High Sensitive and High Resolution Imaging of Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance

• Project/Area Number: 24656035
• Research Category: Grant-in-Aid for Challenging Exploratory Research
• Allocation Type: Single-year Grants
• Research Field: Thin film/Surface and interfacial physical properties
• Research Institution: Osaka University
• Principal Investigator: SUGAWARA YASUHIRO 大阪大学, 工学(系)研究科(研究院), 教授 (40206404)
• Project Period (FY): 2012-04-01 – 2014-03-31
• Project Status: Completed (Fiscal Year 2013)
• Budget Amount: ¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000); Fiscal Year 2013: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000); Fiscal Year 2012: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
• Keywords: 磁気交換力顕微鏡 / 磁気交換力 / 強磁性共鳴 / スピン / 走査型プローブ顕微鏡 / 交換力 / 磁気モーメント / 原子間力顕微鏡

Research Abstract

In the magnetic exchange force microscopy, separate measurement of the structural information and the magnetic one on the surface has not been realized. In the present study, we have proposed a new magnetic exchange force microscopy using the ferromagnetic resonance, which can measure the structural information and the magnetic one on the surface separately. We have improved the performance of various technical elements used in the magnetic exchange force microscopy.

Research Products

• [Journal Article] The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes (2013)
  • Author(s): Z. Ma, L. Kou, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Journal Title: Nanotechnol Volume: 24 Issue: 22 Pages: 225701-225701
  • DOI: 10.1088/0957-4484/24/22/225701
  • Peer Reviewed
• [Journal Article] Complex Design of Dissipation Signals in Non-Contact Atomic Force Microscopy (2012)
  • Author(s): J. Bamidele, Y. J. Li, S. Jarvis, Y. Naitoh, Y. Sugawara, and L. Kantorovich
  • Journal Title: Phys. Chem. Chem. Phys Volume: 14 Pages: 16250-16257
  • Peer Reviewed
• [Journal Article] Quantification of atomic-scale elasticity on Ge(001)-c(4×2) surfaces via noncontact atomic force microscopy with a tungsten-coated ti (2012)
  • Author(s): Y. Naitoh, T. Kamijo, Y. J. Li and Y. Sugawara
  • Journal Title: Phys. Rev. Lett. Volume: 109 Issue: 21 Pages: 215501-215501
  • DOI: 10.1103/physrevlett.109.215501
  • Peer Reviewed
• [Journal Article] Chemical tip fingerprinting in scanning probe microscopy of an oxidized Cu(110) surface (2012)
  • Author(s): J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. N a ito h , Y. J . L I, Y. S u g a w a r a , I . S tic h , a n d L. Kantorovich
  • Journal Title: Phys. Rev. B Volume: 86 Issue: 15
  • DOI: 10.1103/physrevb.86.155422
  • Peer Reviewed
• [Journal Article] High potential sensitivity in heterodyne amplitude modulation Kelvin probe force microscopy (2012)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, T. Kamijo, Y. Naitoh, and Y. J. Li
  • Journal Title: Appl. Phys. Lett Volume: 100 Issue: 22
  • DOI: 10.1063/1.4723697
  • Peer Reviewed
• [Journal Article] Force Mapping on NaCl(100)/Cu(111) Surface by Atomic Force Microscopy at 78 K (2012)
  • Author(s): Y. J. Li, K. Tenjin, Y. Kinoshita, Z. Ma, L. Kou, Y. Naitoh, M. Kageshima and Y. Sugawara
  • Journal Title: Jpn. J. Appl. Phys. Volume: 51 Issue: 3R Pages: 035201-035201
  • DOI: 10.1143/jjap.51.035201
  • Peer Reviewed
• [Journal Article] ケルビンプローブフォース顕微鏡とその薄膜成長評価への応用 (2012)
  • Author(s): 菅原康弘, 野村光, 内藤賀公, 李艶君, 顕微鏡
  • Journal Title: 顕微鏡 Volume: 41 Pages: 18-21
  • NAID: 10030552179
  • Peer Reviewed
• [Journal Article] Complex Design of Dissipation Signals in Non-Contact Atomic Force Microscopy (2012)
  • Author(s): Joseph Bamidele, Yan Jun Li, Samuel Jarvis, Yoshitaka Naitoh, Yasuhiro Sugawara, and Lev Kantorovich
  • Journal Title: Physical Chemistry Chemical Physics Volume: 14 Pages: 16250-16257
  • Peer Reviewed
• [Presentation] 走査型プローブ顕微鏡(SPM) (2013)
  • Author(s): 菅原康弘
  • Organizer: 第56回表面科学基礎講座表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学
  • Year and Date: 2013-10-16
• [Presentation] 光誘起物質間力による単原子分解能顕微鏡 (2013)
  • Author(s): 菅原康弘, 徳山貴士, 李艶君
  • Organizer: 日本物理学会第67回年次大会, 領域5シンポジウム輻射力によるミクロ-マクロ転写の学理と応用への展開
  • Place of Presentation: 徳島大学
  • Year and Date: 2013-09-25
• [Presentation] Magnetic Force Microscopy Using Ferromagnetic Resonance (2013)
