014

    • Author(s)
      大久保泰、出浦桃子、徳本有紀、沓掛健太朗、大野裕、米永一郎
    • Journal Title

      信学技報(IEICE Technical Report)

      Volume: 114 Pages: 45-48

    • Related Report
      2014 Annual Research Report
  • [Journal Article] GaN中の転位の電気的特性、光学的特性2014

    • Author(s)
      米永一郎
    • Journal Title

      第24回格子欠陥フォーラム「パワーデバイス開発のための格子欠陥評価・制御」

      Volume: 24 Pages: 55-58

    • Related Report
      2014 Annual Research Report
  • [Journal Article] Slip systems in wurtzite ZnO activated by Vickers indentation on {2-1-10} and {10-10} surfaces at elevated temperatures2014

    • Author(s)
      Y. Ohno, H. Koizumi, Y. Tokumoto, K. Kutsukake, H. Taneichi and I. Yonenaga
    • Journal Title

      J. Crystal Growth

      Volume: 393 Pages: 119-122

    • DOI

      10.1016/j.jcrysgro.2013.11.033

    • Related Report
      2013 Annual Research Report
  • [Journal Article] Microstructure of striae in <0-441>-oriented lithium niobate single crystal grown by Czochralski method2014

    • Author(s)
      Y. Ohno, T.Taishi, N. Bamba and I. Yonenaga
    • Journal Title

      J. Crystal Growth

      Volume: 393 Pages: 171-174

    • DOI

      10.1016/j.jcrysgro.2013.12.002

    • Related Report
      2013 Annual Research Report
  • [Journal Article] In-situ micro and near-field photo-excitation under transsmission elecron microscopy2014

    • Author(s)
      Y. Ohno and I. Yonenaga
    • Journal Title

      Appl. Surface Science

      Volume: 302 Pages: 29-31

    • DOI

      10.1016/j.apsusc.2013.11.061

    • Related Report
      2013 Annual Research Report
  • [Journal Article] Effective Detection Method for Misoriented Grains in Nonpolar GaN Layers and Future Prospect2013

    • Author(s)
      徳本有紀、李 賢宰、大野 裕、八百隆文、米永一郎
    • Journal Title

      Materia Japan

      Volume: 52 Issue: 6 Pages: 273-277

    • DOI

      10.2320/materia.52.273

    • NAID

      10031176441

    • ISSN
      1340-2625, 1884-5843
    • Related Report
      2013 Annual Research Report
  • [Journal Article] Vacancy-type defects introduced by plastic deformation of GaN studied using monoenergetic positron beams2013

    • Author(s)
      A. Uedono, I. Yonenaga, T. Watanabe, S. Kimura, N. Ohsaima, R. Suzuki, S. Ishibashi and Y. Ohno
    • Journal Title

      J. Appl. Phys.

      Volume: 114 Issue: 8

    • DOI

      10.1063/1.4819798

    • Related Report
      2013 Annual Research Report
  • [Journal Article] Influence of Isoelectronic Te Doping on the Physical Properties of ZnO Films Grown by Molecular-Beam Epitaxy2013

    • Author(s)
      S-H. Park, T. Minegishi, D-C. Oh, D-J. Kim, J-H. Chang, T. Yao, T. Taishi and I. Yonenaga
    • Journal Title

      J. J. Appl. Phys.

      Volume: 52 Issue: 5R Pages: 055501-055501

    • DOI

      10.7567/jjap.52.055501

    • NAID

      210000142170

    • Related Report
      2013 Annual Research Report 2012 Annual Research Report
  • [Journal Article] p-type conductivity control of heteroepitaxially grown ZnO films by N and Te codoping and thermal annealing2013

    • Author(s)
      S-H. Park, T. Minegishi, D-C. Oh, J-H. Chang, T. Yao, T. Taishi and I. Yonenaga
    • Journal Title

      J. Cryst. Growth

      Volume: 363 Pages: 190-194

    • DOI

      10.1016/j.jcrysgro.2012.10.042

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Local current conduction due to edge dislocations in deformed GaN studied by scanning spreading resistance microscopy2013

    • Author(s)
      T. Yokoyama, Y. Kamimura, K. Edagawa and I. Yonenaga
    • Journal Title

      Euro. Phys. J. Appl. Phys.

