| Project/Area Number |
24560024
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Nagoya University |
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Principal Investigator |
NAKAHARA Hitoshi 名古屋大学, 工学(系)研究科(研究院), 助教 (20293649)
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| Co-Investigator(Renkei-kenkyūsha) |
SAITO Yahachi 名古屋大学, 大学院工学研究科, 教授 (90144203)
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| Project Period (FY) |
2012-04-01 – 2015-03-31
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| Project Status |
Completed (Fiscal Year 2014)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2012: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Keywords | 電界放出電子源 / 電子顕微鏡 / ナノカーボン / 電界誘起成長 / 電界成長 |
|---|
| Outline of Final Research Achievements |
In this study, high-brightness nanocarbon field emission electron emitter was successfully fabricated by using a field emission induced growth (FEIG) method, which can be used for an electron microscopy. The nanocarbon emitter is made of a cluster of carbon nanocapsules having a diameter of about 1 nm, and it achieves more than 1 order of higher brightness than a conventional single crystalline tungsten emitter. Because of self alignment nature of the FEIG method, the grown nanocarbon emitter is easy to beam alignment in a conventional electron gun. Furthermore, it works under the same order of extraction voltage as a single crystalline tungsten emitter, so that it has been demonstrated that it has high adaptability to existing field emission electron guns.
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