  • Author(s): Y. Sugawara
  • Organizer: 7th International Conference on Materials Engineering for Resources
  • Place of Presentation: Akita, Japan
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature FM-AFM (2013)
  • Author(s): Y. Sugawara, Y. Kinoshita, S. H. Lee, Y. Naitoh and Y. J. Li
  • Organizer: 4^<th> European1 Nanomanipulation Workshop
  • Place of Presentation: Kraków, Poland
• [Presentation] Atomic Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature FM-AFM (2013)
  • Author(s): Y. Sugawara, Y. Kinoshita, S. H. Lee, Y. Naitoh, and Y. J. Li
  • Organizer: The 4th European Manomanipulation Workshop
  • Place of Presentation: Krakow, Poland
  • Invited
• [Presentation] Heterodyne FM-KPFM to measure charge polarization induced by tip-sample chemical interaction (2013)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, Y. Naitoh and Y. J. Li
  • Organizer: International Conference on Noncontact Atomic Force Microscopy 2013
  • Place of Presentation: Maryland, USA
  • Invited
• [Presentation] Measurement of NiO(001) surface with magnetic exchange force microscopy using ferromagnetic resonance (2013)
  • Author(s): E. Arima, S. Takada, K.Isoyama, M. Kaneiwa, Y. Naitoh, Y. J. Li and Y. Sugawara
  • Organizer: International Conference on Noncontact Atomic Force Microscopy 2013
  • Place of Presentation: Maryland, USA
  • Invited
• [Presentation] Surface Potential Clarification by Non-Feedback Kelvin Probe Force Microscopy (2013)
  • Author(s): L. Kou, R. Kanbayashi, Z. Ma, Y. Naitoh, Y. J. Li
  • Organizer: International Conference on Noncontact Atomic Force Microscopy 2013
  • Place of Presentation: Maryland, USA
  • Invited
• [Presentation] Atomic resolution optical imaging of the α-Al2O3(0001) surface by measuring photon-induced force (2013)
  • Author(s): T. Tokuyama, M. Furukawa, S. Yamada, Y. Naitoh, Y. J. Li, and Y. Sugawara
  • Organizer: International Conference on Noncontact Atomic Force Microscopy 2013
  • Place of Presentation: Maryland, USA
  • Invited
• [Presentation] Magnetic Force Microscopy Using Ferromagnetic Resonance (2013)
  • Author(s): Y. Sugawara, E. Arima, K. Isoyama, Y. Naitoh and Y. J. Li
  • Organizer: The 7th International Conference on Materials Engineering for Resources
  • Place of Presentation: Akita
  • Invited
• [Presentation] 走査型プローブ顕微鏡(SPM) (2012)
  • Author(s): 菅原康弘
  • Organizer: 第54回表面科学基礎講座表面・界面分析の基礎と応用
  • Place of Presentation: 大阪大学
  • Year and Date: 2012-10-16
• [Presentation] Atom Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low-Temperature AFM (2012)
  • Author(s): Y. Sugawara and Y. J. Li
  • Organizer: Annual Meeting of The Chinese Vacuum Society (CVS-2012)
  • Place of Presentation: Lanzhou, China
• [Presentation] Investigation of TiO_2 Surface by Using Atomic Force Microscopy/Spectroscopy (2012)
  • Author(s): Y. Sugawara
  • Organizer: The 3rd Annual World Congress of Catalytic Asymmetric Synthesis (WCCAS-2012)
  • Place of Presentation: Beijing, China
• [Presentation] Investigation of TiO2 Surface by Using Atomic Force Microscopy/Spectroscopy (2012)
  • Author(s): Y. Sugawara
  • Organizer: The 3rd Annual World Congress of Catalytic Asymmetric Synthesis (WCCAS-2012)
  • Place of Presentation: Beijing, China
  • Invited
• [Presentation] Heterodyne Kelvin Probe Force Microscopy with High Potential Sensitivity (2012)
  • Author(s): Y. Sugawara, L. Kou, Z. Ma, Y. Naitoh and Y. J. Li
  • Organizer: 15th International COnference on Noncontact Atomic Force Microscopy (NC-AFM 2012)
  • Place of Presentation: Cesky Krumlov, Czech Republic
• [Presentation] Atomic Manipulation and Three-dimensional Force Spectroscopy on Cu(110)-O Surface with LT NC-AFM (2012)
  • Author(s): Y. Sugawara, Y. Kinoshita, Y. Naitoh, and Y. J. Li
  • Organizer: International Conference on Nanoscience & Technology (ICN+T 2012)
  • Place of Presentation: Paris, France
• [Book] マイクロビームアナリシスハンドブック (2014)
  • Author(s): 菅原康弘(分担)
  • Total Pages: 5
  • Publisher: オーム社
• [Remarks]
  • URL: http://nanophysics.ap.eng.osaka-u.ac.jp/
• [Remarks] Nnao Physics Laboratory
  • URL: http://nanophysics.ap.eng.osaka-u.ac.jp/
• [Remarks] 大阪大学大学院工学研究科精密科学・応用物理学専攻ナノ物性工学領域
  • URL: http://nanophysics.ap.eng.osaka-u.ac.jp/