Demonstration of atomic-resolution X-ray microscopy and application to dislocation imaging
| Project/Area Number |
24651137
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Nanomaterials/Nanobioscience
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| Research Institution | Osaka University |
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Principal Investigator |
TAKAHASHI Yukio 大阪大学, 工学(系)研究科(研究院), 准教授 (00415217)
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| Project Period (FY) |
2012-04-01 – 2014-03-31
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| Project Status |
Completed (Fiscal Year 2013)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2013: ¥2,080,000 (Direct Cost: ¥1,600,000、Indirect Cost: ¥480,000)
Fiscal Year 2012: ¥1,950,000 (Direct Cost: ¥1,500,000、Indirect Cost: ¥450,000)
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| Keywords | ナノ計測 / X線イメージング / 放射光 / X線 / 金属物性 / Ｘ線イメージング / 国際情報交換(ドイツ) |
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| Research Abstract |
We propose atomic-resolution coherent X-ray diffraction imaging that combines coherent forward diffraction patterns with coherent Bragg diffraction patterns. In this study, we verified in a computer simulation that atomic-resolution X-ray diffraction imaging is possible when metallic nanocube particles are used as the sample even the current X-ray intensities at the third-generation synchrotron radiation facilitiy, SPring-8. In order to demonstrate the atomic-resolution X-ray imaging, we developed the experimental system for the measurements of coherent Bragg diffraction patterns and succeeded in the collection of (200) coherent diffraction pattern data of a Ag nanocube particle.
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Report
(3 results)
Research Products
(16 results)
