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Study of carrier scattering mechanisms by Ge isotope and interface roughness in Ge thin films

Research Project

Project/Area Number 25249032
Research Category

Grant-in-Aid for Scientific Research (A)

Allocation TypeSingle-year Grants
Section一般
Research Field Electronic materials/Electric materials
Research InstitutionThe University of Tokyo

Principal Investigator

Toriumi Akira  東京大学, 工学(系)研究科(研究院), 教授 (50323530)

Project Period (FY) 2013-04-01 – 2016-03-31
Project Status Completed (Fiscal Year 2015)
Budget Amount *help
¥46,670,000 (Direct Cost: ¥35,900,000、Indirect Cost: ¥10,770,000)
Fiscal Year 2015: ¥6,760,000 (Direct Cost: ¥5,200,000、Indirect Cost: ¥1,560,000)
Fiscal Year 2014: ¥7,540,000 (Direct Cost: ¥5,800,000、Indirect Cost: ¥1,740,000)
Fiscal Year 2013: ¥32,370,000 (Direct Cost: ¥24,900,000、Indirect Cost: ¥7,470,000)
Keywords電子デバイス / 半導体物性 / ゲルマニウム / 同位体 / 界面散乱
Outline of Final Research Achievements

By annealing Ge substrate in H2, we have achieved atomically flat Ge surface. As a result, the electron mobility at high electron density has been significantly improved. On the other hand, concerning the Ge isotope effects, we have unfortunately not succeeded in homo-epitaxial growth of 74Ge on Ge substrate. However, we found rather important results that oxygen-related defects in Ge affected the electron peak mobility and they could be annihilated by H2 annealing. Both new findings surely explore Ge CMOS future.

Report

(4 results)
  • 2015 Annual Research Report   Final Research Report ( PDF )
  • 2014 Annual Research Report
  • 2013 Annual Research Report
  • Research Products

    (105 results)

All 2016 2015 2014 2013 Other

All Journal Article (11 results) (of which Peer Reviewed: 11 results) Presentation (92 results) (of which Int'l Joint Research: 16 results,  Invited: 15 results) Remarks (2 results)

  • [Journal Article] Non-destructive Characterization of Oxide/germanium Interface by Direct-gap Photoluminescence Analysis2015

    • Author(s)
      S. Kabuyanagi, T. Nishimura, T. Yajima and A. Toriumi
    • Journal Title

      Applied Physics Express

      Volume: 8 Issue: 5 Pages: 051301-051303

    • DOI

      10.7567/apex.8.051301

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] "Reliability assessment of germanium gate stacks with promising initial characteristics. "2015

    • Author(s)
      Cimang Lu, Choong Hyun Lee, Tomonori Nishimura, Kosuke Nagashio, and Akira Toriumi
    • Journal Title

      Applied Physics Express

      Volume: 8 Issue: 2 Pages: 021301-021301

    • DOI

      10.7567/apex.8.021301

    • NAID

      210000137374

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] "Structural and thermodynamic consideration of metal oxide doped GeO2 for gate stack formation on germanium."2014

    • Author(s)
      Cimang Lu, Choong Hyun Lee, Wenfeng Zhang, Tomonori Nishimura, Kosuke Nagashio, and Akira Toriumi
    • Journal Title

      Journal of Applied Physics

      Volume: 116 Issue: 17

    • DOI

      10.1063/1.4901205

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] "Significant enhancement of High-Ns Electron Mobility in Ge n-MOSFETs with Atomically Flat Ge/GeO2 Interface."2014

    • Author(s)
      C. H. Lee, T. Nishimura, C. Lu, W. Zhang, K. Nagashio, and A. Toriumi
    • Journal Title

      ECS Transactions

      Volume: 61(3) Issue: 3 Pages: 147-156

    • DOI

      10.1149/06103.0147ecst

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] "Atomically flat planarization of Ge(100), (110), and (111) surfaces in H2 annealing. "2014

