| Budget Amount *help |
¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2013: ¥1,690,000 (Direct Cost: ¥1,300,000、Indirect Cost: ¥390,000)
Fiscal Year 2012: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
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| Research Abstract |
A permanent-magnet electron-beam ion trap apparatus optimised for use at a beamline has been designed and constructed. The design goals were i) to use permanent magnets, avoiding the cost, complexity, and loss of detection solid angle inherent to superconducting magnets, ii) a field strength in the trap of over 1 T, iii) a large field of view for fluorescence detection, and iv) initial electron beam parameters of 1 mA, 5 keV. The vacuum chamber, magnetic pole pieces, and other parts of the magnetic circuit were designed, constructed, and tested, along with an electron gun system. Presently, a field strength of 0.8 T has been reached using 16 out of a possible 32 magnets. An electron beam of current 1 mA and energy 1 keV has been successfully passed through the trap, and the production of argon ions demonstrated by detecting fluorescence at visible wavelengths.
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