Development of a transient positron measurement system using ion-positron simultaneous irradiation
| Project/Area Number |
24310080
|
|---|
| Research Category |
Grant-in-Aid for Scientific Research (B)
|
| Allocation Type | Partial Multi-year Fund |
|---|
| Section | 一般 |
|---|
| Research Field |
Quantum beam science
|
|---|
| Research Institution | Kyoto University (2014)
National Institute of Advanced Industrial Science and Technology (2012-2013) |
|---|
Principal Investigator |
|
|---|
| Co-Investigator(Kenkyū-buntansha) |
OSHIMA Nagayasu 産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (00391889)
O'ROURKE Brain E. 産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (60586551)
SUZUKI Ryoichi 産業技術総合研究所, 計測フロンティア研究部門, 首席研究員 (80357300)
OGAWA Hiroshi 産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (60356699)
|
|---|
| Co-Investigator(Renkei-kenkyūsha) |
OHDAIRA Toshiyuki 産業技術総合研究所, 計測フロンティア研究部門, 主任研究員 (90356642)
TSUCHIDA Hidetsugu 京都大学, 工学(系)研究科(研究院), 准教授 (50304150)
|
|---|
| Research Collaborator |
NISHIJIMA Toshiji
|
|---|
| Project Period (FY) |
2012-04-01 – 2015-03-31
|
| Project Status |
Completed (Fiscal Year 2014)
|
| Budget Amount *help |
¥18,330,000 (Direct Cost: ¥14,100,000、Indirect Cost: ¥4,230,000)
Fiscal Year 2014: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2013: ¥5,590,000 (Direct Cost: ¥4,300,000、Indirect Cost: ¥1,290,000)
Fiscal Year 2012: ¥10,660,000 (Direct Cost: ¥8,200,000、Indirect Cost: ¥2,460,000)
|
|---|
| Keywords | 陽電子 / イオン照射 / 照射損傷 / その場分析 |
|---|
| Outline of Final Research Achievements |
Ion-positron dual-beam analysis system for in-situ detection of ion-irradiation induced defects was developed. The developed system made it possible to perform positron lifetime measurements with a time window of 20 microsecond under synchronized irradiation of pulsed ion beams and electron-linear-accelerator based positron beams. Dual beam irradiation experiments were performed for Si oxide and pure metal samples by using this system. The experiments for pure Ni samples indicated that the transient change of ion-irradiation induced defects can be detected from positrons re-emitted from the surface.
|
Report
(4 results)
Research Products
(28 results)