    • Author(s)
      Tomonori Nishimura, Shoichi Kabuyanagi, Wenfeng Zhang, Choong Hyun Lee, Takeaki Yajima, Kosuke Nagashio, and Akira Toriumi
    • Journal Title

      Applied Physics Express

      Volume: 7 Issue: 5 Pages: 051301-051301

    • DOI

      10.7567/apex.7.051301

    • NAID

      210000137073

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Enhancement of thermal stability and water resistance in yttrium-doped GeO2/Ge gate stack2014

    • Author(s)
      C. Lu, C. H. Lee, W. Zhang, T. Nishimura, K. Nagashio, and A. Toriumi
    • Journal Title

      Applied Physics Letters

      Volume: 104 Issue: 9 Pages: 92909-92909

    • DOI

      10.1063/1.4868032

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Impacts of oxygen passivation on poly-crystalline germanium thin film transistor2014

    • Author(s)
      S. Kabuyanagi, T. Nishimura, K. Nagashio and A. Toriumi
    • Journal Title

      Thin Solid Films

      Volume: 557 Pages: 334-337

    • DOI

      10.1016/j.tsf.2013.11.133

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Characterization of electron mobility in ultrathin body germanium-on-insulator metal-insulator-semiconductor field-effect transistors2013

    • Author(s)
      C. H. Lee, T. Nishimura, T. Tabata, D. D. Zhao, K. Nagashio, and A. Toriumi
    • Journal Title

      Applied Physics Letters

      Volume: 102 Issue: 23

    • DOI

      10.1063/1.4810002

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Conduction band offset at Ge02/Ge interface determined by internal photoemission and charge-corrected x-rav photoelectron spectroscopies2013

    • Author(s)
      W. F. Zhang
    • Journal Title

      Applied Physics Letters

      Volume: 102 Issue: 10 Pages: 102106-1

    • DOI

      10.1063/1.4794417

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] "Atomically Flat Germanium (111) Surface by Hydrogen Annealing"2013

    • Author(s)
      T. Nishimura, S. Kabuyanagi, C. H. Lee, T. Yajima, K. Nagashio and A. Toriumi
    • Journal Title

      ECS Transactions

      Volume: 58(9) Issue: 9 Pages: 201-206

    • DOI

      10.1149/05809.0201ecst

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] "High Electron Mobility in Germanium Junctionless n-MOSFETs"2013

    • Author(s)
      S. Kabuyanagi, T. Nishimura, K. Nagashio and A. Toriumi
    • Journal Title

      ECS Transactions

      Volume: 58(9) Issue: 9 Pages: 309-315

    • DOI

      10.1149/05809.0309ecst

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Presentation] 「イオン注入操作によって単結晶ゲルマニウム中に生じる欠陥のDLTSによる解析」2016

    • Author(s)
      池谷 大樹、西村 知紀、矢嶋 赳彬、鳥海 明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学(東京都・目黒区)
    • Year and Date
      2016-03-20
    • Related Report
      2015 Annual Research Report
  • [Presentation] 「Geにおける正孔と電子のフォノン周波数に対する影響の違い」2016

    • Author(s)
      株柳 翔一、西村 知紀、矢嶋 赳彬、鳥海 明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学(東京都・目黒区)
    • Year and Date
      2016-03-20
    • Related Report
      2015 Annual Research Report
  • [Presentation] 「界面ダイポール密度の制御による金属/Ge界面のフェルミレベルピンニング緩和の試み」2016

    • Author(s)
      西村 知紀、矢嶋 赳彬、鳥海 明
    • Organizer
      第63回応用物理学会春季学術講演会
    • Place of Presentation
      東京工業大学(東京都・目黒区)
    • Year and Date
      2016-03-19
    • Related Report
      2015 Annual Research Report
  • [Presentation] 「知っておくと得するゲルマニウム制御の三つの基本」2016

