Nanoscale polarization imaging by near-field Raman microscope
| Project/Area Number |
24560028
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka University |
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Principal Investigator |
Saito Yuika 大阪大学, 工学(系)研究科(研究院), 准教授 (90373307)
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| Project Period (FY) |
2012-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2014: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2013: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2012: ¥3,250,000 (Direct Cost: ¥2,500,000、Indirect Cost: ¥750,000)
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| Keywords | ラマン分光 / 近接場光学顕微鏡 / 偏光 / 分子配向 / ナノ材料 / 走査プローブ顕微鏡 / 超精密計測 / プラズモニクス / プラズモニスク / 顕微イメージング |
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| Outline of Final Research Achievements |
In this research, I aimed to develop a non-distractive optical method to analyze molecular orientation in nanoscale for future device applications. With the sizing-down of electric devices, there has been a strong demand to reveal the orientation of molecules used in film-type devices. Especially in an organic transistors, the mobility of electrons are determined by the parameters therefore it is crucial to determine the angle of the molecular axis. We combined near-field Raman spectroscopy and polarization measurements to achieve the goal.
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Report
(5 results)
Research Products
(30 results)
