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Assembly and charge transfer mechanism of nanostructures on insulator surfaces using atomic force microscopy

Research Project

Project/Area Number 25246027
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Thin film/Surface and interfacial physical properties
Research InstitutionOsaka University

Principal Investigator

SUGAWARA YASUHIRO  大阪大学, 工学(系)研究科(研究院), 教授 (40206404)

Co-Investigator(Kenkyū-buntansha) LI Yanjun  大阪大学, 大学院工学研究科, 准教授 (50379137)
NAITOH Yoshitaka  大阪大学, 大学院工学研究科, 助教 (90362665)
Project Period (FY) 2013-04-01 – 2016-03-31
Project Status Completed (Fiscal Year 2015)
Budget Amount *help
¥39,260,000 (Direct Cost: ¥30,200,000、Indirect Cost: ¥9,060,000)
Fiscal Year 2015: ¥4,160,000 (Direct Cost: ¥3,200,000、Indirect Cost: ¥960,000)
Fiscal Year 2014: ¥15,600,000 (Direct Cost: ¥12,000,000、Indirect Cost: ¥3,600,000)
Fiscal Year 2013: ¥19,500,000 (Direct Cost: ¥15,000,000、Indirect Cost: ¥4,500,000)
Keywords走査プローブ顕微鏡 / 走査型プローブ顕微鏡
Outline of Final Research Achievements

The electronic structure of nanostructures grown on insulator surfaces would be strongly influenced by charge transfers to or from the surface defects, dramatically changing the physical and chemical properties of the nanostructures. Therefore, in order for us to be able to design and realize nanostructures with the desired novel functionality, e.g., a certain catalytic property, it is critical that we have a detailed understanding of the interaction between nanostructures and surface defects.In this research project, we clarified the charge transfer phenomena between defects and nanostructures on insulator surfaces and investigated the relationship between the structure and the charge state of the nanostructures.

Report

(4 results)
  • 2015 Annual Research Report   Final Research Report ( PDF )
  • 2014 Annual Research Report
  • 2013 Annual Research Report
  • Research Products

    (30 results)

All 2016 2015 2014 2013 Other

All Int'l Joint Research (2 results) Journal Article (9 results) (of which Int'l Joint Research: 2 results,  Peer Reviewed: 9 results,  Open Access: 8 results,  Acknowledgement Compliant: 8 results) Presentation (15 results) (of which Int'l Joint Research: 5 results,  Invited: 10 results) Book (1 results) Remarks (3 results)

  • [Int'l Joint Research] King’s College London(United Kingdom)

    • Related Report
      2015 Annual Research Report
  • [Int'l Joint Research] Slovak Academy of Science(Slovakia)

    • Related Report
      2015 Annual Research Report
  • [Journal Article] Distance dependence of atomic-resolution near-field imaging on α-Al2O3 (0001) surface with respect to surface photovoltage of silicon probe tip2016

    • Author(s)
      Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara
    • Journal Title

      Nano Research

      Volume: 9 Issue: 2 Pages: 530-536

    • DOI

      10.1007/s12274-015-0934-4

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Growth Models of Coexisting p(21) and c(62) Phases on Oxygen-Terminated Cu(110) Surface Studied by Noncontact Atomic Force Microscopy at 782016

    • Author(s)
      Yan Jun Li, Seung Hwan Lee, Yukinori Kinoshita, Zong Min Ma, Huanfei Wen, Hikaru Nomura, Yoshitaka Naitoh, and Yasuhiro Sugawara
    • Journal Title

      Nanotechnology

      Volume: 27 Issue: 20 Pages: 205702-205708

    • DOI

      10.1088/0957-4484/27/20/205702

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Open Access / Int'l Joint Research / Acknowledgement Compliant
  • [Journal Article] Magnetic force microscopy using tip magnetization modulated by ferromagnetic resonance2015

    • Author(s)
      Eiji Arima, Yoshitaka Naitoh, Yan Jun Li, Satoru Yoshimura, Hitoshi Saito, Hikaru Nomura, Ryoichi Nakatani and Yasuhiro Sugawara
    • Journal Title

      Nanotechnology

      Volume: 26 Issue: 12 Pages: 125701-6

    • DOI

      10.1088/0957-4484/26/12/125701

    • Related Report
      2015 Annual Research Report 2014 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback2015

    • Author(s)
      L. Kou, Z. M. Ma, Y. J. Li, Y. Naitoh, M. Komiyama, and Y. Sugawara
    • Journal Title

