Research Project
Grant-in-Aid for Scientific Research (B)
Homo-epitaxial growth of thick AlN layers by hydride vapor phase epitaxy (HVPE) was investigated on low dislocation density (< 1000 /cm2) AlN wafers prepared by physical vapor transport (PVT). AlN wafers prepared from HVPE layers had high structural quality identical to that of the PVT-AlN wafers and deep-UV transparency with an optical cutoff at 206.5 nm. The development of deep-UV transparency was found to be related to lower concentration of carbon impurity in the HVPE-AlN wafers. Strong electroluminescence (EL) peaking at 268 nm from deep-UV LEDs fabricated by metal-organic chemical vapor deposition (MOCVD) on the HVPE-AlN wafers could be extracted through the HVPE-AlN wafers.
All 2015 2014 2013 2012 Other
All Journal Article (9 results) (of which Peer Reviewed: 9 results) Presentation (41 results) (of which Invited: 14 results) Remarks (1 results)
Applied Physics Letters
Volume: 104 Issue: 20
10.1063/1.4878657
Physica Status Solidi (c)
Volume: 11 Issue: 3-4 Pages: 405-407
10.1002/pssc.201300529
Japanese Journal of Applied Physics
Volume: 52 Issue: 8S Pages: 08JB10-08JB10
10.7567/jjap.52.08jb10
Applied Physics Express
Volume: 6 Issue: 9 Pages: 092103-092103
10.7567/apex.6.092103
Volume: 103 Issue: 16
10.1063/1.4824731
Volume: 100 Issue: 19 Pages: 1919141-5
10.1063/1.4717623
Volume: 5 Issue: 5 Pages: 0555041-3
10.1143/apex.5.055504
Volume: 5 Issue: 12 Pages: 1255011-3
10.1143/apex.5.125501
Volume: 5 Issue: 12 Pages: 1221011-3
10.1143/apex.5.122101
http://www.tuat.ac.jp/disclosure/pressrelease/2012/20121225135159/index.html