    • Author(s)
      鳥海 明
    • Organizer
      電子デバイス界面テクノロジー研究会(第21回)
    • Place of Presentation
      東レ研修センター(静岡県・三島市)
    • Year and Date
      2016-01-22
    • Related Report
      2015 Annual Research Report
    • Invited
  • [Presentation] "Characterization of defects in Ge substrates using deep-level transient spectroscopy (DLTS)"2016

    • Author(s)
      H. Ikegaya, T. Nishimura, and A. Toriumi
    • Organizer
      9th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration
    • Place of Presentation
      東北大学(宮城県・仙台市)
    • Year and Date
      2016-01-11
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 「Ge基板中酸素の役割-良いこと、悪いこと-」2015

    • Author(s)
      鳥海 明
    • Organizer
      NWDTF2015 in KOCHI
    • Place of Presentation
      高知工科大学(高知県・高知市)
    • Year and Date
      2015-12-19
    • Related Report
      2015 Annual Research Report
  • [Presentation] "Effects of free-carriers on rigid band and bond descriptions in germanium - Key to designing and modeling in Ge nano-devices -"2015

    • Author(s)
      S. Kabuyanagi, and A. Toriumi
    • Organizer
      2015 IEEE International Electron Devices Meeting(IEDM)
    • Place of Presentation
      Washington D.C. (USA)
    • Year and Date
      2015-12-09
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Structural coordination of rigidity with flexibility in gate dielectric films for sub-nm EOT Ge gate stack reliability"2015

    • Author(s)
      C. Lu, and A. Toriumi
    • Organizer
      2015 IEEE International Electron Devices Meeting(IEDM)
    • Place of Presentation
      Washington D.C. (USA)
    • Year and Date
      2015-12-08
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Preferential oxidation of Si in SiGe for shaping Ge-rich SiGe gate stacks"2015

    • Author(s)
      C.T. Chang, and A. Toriumi
    • Organizer
      2015 IEEE International Electron Devices Meeting(IEDM)
    • Place of Presentation
      Washington D.C. (USA)
    • Year and Date
      2015-12-08
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Materials and Process Controls in Germanium Gate Stacks"2015

    • Author(s)
      A. Toriumi
    • Organizer
      46th IEEE Semiconductor Interface Specialists Conference(SISC)
    • Place of Presentation
      Arlington, VA (USA)
    • Year and Date
      2015-12-04
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] "Effects of Ge Substrate Annealing in H2 on Electron Mobility and on Junction Leakage in n-Channel Ge Mosfets"2015

    • Author(s)
      A. Toriumi, C. Lee, and T. Nishimura
    • Organizer
      228th ECS Meeting
    • Place of Presentation
      Phoenix, AZ (USA)
    • Year and Date
      2015-10-14
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] "Gate-Bias Dependent Phonon Softening Observed in Ge Mosfets"2015

    • Author(s)
      S. Kabuyanagi, T. Nishimura, T. Yajimia, and A. Toriumi
    • Organizer
      228th ECS Meeting
    • Place of Presentation
      Phoenix, AZ (USA)
    • Year and Date
      2015-10-13
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Direct Evidence of Freecarrier Induced Bandgap Narrowing in Ge"2015

    • Author(s)
      S. Kabuyanagi, T. Nishimura, T. Yajimia, and A. Toriumi
    • Organizer
      2015 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      札幌コンベンションセンター(北海道・札幌市)
    • Year and Date
      2015-09-29
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Beyond GeO2 on Ge: Network Modification of GeO2 for Reliable Ge Gate Stacks"2015

    • Author(s)
      C. Lu, C.H. Lee, T. Nishimura, and A. Toriumi
    • Organizer
      2015 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      札幌コンベンションセンター(北海道・札幌市)
    • Year and Date
      2015-09-29
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Thermodynamic Knob for High Performance SiGe Gate Stack Formation"2015

