Visualization of atomic dipole moment and identification of atomic species by using scanning nonlinear dielectric microscopy
| Project/Area Number |
24656027
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Tohoku University |
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Principal Investigator |
CHO Yasuo 東北大学, 電気通信研究所, 教授 (40179966)
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| Project Period (FY) |
2012-04-01 – 2015-03-31
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| Project Status |
Completed (Fiscal Year 2014)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2014: ¥1,040,000 (Direct Cost: ¥800,000、Indirect Cost: ¥240,000)
Fiscal Year 2013: ¥1,300,000 (Direct Cost: ¥1,000,000、Indirect Cost: ¥300,000)
Fiscal Year 2012: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
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| Keywords | 走査型非線形誘電率顕微鏡 / 走査型非線形誘電ポテンシ ョメトリ / 原子双極子モーメント / 走査型非線形誘電ポテンショメトリ |
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| Outline of Final Research Achievements |
In this study, aiming the identification of atomic species by developing a highly functionalized and high performance scanning nonlinear dielectric microscopy (SNDM), we performed atomically resolved measurement for several materials. We measured hydrogen adsorbed Si(111) surface and oxygen absorbed Si(100) surface and succeeded to identify the adsorption site and to determine atomic structure of the site. We newly invented a new atomically resolved potentiometry named scanning nonlinear dielectric potentiometry (SNDP). Using this SNDP, we revealed the electronic state of interface between graphene and SiC substrate. These results show that SNDM and SNDP have a great potential to identify atomic spices on the surface of condensed matter and their bonding state to substrates.
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Report
(4 results)
Research Products
(72 results)
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[Journal Article] Charge gradient microscopy2014
Author(s)
Seungbum Hong , Sheng Tong , Woon lk Park , Yoshiomi Hiranaga , Yasuo Cho, Andreas Roelofs
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Journal Title
Proc. Natl. Acad. Sci. USA
Volume: 111
Issue: 18
Pages: 6566-6569
DOI
Related Report
Peer Reviewed
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