      Nanotechnology

      Volume: 26 Issue: 19 Pages: 195701-195701

    • DOI

      10.1088/0957-4484/26/19/195701

    • Related Report
      2015 Annual Research Report 2014 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Atomic-Resolution Imaging of the Optical Near Field Based on the Surface Photovoltage of a Silicon Probe Tip2015

    • Author(s)
      Yasuhiro Sugawara, Junsuke Yamanishi, Takashi Tokuyama, Yoshitaka Naitoh, and Yan Jun Li
    • Journal Title

      PHYSICAL REVIEW APPLIED

      Volume: 3 Issue: 4

    • DOI

      10.1103/physrevapplied.3.044020

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film2015

    • Author(s)
      Yan Jun Li, J Brndiar, Y Naitoh, Y Sugawara and I Štich
    • Journal Title

      Atomic force microscopy identification of Al-sites on ultrathin aluminum oxide film

      Volume: 26 Issue: 50 Pages: 505704-505708

    • DOI

      10.1088/0957-4484/26/50/505704

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Open Access / Int'l Joint Research / Acknowledgement Compliant
  • [Journal Article] Image Formation and Contrast Inversion in NC-AFM Imaging of the Oxidized Cu(110) Surfaces2014

    • Author(s)
      J. Bamidele, Y. Kinoshita, R. Turansky, S. H. Lee, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, L. Kantorovich
    • Journal Title

      Phys. Rev. B

      Volume: 90 Issue: 3 Pages: 035410-035417

    • DOI

      10.1103/physrevb.90.035410

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism2014

    • Author(s)
      J. Bamidele, S. H. Lee, Y. Kinoshita, R. Turansky, Y. Naitoh, Y. J. Li, Y. Sugawara, I. Stich, and L. Kantorovich
    • Journal Title

      Nature Commun.

      Volume: 5 Issue: 1 Pages: 1-7

    • DOI

      10.1038/ncomms5476

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Open Access / Acknowledgement Compliant
  • [Journal Article] The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes2013

    • Author(s)
      Z. Ma, L. Kou, Y. Naitoh, Y. J. Li and Y. Sugawara
    • Journal Title

      Nanotechnol

      Volume: 24 Issue: 22 Pages: 225701-225701

    • DOI

      10.1088/0957-4484/24/22/225701

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Presentation] Atomic-scale Imaging of Electronic Properties of the Surface by Electrostatic Force Microscopy2015

    • Author(s)
      H. F. Wen, M. Suesada, Y. Naitoh, Y. J. Li and Y. Sugawara
    • Organizer
      EMN Bangkok Meeting (Eenergy, Materials, Nanotechnology)
    • Place of Presentation
      Bangkok, Thailand
    • Year and Date
      2015-11-10
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Atomic Resolution Imaging of Photon-induced Force on the Sapphire α-Al2O3(0001) Surface2015

    • Author(s)
      Y. Sugawara, J. Yamanishi, Y. Naitoh and Y. J. Li
    • Organizer
      The international symposium on “Recent Trends in Analysis Techniques for Functional Materials and Devices”
    • Place of Presentation
      Osaka University, Japan
    • Year and Date
      2015-11-03
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Atomic Resolution Imaging of Photon-induced Force on the Sapphire α-Al2O3(0001) Surface2015

    • Author(s)
      Y. Sugawara, J. Yamanishi, Y. Naitoh and Y. J. Li
    • Organizer
      Noncontact Atomic Force Microscopy 2015
    • Place of Presentation
      Cassis, France
    • Year and Date
      2015-09-07
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Atomic Resolution Imaging of topography and optical near-field on insulating Surface2015

    • Author(s)
      J. Yamanishi, Y. Naitoh, Y. J. Li, Y. Sugawara
    • Organizer
      The Third China-Japan symposium on Nanomedicine
    • Place of Presentation
      Beijing, China
    • Year and Date
      2015-06-19
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] Atomic Resolution Imaging of topography and optical near-field on the sapphire α-Al2O3 (0001) Surface2015

    • Author(s)
      Y. Sugawara, J. Yamanishi, Y. Naitoh, Y. J. Li
    • Organizer
      Collaborative Conference on 3D and Materials Research (CC3DMR)
    • Place of Presentation
      Busan, South Krorea
    • Year and Date
      2015-06-15
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] SPMによる原子レベル表面磁性計測の最先端2014