    • Author(s)
      C.T. Chang, T. Nishimura, and A. Toriumi
    • Organizer
      2015 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      札幌コンベンションセンター(北海道・札幌市)
    • Year and Date
      2015-09-29
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Observation of Plastic and Elastic Deformations in Ge Films of Bonded GeOI"2015

    • Author(s)
      T. Nishimura, T. Nakamura, T. Yajima, and A. Toriumi
    • Organizer
      2015 International Conference on Solid State Devices and Materials(SSDM)
    • Place of Presentation
      札幌コンベンションセンター(北海道・札幌市)
    • Year and Date
      2015-09-29
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 「フリーキャリア密度に依存したGeの電子物性およびフォノン物性」2015

    • Author(s)
      株柳 翔一、西村 知紀、矢嶋 赳彬、鳥海 明
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場(愛知県・名古屋市)
    • Year and Date
      2015-09-16
    • Related Report
      2015 Annual Research Report
  • [Presentation] "Interface-aware high-k dielectric designing for deep sub-nm EOT Ge gate stack"2015

    • Author(s)
      C. Lu, C. Lee, T. Nishimura, and A. Toriumi
    • Organizer
      第76回応用物理学会秋季学術講演会
    • Place of Presentation
      名古屋国際会議場(愛知県・名古屋市)
    • Year and Date
      2015-09-14
    • Related Report
      2015 Annual Research Report
    • Invited
  • [Presentation] 「Ge-CMOSのためのGeO2/Ge界面制御」2015

    • Author(s)
      鳥海 明
    • Organizer
      第76回応用物理学会秋季学術講演会, シンポジウム(越境する絶縁膜/半導体界面技術 ~ Si から Non-Si へ)
    • Place of Presentation
      名古屋国際会議場(愛知県・名古屋市)
    • Year and Date
      2015-09-14
    • Related Report
      2015 Annual Research Report
    • Invited
  • [Presentation] "How to secure both sufficient passivation and long term reliability in Ge gate stack -The key is to keep a proper network structure of oxides-"2015

    • Author(s)
      C. Lu, T. Nishimura, and A. Toriumi
    • Organizer
      第76回応用物理学会秋季学術講演会, シンポジウム(Ge-CMOSはどこまで進んでいるのか)
    • Place of Presentation
      名古屋国際会議場(愛知県・名古屋市)
    • Year and Date
      2015-09-13
    • Related Report
      2015 Annual Research Report
    • Invited
  • [Presentation] 「どこまでGe-CMOS技術は進んでいるのか - イントロダクション -」2015

    • Author(s)
      鳥海 明
    • Organizer
      第76回応用物理学会秋季学術講演会, シンポジウム(Ge-CMOSはどこまで進んでいるのか)
    • Place of Presentation
      名古屋国際会議場(愛知県・名古屋市)
    • Year and Date
      2015-09-13
    • Related Report
      2015 Annual Research Report
    • Invited
  • [Presentation] "Opportunities of high performance Ge CMOS"2015

    • Author(s)
      A. Toriumi
    • Organizer
      Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors V
    • Place of Presentation
      Lake Tahoe, California (USA)
    • Year and Date
      2015-06-17
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Design and Demonstration of Reliability-Aware Ge Gate Stacks with 0.5 nm EOT"2015

    • Author(s)
      C. Lu, C. H. Lee, T. Nishimura, and A. Toriumi
    • Organizer
      2015 Symposium on VLSI Technology
    • Place of Presentation
      リーガロイヤルホテル京都(京都府・京都市)
    • Year and Date
      2015-06-16
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Effect of Free Carrier Accumulation or Depletion on Zone-center Vibrational Mode in Ge"2015

    • Author(s)
      S. Kabuyanagi, T. Nishimura, T. Yajima, and A. Toriumi
    • Organizer
      2015 Silicon Nanoelectronics Workshop
    • Place of Presentation
      リーガロイヤルホテル京都(京都府・京都市)
    • Year and Date
      2015-06-15
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] "Recent progress of Ge junction technology"2015

