| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2013: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2012: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
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| Outline of Final Research Achievements |
Determining the energy levels of semiconductor nanoparticle is important to its application to optoelectronic devices. However, nanoparticle is usually coated with thick organic layer leading to difficulty to apply ultraviolet photoemission spectroscopy due to accumulation of charges in the nanoparticle and the limited proving depth. In this work, we demonstrated that photoemission yield spectroscopy, which has a larger proving depth and is little affected by charging of the sample, is a suitable tool to examine the energy levels of nanoparticles with an insulating organic layer.
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