| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2012: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Outline of Final Research Achievements |
In this study, aiming the identification of atomic species by developing a highly functionalized and high performance scanning nonlinear dielectric microscopy (SNDM), we performed atomically resolved measurement for several materials. We measured hydrogen adsorbed Si(111) surface and oxygen absorbed Si(100) surface and succeeded to identify the adsorption site and to determine atomic structure of the site. We newly invented a new atomically resolved potentiometry named scanning nonlinear dielectric potentiometry (SNDP). Using this SNDP, we revealed the electronic state of interface between graphene and SiC substrate. These results show that SNDM and SNDP have a great potential to identify atomic spices on the surface of condensed matter and their bonding state to substrates.
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