Development of the reflection-type terahertz polarizing microscope
| Project/Area Number |
24656054
|
|---|
| Research Category |
Grant-in-Aid for Challenging Exploratory Research
|
| Allocation Type | Single-year Grants |
|---|
| Research Field |
Applied optics/Quantum optical engineering
|
|---|
| Research Institution | Keio University |
|---|
Principal Investigator |
|
|---|
| Project Period (FY) |
2012-04-01 – 2014-03-31
|
| Project Status |
Completed (Fiscal Year 2013)
|
| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2013: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2012: ¥2,600,000 (Direct Cost: ¥2,000,000、Indirect Cost: ¥600,000)
|
|---|
| Keywords | テラヘルツ/赤外材料・素子 / 計測工学 / 画像 / リモートセンシング / 計測光学 |
|---|
| Research Abstract |
In the present study, we succeeded in the development of the imaging system of the terahertz wave using its polarization information in addition to its amplitude and phase information, and showing a new application of the surface topography measurement of materials. Moreover, we succeeded in the improvement of the spinning electro-optic sensor method that we invented, and overcoming various problems for the practical use such as downsizing the device, the high-speed imaging system using a CCD camera, and the evaluation of the measurement error.
|
Report
(3 results)
Research Products
(33 results)