    • Author(s)
      T. Nishimura, C. H. Lee, T. Nakamura, T. Yajima, K. Nagashio, K. Kita, and A. Toriumi
    • Organizer
      15th International Workshop on Junction Technology (IWJT2015)
    • Place of Presentation
      京都大学宇治キャンパス(京都府・宇治市)
    • Year and Date
      2015-06-12
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] "H2 Annealing Effects of Ge Substrate both on Electron Mobility and on Junction Leakage in Ge n-MOSFETs"2015

    • Author(s)
      A. Toriumi, C. H. Lee, and T. Nishimura
    • Organizer
      The 2015 E-MRS Spring Meeting
    • Place of Presentation
      Lille (France)
    • Year and Date
      2015-05-14
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research / Invited
  • [Presentation] 「Reliability-aware Germanium Gate Stack Formation by GeO2 Network Modification」2015

    • Author(s)
      Cimang Lu, Choong Hyun Lee, Tomonori Nishimura, Kosuke Nagashio, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-14
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「Design of High-k and Interfacial Layer on Germanium for 0.5nm EOT」2015

    • Author(s)
      Cimang Lu, Choong Hyun Lee, Tomonori Nishimura, Kosuke Nagashio, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-14
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「Non-destructive Characterization of Oxide/Ge Interface by Photoluminescence Measurement」2015

    • Author(s)
      Shoichi Kabuyanagi, Tomonori Nishimura, Takeaki Yajima, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-12
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「n+Si/pGe Heterojunctions Fabricated by Narrow Membrane Bonding」2015

    • Author(s)
      Chi Liu, Shoichi Kabuyanagi, Tomonori Nishimura, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-12
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「Inspection of elastic stress and generated defects in thin Ge filmon GeOI wafer」2015

    • Author(s)
      Toshimitsu Nakamura, Tomonori Nishimura, Takeaki Yajima, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-12
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「Phonon-softening in Germanium by Free Carrier Accumulation -Experimental Distinction between Impurity and Free Carrier Effect-」2015

    • Author(s)
      Shoichi Kabuyanagi, Tomonori Nishimura, Takeaki Yajima, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-12
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「2-nm-EOT Y-Si-O Gate Stack Formation on Si0.5Ge0.5」2015

    • Author(s)
      CheTsung Chang, Tomonori Nishimura, Akira Toriumi
    • Organizer
      2015 第62回応用物理学会春季学術講演会
    • Place of Presentation
      東海大学湘南キャンパス(神奈川県 平塚市)
    • Year and Date
      2015-03-12
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「電子濃度および界面の境界条件に強く依存したGeの電子構造」2015

    • Author(s)
      株柳 翔一, 西村 知紀, 矢嶋 赳彬, 鳥海 明
    • Organizer
      第20回ゲートスタック研究会
    • Place of Presentation
      東レ研修センター(静岡県 三島市)
    • Year and Date
      2015-01-31
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「Critical Roles of Doped-Metal Cation in GeO2 for Gate Stack Formation on Ge」2015

    • Author(s)
      Cimang Lu, Choong Hyun Lee, Tomonori Nishimura, Akira Toriumi
    • Organizer
      第20回ゲートスタック研究会
    • Place of Presentation
      東レ研修センター(静岡県 三島市)
    • Year and Date
      2015-01-31
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Study of Raman Peak Shift in Heavily Doped Germanium - A new research opportunity using ultra-thin GeOI"2015

    • Author(s)
      Shoichi Kabuyanagi, Tomonori Nishimura, Takeaki Yajima, and Akira Toriumi
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      TOHOKU University (Miyagi,Sendai)
    • Year and Date
      2015-01-29
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Impact of Hydrogen-induced Out-diffusion of Oxygen from Ge Surface on Junction Leakage and Electron Mobility in Ge n-MOSFETs"2015

    • Author(s)
      C. H. Lee, T. Nishimura, C. Lu, S. Kabuyanagi, and A. Toriumi
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      TOHOKU University (Miyagi,Sendai)
    • Year and Date
      2015-01-29
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Dielectric Film Engineering for Ge-rich SiGe MOS Gate Stacks"2015