    • Author(s)
      菅原康弘
    • Organizer
      日本顕微鏡学会シンポジウム
    • Place of Presentation
      九州大学百年講堂(福岡県福岡市)
    • Year and Date
      2014-11-17
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] Surface Potential Measurement of TiO2(110) by Using Atomic Force microscopy (AFM)/Kelvin Probe Force Microscopy (KPFM)2014

    • Author(s)
      Y. Sugawara, L. Kou, R. Kanbarashi, H. F. Wen and Y. J. Li
    • Organizer
      Collaborative Conference on 3D & Materials Research
    • Place of Presentation
      Incheon, Korea
    • Year and Date
      2014-06-24
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] 走査型プローブ顕微鏡(SPM)2014

    • Author(s)
      菅原康弘
    • Organizer
      第57回表面科学基礎講座
    • Place of Presentation
      大阪大学コンベンションセンター(大阪府吹田市)
    • Year and Date
      2014-06-04 – 2014-06-14
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] Atomic resolution Imaging of Optical Near-field on the Au(111) Surface Using Force Detection2014

    • Author(s)
      Y. Sugawara, S. Yamada, M. Furukawa, T. Tokuyama, J. Yamanishi, Y. Naitoh, and Y. J. Li
    • Organizer
      The second Japan-China Symposium on Nanomedicine
    • Place of Presentation
      広島大学(広島県広島市)
    • Year and Date
      2014-05-16 – 2014-05-17
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] Atomic Manipulation and Force Spectroscopy on Cu(110)-O Surface with Low Temperature FM-AFM2013

    • Author(s)
      Y. Sugawara
    • Organizer
      The 4th European Nanomanipulation Workshop
    • Place of Presentation
      Kraków, Poland
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Presentation] Heterodyne FM-KPFM to measure charge polarization induced by tip-sample chemical interaction2013

    • Author(s)
      Y. Sugawara, L. Kou, Z. Ma, Y. Naitoh and Y. J. Li
    • Organizer
      International Conference on Noncontact Atomic Force Microscopy 2013
    • Place of Presentation
      Maryland, USA
    • Related Report
      2013 Annual Research Report
  • [Presentation] Measurement of NiO(001) surface with magnetic exchange force microscopy using ferromagnetic resonance2013

    • Author(s)
      E. Arima, S. Takada, K.Isoyama, M. Kaneiwa, Y. Naitoh, Y. J. Li and Y. Sugawara
    • Organizer
      International Conference on Noncontact Atomic Force Microscopy 2013
    • Place of Presentation
      Maryland, USA
    • Related Report
      2013 Annual Research Report
  • [Presentation] Atomic resolution optical imaging of the α-Al2O3(0001) surface by measuring photon-induced force2013

    • Author(s)
      T. Tokuyama, M. Furukawa, S. Yamada, Y. Naitoh, Y. J. Li, and Y. Sugawara
    • Organizer
      International Conference on Noncontact Atomic Force Microscopy 2013
    • Place of Presentation
      Maryland, USA
    • Related Report
      2013 Annual Research Report
  • [Presentation] Surface Potential Clarification by Non-Feedback Kelvin Probe Force Microscopy2013

    • Author(s)
      L. Kou, R. Kanbayashi, Z. Ma, Y. Naitoh, Y. J. Li
    • Organizer
      International Conference on Noncontact Atomic Force Microscopy 2013
    • Place of Presentation
      Maryland, USA
    • Related Report
      2013 Annual Research Report
  • [Presentation] Magnetic Force Microscopy Using Ferromagnetic Resonance2013

    • Author(s)
      Y. Sugawara, E. Arima, K. Isoyama, Y. Naitoh and Y. J. Li
    • Organizer
      The 7th International Conference on Materials Engineering for Resources
    • Place of Presentation
      Akita, Japan
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Book] マイクロビームアナリシスハンドブック2014

    • Author(s)
      菅原康弘(分担者)
    • Total Pages
      5
    • Publisher
      オーム社
    • Related Report
      2013 Annual Research Report
  • [Remarks] Sugawara and Li Group

    • URL

      http://nanophysics.ap.eng.osaka-u.ac.jp/

    • Related Report
      2015 Annual Research Report
  • [Remarks] 大阪大学大学院工学研究科応用物理学コース ナノ物性工学領域

    • URL

      http://nanophysics.ap.eng.osaka-u.ac.jp/

    • Related Report
      2014 Annual Research Report
  • [Remarks] Nano Physics Laboratory

    • URL

      http://nanophysics.ap.eng.osaka-u.ac.jp/

    • Related Report
      2013 Annual Research Report

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Published: 2013-05-15   Modified: 2019-07-29  

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