Instrumentation for Photoelectric Conversion Effect and Single Atom Clustering using Scanning Probe Microscopy
Project/Area Number |
24360016
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Research Category |
Grant-in-Aid for Scientific Research (B)
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Allocation Type | Partial Multi-year Fund |
Section | 一般 |
Research Field |
Thin film/Surface and interfacial physical properties
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Research Institution | Osaka University (2013-2014) Nagoya University (2012) |
Principal Investigator |
ABE Masayuki 大阪大学, 基礎工学研究科, 教授 (00362666)
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Project Period (FY) |
2012-04-01 – 2015-03-31
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Project Status |
Completed (Fiscal Year 2014)
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Budget Amount *help |
¥19,240,000 (Direct Cost: ¥14,800,000、Indirect Cost: ¥4,440,000)
Fiscal Year 2014: ¥3,380,000 (Direct Cost: ¥2,600,000、Indirect Cost: ¥780,000)
Fiscal Year 2013: ¥3,770,000 (Direct Cost: ¥2,900,000、Indirect Cost: ¥870,000)
Fiscal Year 2012: ¥12,090,000 (Direct Cost: ¥9,300,000、Indirect Cost: ¥2,790,000)
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Keywords | 非接触原子間力顕微鏡 / 原子操作 / 金属酸化物 / プリズム / 光電変換 / 原子間力顕微鏡 / 光入射 / Al2O3 / LaAlO3 / 走査型プローブ顕微鏡 / 光 / AFM / 原子分解能 |
Outline of Final Research Achievements |
In order to investigate the interaction between light and materials at the atomic level, this study aimed at achieving a scanning probe microscope that could measure interaction force due to light incident onto a surface, and at investigating atom manipulation process to fabricating nano-clusters at room temperature. We have succeeded in realize atomically flat surface of transparent samples of Al2O3 and LaAlO3, SrTiO3. These would be shaped to prisms as substrate for light incident experiments in atomic level. We have developed a prism sample holder capable of heating that is needed for realizing the atomically flat surface. On the Al2O3 (0001) surface, we have succeeded in resolve atom in the unit cell. In the atom manipulation experiments, we performed nano-fabricating in which nano-clusters were made in the half unit cell of the Si (111) at room temperature environment. Au, Sn and Pb were used for creating clusters.
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Report
(4 results)
Research Products
(68 results)
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[Presentation] Interplay between Current and Force on Si4 Atom Switch2014
Author(s)
S. Yamazaki, K. Maeda, Y. Sugimoto, M. Abe, P. Pou, L. Rodrigo, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
22th International Colloquium on Scanning Probe Microscopy
Place of Presentation
Atagawa, Shizuoka, Japan
Year and Date
2014-12-11 – 2014-12-13
Related Report
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[Presentation] Competing Force- and Current- Induced Atom Switching at Bi-stable All-Si Tetramer2014
Author(s)
S. Yamazaki, K. Maeda, Y. Sugimoto, M. Abe, P. Pou, L. Rodrigo, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
The 7th International Symposium on Surface Science and Nanotechnology (ISSS7)
Place of Presentation
Kunibiki Messe, Matsue, Shimane, Japan
Year and Date
2014-11-03 – 2014-11-06
Related Report
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[Presentation] Mechanical Atom Switching of Bistable Si4 Cluster2014
Author(s)
S. Yamazaki, K. Maeda, Y. Sugimoto, M. Abe, P. Pou, L. Rodrigo, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
17th International Conference on Non-Contact Atomic Force Microscopy (nc-AFM2014)
Place of Presentation
Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
Year and Date
2014-08-04 – 2014-08-08
Related Report
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[Presentation] Selectable force and current induced atom switching of Si tetramer2014
Author(s)
K. Maeda, S. Yamazaki, Y. Sugimoto, M. Abe, P. Pou, L. Rodrigo, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
17th International Conference on Non-Contact Atomic Force Microscopy (nc-AFM2014)
Place of Presentation
Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
Year and Date
2014-08-04 – 2014-08-08
Related Report
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[Presentation] Force- and Current Induced All-Silicon Atom Switching2014
Author(s)
K. Maeda, S. Yamazaki, R. Takatani, D. Sawada, Y. Sugimoto, M. Abe, P. Pou, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
1st KANSAI Nanoscience and Nanotechnology International Symposium
Place of Presentation
Senri Life Science Center, Toyonaka, Osaka, Japan
Related Report
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[Presentation] Current- and Force- Induced Si4 Atom Switching using STM and AFM2013
Author(s)
S. Yamazaki, R. Takatani, K. Maeda, D. Sawada, Y. Sugimoto, M. Abe, P. Pou, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
12th International Conference on Atomically Controlled Surface, Interfaces and Nanostructure (ACSIN-12 & ICSPM21)
Place of Presentation
Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
Related Report
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[Presentation] Beyond Chenical Sensitivity in nc-AFM: Probing Bond Character2013
Author(s)
M. Ondracek, Y. Sugimoto, M. Abe, A. Yurtsever, J. Onoda, M. Setvin, S. Morita, and P. Jelinek
Organizer
12th International Conference on Atomically Controlled Surface, Interfaces and Nanostructure (ACSIN-12 & ICSPM21)
Place of Presentation
Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
Related Report
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[Presentation] Role of tip chemical reactivity on atom manipulation process in dynamic AFM2013
Author(s)
A. Yurtsever, Y. Sugimoto, M. Abe, S. Morita, M. Ondracek, P. Pou, R. Perez, and P. Jelinek
Organizer
12th International Conference on Atomically Controlled Surface, Interfaces and Nanostructure (ACSIN-12 & ICSPM21)
Place of Presentation
Tsukuba International Congress Center, Tsukuba, Ibaraki, Japan
Related Report
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[Presentation] Force- and Current- Induced Atom Switching2013
Author(s)
S. Yamazaki, R. Takatani, K. Maeda, D. Sawada, Y. Sugimoto, M. Abe, P. Pou, R. Perez, P. Mutombo, P. Jelinek, and S. Morita
Organizer
16th International Conference on non-contact Atomic Force Microscopy (nc-AFM2013)
Place of Presentation
University of Maryland, Hyattsville, Maryland, USA
Related Report
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