| Project/Area Number |
24656259
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| Research Category |
Grant-in-Aid for Challenging Exploratory Research
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| Allocation Type | Single-year Grants |
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| Research Field |
Measurement engineering
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| Research Institution | Doshisha University |
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Principal Investigator |
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| Co-Investigator(Kenkyū-buntansha) |
YANAGITANI Takahiko 名古屋工業大学, 工学(系)研究科(研究院), 助教 (10450652)
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| Project Period (FY) |
2012 – 2013
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| Project Status |
Completed (Fiscal Year 2013)
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| Budget Amount *help |
¥4,030,000 (Direct Cost: ¥3,100,000、Indirect Cost: ¥930,000)
Fiscal Year 2013: ¥1,560,000 (Direct Cost: ¥1,200,000、Indirect Cost: ¥360,000)
Fiscal Year 2012: ¥2,470,000 (Direct Cost: ¥1,900,000、Indirect Cost: ¥570,000)
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| Keywords | 計測システム / 光散乱 / 圧電 / 半導体 / 非接触 / 音速 |
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| Research Abstract |
A non contact and non destructive measurement system of longitudinal wave velocity in GaN crystals was successfully developed by using a Brillouin light scattering technique. This technique enables to measure velocities in the GHz range, where the piezoelectricity in the conductive material is expected to appear. Using this technique, we could obtain the temperature dependence of longitudinal wave velocity in the conductive GaN crystal. In addition, a velocity dispersion was found in the semi conductive GaN crystal, which was similar to the weak relaxation behavior accompanied by the piezoelectric stiffening effect.
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