    • Author(s)
      C-T. Chang, T. Nishimura and A. Toriumi
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      TOHOKU University (Miyagi,Sendai)
    • Year and Date
      2015-01-29
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Fabrication and Characterization of n+Si/pGe Heterojunctions by Narrow Membrane Bonding"2015

    • Author(s)
      Tony C. Liu, Shoichi Kabuyanagi, Tomonori Nishimura, and Akira Toriumi
    • Organizer
      8th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar
    • Place of Presentation
      TOHOKU University (Miyagi,Sendai)
    • Year and Date
      2015-01-29
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Dramatic Effects of Hydrogen-induced Out-diffusion of Oxygen from Ge Surface on Junction Leakage as well as Electron Mobility in n-channel Ge MOSFETs"2014

    • Author(s)
      C. H. Lee, T. Nishimura, C. Lu, S. Kabuyanagi and A. Toriumi
    • Organizer
      IEDM 2014
    • Place of Presentation
      San Francisco (USA)
    • Year and Date
      2014-12-17
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Interface Friendly High-k Dielectrics for Sub-nm EOT Gate Stacks Formation on Germanium"2014

    • Author(s)
      C. Lu, C. H. Lee, T. Nishimura, and A. Toriumi
    • Organizer
      2014 IEEE 45th SISC
    • Place of Presentation
      San Diego (USA)
    • Year and Date
      2014-12-13
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Merits and demerits of H2-annealing in GeO2/Ge gate stacks"2014

    • Author(s)
      T. Nishimura, S. Kabuyanagi, C. H. Lee, T. Yajima, K. Nagashio, and A. Toriumi
    • Organizer
      JSPS International Core-to-Core Program Workshop on Atomically Controlled Processing for Ultra-large Scale Integration
    • Place of Presentation
      Leuven (Belgium)
    • Year and Date
      2014-11-13
    • Related Report
      2014 Annual Research Report
  • [Presentation] "High Electron Mobility n-Channel Ge MOSFETs with Sub-Nm EOT"2014

    • Author(s)
      A. Toriumi, C. Lee, C. Lu, and T. Nishimura
    • Organizer
      ECS 226th Meeting
    • Place of Presentation
      Cuncun (Mexico)
    • Year and Date
      2014-10-06
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] "Impact of YScO3 on Ge Gate Stack in Terms of EOT Reduction as Well as Interface"2014

    • Author(s)
      C. Lu, C.H. Lee, T. Nishimura1,2, K. Nagashio and A. Toriumi
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM 2014)
    • Place of Presentation
      Tsukuba International Congress Center(Ibaraki, Tsukuba)
    • Year and Date
      2014-09-08 – 2014-09-11
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Origin of Self-limiting Oxidation of Ge in High-Pressure O2 at Low Temperature"2014

    • Author(s)
      C.H. Lee, T. Nishimura1,2, K. Nagashio and A. Toriumi
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM 2014)
    • Place of Presentation
      Tsukuba International Congress Center(Ibaraki, Tsukuba)
    • Year and Date
      2014-09-08 – 2014-09-11
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Toward 1-nm-EOT Hf0.5Zr0.5O2 Ferroelectric Films"2014

    • Author(s)
      T. Nishimura, T. Yajima, K. Nagashio, and A. Toriumi
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM 2014)
    • Place of Presentation
      Tsukuba International Congress Center(Ibaraki, Tsukuba)
    • Year and Date
      2014-09-08 – 2014-09-11
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Validity of Direct-gap Photoluminescence Analysis for Nondestructive Characterization of Oxide/Germanium Interface"2014

