Proactive Maintenance through Health Monitoring Strategies for Power Module Degradation

Research Project

Project/Area Number	24K22955
Research Category	Grant-in-Aid for Research Activity Start-up
Allocation Type	Multi-year Fund
Review Section	0302:Electrical and electronic engineering and related fields
Research Institution	Kyushu University
Principal Investigator	HASSAN Mohamed・Salah・Mohamed 九州大学, 応用力学研究所, 学術研究員 (70976779)
Project Period (FY)	2024-07-31 – 2026-03-31
Project Status	Granted (Fiscal Year 2024)
Budget Amount *help	¥2,860,000 (Direct Cost: ¥2,200,000、Indirect Cost: ¥660,000) Fiscal Year 2025: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000) Fiscal Year 2024: ¥1,430,000 (Direct Cost: ¥1,100,000、Indirect Cost: ¥330,000)
Keywords	Lifetime Prediction / Avalanche Robustness / Health Monitoring / Power Cycling / Reliability
Outline of Research at the Start	After reviewing over 100 research journal papers in the field, it was found that chip-induced failures and assembly-induced failures have been individually studied for lifetime prediction. However, no research has been conducted on the perspective of simultaneously addressing multiple failures.