      Volume: 61 Issue: 1 Pages: 10102-10102

    • DOI

      10.1051/epjap/2012120318

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Optical properties of edge dislocations on (1100) prismatic planes in wurtzite ZnO introduced at elevated temperatures2012

    • Author(s)
      Y. Ohno, Y. Tokumoto, I. Yonenaga, K. Fujii and T. Yao
    • Journal Title

      J. Appl. Phys.

      Volume: 111 Issue: 11

    • DOI

      10.1063/1.4725426

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Recombination activity of dislocations on (0001) introduced in wurtzite ZnO at elevated temperatures2012

    • Author(s)
      Y. Ohno, Y. Tokumoto, I. Yonenaga, K. Fujii and T. Yao
    • Journal Title

      Physics B

      Volume: 407 Issue: 15 Pages: 2886-2888

    • DOI

      10.1016/j.physb.2011.08.053

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] In-situ transmission electron microscopy of partial-dislocation glide in 4H-SiC under electron irradiation2012

    • Author(s)
      Y. Ohno, I. Yonenaga, K. Miyao, K. Maeda and H. Tsuchida
    • Journal Title

      Appl. Phys. Lett.

      Volume: 101 Issue: 4 Pages: 042102-042102

    • DOI

      10.1063/1.4737938

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Formation and Evolution of Misoriented Grains in <i>a</i>-Plane Oriented Gallium Nitride Layers2012

    • Author(s)
      Y. Tokumoto, H-J. Lee, Y. Ohno, T. Yao and I. Yonenaga
    • Journal Title

      MATERIALS TRANSACTIONS

      Volume: 53 Issue: 11 Pages: 1881-1884

    • DOI

      10.2320/matertrans.MA201221

    • NAID

      130004454893

    • ISSN
      1345-9678, 1347-5320
    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation2012

    • Author(s)
      Y. Tokumoto, K. Kutsukake, Y. Ohno and I. Yonenaga
    • Journal Title

      J. Appl. Phys.

      Volume: 112 Issue: 9

    • DOI

      10.1063/1.4764928

    • Related Report
      2012 Annual Research Report
    • Peer Reviewed
  • [Presentation] Strength and Dislocation Mobility in Wide Bandgap Semiconductors2014

    • Author(s)
      I. Yonenaga
    • Organizer
      Material Science Society 2014 Fall Meeting
    • Place of Presentation
      Boston (USA)
    • Year and Date
      2014-12-01 – 2014-12-05
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] InNの硬度とヤング率2014

    • Author(s)
      大久保泰、出浦桃子、徳本有紀、沓掛健太朗、大野裕、米永一郎
    • Organizer
      電子デバイス研究会(ED)/電子部品・材料研究会(CPM)/レーザー・量子エレクトロニクス研究会(LQE)
    • Place of Presentation
      大阪大学(大阪府吹田市)
    • Year and Date
      2014-11-27 – 2014-11-28
    • Related Report
      2014 Annual Research Report
  • [Presentation] COガスを用いたSi表面炭化により形成したSiC層の微細構造評価2014

    • Author(s)
      出浦桃子,大野裕,福山博之,米永一郎
    • Organizer
      応用物理学会
    • Place of Presentation
      北海道大学(北海道札幌市)
    • Year and Date
      2014-09-17 – 2014-09-20
    • Related Report
      2014 Annual Research Report
  • [Presentation] Development of a small light probe towards in-situ near-field Raman spectroscopy under transmission electron microscopy2014

    • Author(s)
      Y. Ohno, I. Yonenaga
    • Organizer
      Extended Defects in Semiconductors 2014
    • Place of Presentation
      Goettingen (Germany)
    • Year and Date
      2014-09-14 – 2014-09-19
    • Related Report
      2014 Annual Research Report
  • [Presentation] GaN中の転位の電気的特性、光学的特性2014

    • Author(s)
      米永一郎
    • Organizer
      第24回格子欠陥フォーラム「パワーデバイス開発のための格子欠陥評価・制御」
    • Place of Presentation
      かんぽの宿恵那(岐阜県恵那市)
    • Year and Date
      2014-09-11 – 2014-09-12
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] ナノインデンテーション法によるInN薄膜の機械的特性の研究2014

    • Author(s)
      大久保泰、 徳本有紀、後藤頼良、沓掛健太朗、出浦桃子、大野裕、米永一郎
    • Organizer
      東北大学研究所連携プロジェクト平成25年度報告会
    • Place of Presentation
      仙台
    • Related Report
      2013 Annual Research Report
  • [Presentation] Dislocation dynamics in AlN films induced by in situ TEM nanoindentation2013

