Development of Beam Monitor for Stabilization of Hundreds MeV Ion Microbeam
| Project/Area Number |
24561048
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| Research Category |
Grant-in-Aid for Scientific Research (C)
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| Allocation Type | Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Nuclear engineering
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| Research Institution | Japan Atomic Energy Agency |
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Principal Investigator |
Satoh Takahiro 国立研究開発法人日本原子力研究開発機構, 原子力科学研究部門 高崎量子応用研究所 放射線高度利用施設部, 研究副主幹 (10370404)
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| Co-Investigator(Renkei-kenkyūsha) |
KADA Wataru 群馬大学, 大学院理工学府電子情報部門, 助教 (60589117)
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| Research Collaborator |
KOKA Masashi
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| Project Period (FY) |
2012-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥5,460,000 (Direct Cost: ¥4,200,000、Indirect Cost: ¥1,260,000)
Fiscal Year 2014: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
Fiscal Year 2013: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2012: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
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| Keywords | イオンビーム / ビームモニタ / シンチレータ / CCD / CMOS / イオンマイクロビーム / リアルタイム / シンンチレータ / 加速器 |
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| Outline of Final Research Achievements |
This study aimed to development of a beam monitor for measurement of intensity distribution of hundreds MeV ion microbeam. Specifically, the beam intensity was measured by imaging devices covered with scintillator. Calcium fluoride was selected as scintillator because it has the high degree of transparency and luminance, and little damage by beam irradiation. CCD and CMOS were used as imaging devices. As a result of irradiation experiment with 260 MeV neon beam, it was possible for the monitor to detect irradiation positions of the beams of a few counts per second with the spatial resolution of less than 7 μm in the case of CCD. Furthermore, the beams of hundreds counts per second were detectable in the case of COMS.
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Report
(5 results)
Research Products
(2 results)