    • Author(s)
      S. Kabuyanagi, T. Nishimura, T. Yajima, K. Nagashio, and A. Toriumi
    • Organizer
      International Conference on Solid State Devices and Materials (SSDM 2014)
    • Place of Presentation
      Tsukuba International Congress Center(Ibaraki, Tsukuba)
    • Year and Date
      2014-09-08 – 2014-09-11
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Be more positive about Ge FETs"2014

    • Author(s)
      A. Toriumi
    • Organizer
      AWAD 2014
    • Place of Presentation
      Kanazawa Bunka Hall (Ishikawa, Kanazawa)
    • Year and Date
      2014-07-03
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] "Thermally Robust CMOS-aware Ge MOSFETs with High Mobility at High-carrier Densities on a Single Orientation Ge Substrate"2014

    • Author(s)
      C. H. Lee, C. Lu, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      Symposium on VLSI Technology (VLSI)
    • Place of Presentation
      Hawaii (USA)
    • Year and Date
      2014-06-11
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Conduction-band Tail States of Thermally Grown GeO2 on Ge Detected by Internal Photoemission Spectroscopy"2014

    • Author(s)
      W.F. Zhang, C.H. Lee, T.Nishimura,and A. Toriumi
    • Organizer
      2014 Silicon nanoelectronic workshop
    • Place of Presentation
      Hawaii (USA)
    • Year and Date
      2014-06-08 – 2014-06-09
    • Related Report
      2014 Annual Research Report
  • [Presentation] "Atomic-scale planarization of Ge (111), (110) and (100) surfaces"2014

    • Author(s)
      T. Nishimura, C. Lee, T. Yajima, K. Nagashio, and A. Toriumi
    • Organizer
      International SiGe Technology and Device Meeting (ISTDM)
    • Place of Presentation
      Singapore
    • Year and Date
      2014-06-03
    • Related Report
      2014 Annual Research Report
  • [Presentation] "High electron mobility n-channel Ge MOSFETs with sub-nm EOT"2014

    • Author(s)
      A. Toriumi, C. H. Lee, C. Lu, and T. Nishimura
    • Organizer
      International SiGe Technology and Device Meeting (ISTDM)
    • Place of Presentation
      Singapore
    • Year and Date
      2014-06-02
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] "Advanced Gate Stacks on Column IV Semiconductors from Materials Perspective"2014

    • Author(s)
      A. Toriumi
    • Organizer
      International Conference on IC Design and Technology (ICICDT 2014)
    • Place of Presentation
      Austin (USA)
    • Year and Date
      2014-05-28
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] "Significant enhancement of High-Ns Electron Mobility in Ge n-MOSFETs with Atomically Flat Ge/GeO2 Interface"2014

    • Author(s)
      C. H. Lee, T. Nishimura, C. Lu, W. Zhang, K. Nagashio, and A. Toriumi
    • Organizer
      The 225th Electrochemical Society Meeting (ECS)
    • Place of Presentation
      Orlando (USA)
    • Year and Date
      2014-05-11 – 2014-05-15
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] "Thermodynamically Controlled GeO2 by Introducing M2O3 for Ultra-thin EOT Ge Gate Stacks"2014

    • Author(s)
      Cimang Lu, Choong Hyun Lee, Wenfeng Zhang, Tomonori Nishimura, Kosuke Nagashio, and Akira Toriumi
    • Organizer
      2014 MRS Spring
    • Place of Presentation
      San Francisco (USA)
    • Year and Date
      2014-04-21 – 2014-04-26
    • Related Report
      2014 Annual Research Report
  • [Presentation] 「Improvement of High-Ns Electron Mobility in Ge n-MOSFETs with Atomically Flat GeO2/Ge Interface」2014

    • Author(s)
      李 忠賢, 西村 知紀、魯 辞莽、張 文峰、長汐 晃輔、鳥海 明
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Pをイオン注入したGeにおける不純物活性化と結晶性の回復過程」2014

    • Author(s)
      中村俊允、西村友紀、長汐晃輔、鳥海明
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Electron Mobility and Leakage Current in Double-gated Ge Junctionless n-MOSFETs」2014