    • Author(s)
      Y. Tokumoto, K. Kutsukake, Y. Ohno, I. Yonenaga
    • Organizer
      18th Microscopy of Semiconducting Materials Meeting (MSMXVIII)
    • Place of Presentation
      Oxford (UK)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Slip systems in wurtzite ZnO single crystals at elevated temperatures2013

    • Author(s)
      Y. Ohno, H. Koizumi, Y. Tokumoto, K. Kutsukake, H. Taneichi, I. Yonenaga
    • Organizer
      The 19th American Conference on Crystal Growth (ACCGE-19)
    • Place of Presentation
      Keystone (USA)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Dislocation mobilities in wide band-gap semiconductors2013

    • Author(s)
      I. Yonenaga, Y. Ohno, Y. Tokumoto, K. Kutsukake
    • Organizer
      The 19th American Conference on Crystal Growth (ACCGE-19)
    • Place of Presentation
      Keystone (USA)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Fundamental properties of edge dislocations induced by plastic deformation in GaN2013

    • Author(s)
      I. Yonenaga, T. Yao, K. Edagawa
    • Organizer
      The 10th International Conference on Nitride Semiconductors
    • Place of Presentation
      Washington, D.C. (USA)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Nanoindentation hardness of AlGaN alloys2013

    • Author(s)
      Y. Tokumoto, H. Taneichi, Y. Ohno, K. Kutsukake, H. Miyake, K. Hiramatsu, I. Yonenaga
    • Organizer
      The 10th International Conference on Nitride Semiconductors
    • Place of Presentation
      Washington, D.C. (USA)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Growth and characterization of Si-doped AlN films on sapphire2013

    • Author(s)
      G. Nishio, H. Miyake, K. Hiramatsu, Y. Tokumoto, I. Yonenaga
    • Organizer
      2013 JSAP-MRS Joint Symposia
    • Place of Presentation
      Kyoto
    • Related Report
      2013 Annual Research Report
  • [Presentation] Intrinsic properties of dislocations freshly induced by plastic deformation in GaN2013

    • Author(s)
      I. Yonenaga, T. Yao, K. Edagawa
    • Organizer
      Material Science Society 2013 Fall Meeting
    • Place of Presentation
      Boston (USA)
    • Related Report
      2013 Annual Research Report
  • [Presentation] ナノインデンテーション法によるAlxGa1-xN薄膜の硬度測定2013

    • Author(s)
      徳本有紀
    • Organizer
      日本物理学会2013春
    • Place of Presentation
      広島
    • Related Report
      2012 Annual Research Report
  • [Presentation] 高温微小硬度試験法で導入されたZnO中の転位の構造特性2013

    • Author(s)
      大野裕
    • Organizer
      日本物理学会2013春
    • Place of Presentation
      広島
    • Related Report
      2012 Annual Research Report
  • [Presentation] Optical properties of prismatic dislocations in ZnO2012

    • Author(s)
      Y. Ohno
    • Organizer
      14th International Conference on Extended Defects in Semiconductors
    • Place of Presentation
      Thessaloniki (Greece)
    • Related Report
      2012 Annual Research Report
  • [Presentation] Revisiting radiation-enhanced dislocation glide with recent studies on 4H-SiC2012

    • Author(s)
      Y. Ohno
    • Organizer
      14th International Conference on Extended Defects in Semiconductors
    • Place of Presentation
      Thessaloniki (Greece)
    • Related Report
      2012 Annual Research Report
    • Invited
  • [Presentation] Dislocation-induced Optical Properties of Wide Gaps GaN and ZnO2012

    • Author(s)
      I. Yonenaga
    • Organizer
      Dislocations 2012
    • Place of Presentation
      Budapest (Hungary)
    • Related Report
      2012 Annual Research Report
  • [Presentation] Propagation Behavior of Nanoindentation-induced Dislocations in AlN Films2012

    • Author(s)
      Y. Tokumoto
    • Organizer
      14th International Conference on Extended Defects in Semiconductors
    • Place of Presentation
      Thessaloniki (Greece)
    • Related Report
      2012 Annual Research Report
  • [Book] A book chapter in In-situ Electron Microscopy2012

    • Author(s)
      Y. Ohno
    • Publisher
      WILEY-VCH
    • Related Report
      2012 Annual Research Report

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Published: 2013-05-15   Modified: 2019-07-29  

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