| Project/Area Number |
24760027
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| Research Category |
Grant-in-Aid for Young Scientists (B)
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| Allocation Type | Multi-year Fund |
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| Research Field |
Thin film/Surface and interfacial physical properties
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| Research Institution | Kyoto University |
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Principal Investigator |
ICHII Takashi 京都大学, 工学(系)研究科(研究院), 助教 (30447908)
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| Research Collaborator |
SUGIMURA Hiroyuki 京都大学, 大学院工学研究科, 教授 (10293656)
MURASE Kuniaki 京都大学, 大学院工学研究科, 教授 (30283633)
NEGAMI Masahiro 京都大学, 大学院工学研究科, 修士課程学生
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| Project Period (FY) |
2012-04-01 – 2014-03-31
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| Project Status |
Completed (Fiscal Year 2013)
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| Budget Amount *help |
¥4,550,000 (Direct Cost: ¥3,500,000、Indirect Cost: ¥1,050,000)
Fiscal Year 2013: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Fiscal Year 2012: ¥3,120,000 (Direct Cost: ¥2,400,000、Indirect Cost: ¥720,000)
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| Keywords | イオン液体 / 固ー液界面 / 電気化学 / 原子間力顕微鏡 / 走査プローブ顕微鏡 / 固-液界面 / 界面 |
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| Research Abstract |
We newly developed an electrochemical frequency modulation atomic force microscope (EC-FM-AFM) for imaging on ionic-liquid(IL)/electrode interfaces. A quartz tuning fork sensor was used as a force sensor instead of a Si cantilever, which enabled atomic-resolution imaging even in viscous ionic liquid. In addition, the AFM system was installed in a vacuum chamber in order to reduce the effect of water. By using this AFM, reconstruction of ions on the IL/electrode interface was directly visualized.
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