High Sensitive and High Resolution Imaging of Magnetic Exchange Force Microscopy Using Ferromagnetic Resonance
| Project/Area Number |
24656035
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Osaka University |
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Principal Investigator |
SUGAWARA YASUHIRO 大阪大学, 工学(系)研究科(研究院), 教授 (40206404)
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| Project Period (FY) |
2012-04-01 – 2014-03-31
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| Project Status |
Completed (Fiscal Year 2013)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2013: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2012: ¥2,340,000 (Direct Cost: ¥1,800,000、Indirect Cost: ¥540,000)
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| Keywords | 磁気交換力顕微鏡 / 磁気交換力 / 強磁性共鳴 / スピン / 走査型プローブ顕微鏡 / 交換力 / 磁気モーメント / 原子間力顕微鏡 |
|---|
| Research Abstract |
In the magnetic exchange force microscopy, separate measurement of the structural information and the magnetic one on the surface has not been realized. In the present study, we have proposed a new magnetic exchange force microscopy using the ferromagnetic resonance, which can measure the structural information and the magnetic one on the surface separately. We have improved the performance of various technical elements used in the magnetic exchange force microscopy.
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Report
(3 results)
Research Products
(28 results)
