| Project/Area Number |
25220904
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| Research Category |
Grant-in-Aid for Scientific Research (S)
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| Allocation Type | Single-year Grants |
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| Research Field |
Electron device/Electronic equipment
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| Research Institution | Japan Advanced Institute of Science and Technology |
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Principal Investigator |
MIZUTA HIROSHI 北陸先端科学技術大学院大学, 先端科学技術研究科, 教授 (90372458)
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| Co-Investigator(Renkei-kenkyūsha) |
MURUGANATHAN Manoharan 北陸先端科学技術大学院大学, 先端科学技術研究科, 講師 (20639322)
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| Research Collaborator |
SUN Jian 北陸先端科学技術大学院大学, 先端科学技術研究科, 博士研究員
HUYNH Van Ngoc 北陸先端科学技術大学院大学, 先端科学技術研究科, 博士研究員
SCHMIDT Edward Marek 北陸先端科学技術大学院大学, 先端科学技術研究科, 博士研究員
CHONG Harold サザンンプトン大学, 物理科学工学部, 准教授
TSUCHIYA Yoshishige サザンプトン大学, 物理科学工学部, 講師
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| Project Period (FY) |
2013-05-31 – 2018-03-31
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| Project Status |
Completed (Fiscal Year 2017)
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| Budget Amount *help |
¥162,240,000 (Direct Cost: ¥124,800,000、Indirect Cost: ¥37,440,000)
Fiscal Year 2017: ¥21,710,000 (Direct Cost: ¥16,700,000、Indirect Cost: ¥5,010,000)
Fiscal Year 2016: ¥20,020,000 (Direct Cost: ¥15,400,000、Indirect Cost: ¥4,620,000)
Fiscal Year 2015: ¥15,600,000 (Direct Cost: ¥12,000,000、Indirect Cost: ¥3,600,000)
Fiscal Year 2014: ¥34,450,000 (Direct Cost: ¥26,500,000、Indirect Cost: ¥7,950,000)
Fiscal Year 2013: ¥70,460,000 (Direct Cost: ¥54,200,000、Indirect Cost: ¥16,260,000)
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| Keywords | グラフェン / NEMS / センサ / スイッチ / 単分子検出 / ゼプトグラム / サブサーマルスイッチング / マイクロ・ナノデバイス / ナノマシン / ナノ材料 / 電子デバイス・機器 / 先端機能デバイス / １分子計測(SMD) / １分子計測 |
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| Outline of Final Research Achievements |
We built graphene nano-electro-mechanical-system (GNEMS) fabrication technology along with atom-scale simulation and succeeded to develop a GNEMS sensor which enables high-speed and room temperature detection of electrical resistance change caused by a single CO2 molecule physisorbed on graphene as well as a GNEMS sensor which detects zeptogram (10E-21 g) level mass change due to molecular adsorption. We also developed a novel GNEMS switch successfully and demonstrated low-voltage (～1 V) sub-thermal switching with the subthreshold slope ～10 mV/dec and downscaling of device dimensions simultaneously, which are hardly achievable with conventional MEMS technology.
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| Assessment Rating |
Verification Result (Rating)
A
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Assessment Rating |
Result (Rating)
A: Progress in the research is steadily towards the initial goal. Expected research results are expected.
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