    • Author(s)
      株柳翔一, 西村知紀, 長汐晃輔, 鳥海明
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Multiple Origins of Direct-gap Modulation in Ultra-thin Highly-doped GeOI」2014

    • Author(s)
      株柳翔一, 西村知紀, 長汐晃輔, 鳥海明
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Network modification of GeO2 by trivalent metal oxide doping」2014

    • Author(s)
      C. Lu, C. H. Lee, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Thermodynamic selection of the desirable doping materials in GeO2」2014

    • Author(s)
      C. Lu, C. H. Lee, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Record-high Electron Mobility in Sub-nm EOT Ge n-MOSFETs with Y-doped GeO2 Interfacial Layer」2014

    • Author(s)
      李 忠賢,魯 辞莽、張 文峰、西村 知紀、長汐 晃輔、鳥海 明
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-20
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Conduction Band Tail States at GeO2/Ge Interface Probed by InternalPhotoemission Spectroscopy」2014

    • Author(s)
      W.F. Zhang, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-19
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Surface Cleaning of (100) n-Ge by H2O2 Aqueous Solution 」2014

    • Author(s)
      W.F. Zhang, C.M. Lu, C.H. Lee, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      2014年 第74回応用物理学会春季学術講演会
    • Place of Presentation
      青山学院大学相模原キャンパス(神奈川県 相模原市)
    • Year and Date
      2014-03-19
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Enhancement of High-Ns Electron Mobility in Ge(111) n-MOSFETs by the Formation of Atomically Flat GeO2/Ge Interface"2014

    • Author(s)
      C. H. Lee, T. Nishimura, C. Lu, W. F. Zhang, K. Nagashio, and A. Toriumi
    • Organizer
      7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      TOHOKU University(Sendai, Miyagi)
    • Year and Date
      2014-01-27 – 2014-01-28
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Direct Band Gap Modulation in Ultra-thin Highly Doped n-type GeOI"2014

    • Author(s)
      S. Kabuyanagi, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      TOHOKU University(Sendai, Miyagi)
    • Year and Date
      2014-01-27 – 2014-01-28
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Selection of desirable trivalent metal oxides as doping material into GeO2"2014

    • Author(s)
      C. Lu, C. H. Lee, W. Zhang, T. Nishimura, K. Nagashio and A. Toriumi
    • Organizer
      7th International WorkShop on New Group IV Semiconductor Nanoelectronics and JSPS Core-to-Core Program Joint Seminar "Atomically Controlled Processing for Ultralarge Scale Integration"
    • Place of Presentation
      TOHOKU University(Sendai, Miyagi)
    • Year and Date
      2014-01-27 – 2014-01-28
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Reconsideration of Electron Mobility in Ge n-MOSFETs from Ge Substrate Side -Atomically Flat Surface Formation, Layer-by-Layer Oxidation, and Dissolved Oxygen Extraction-"2013

    • Author(s)
      C.H. Lee, T. Nishimura, T.Tabata, C. Lu, W. Zhang, K. Nagashio, A. Toriumi
    • Organizer
      IEEE International Electron Device Meeting (IEDM)
    • Place of Presentation
      Washington DC (USA)
    • Year and Date
      2013-12-09
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Oxygen Potential Engineering of Interfacial Layer for Deep Sub-nm EOT High-k Gate Stacks on Ge"2013

    • Author(s)
      C.-H. Lee, C. Lu, T. Tabata, W. Zhang, T. Nishimura, K. Nagashio, A. Toriumi
    • Organizer
      IEEE International Electron Device Meeting (IEDM)
    • Place of Presentation
      Washington DC (USA)
    • Year and Date
      2013-12-09
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Robust Interfacial Layer Y-doped GeO2 for Scalable EOT Ge Gate Stacks"2013

    • Author(s)
      C. H. Lee, C. Lu, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      44th IEEE Semiconductor Interface Specialists Conference (SISC)
    • Place of Presentation
      Arlington (USA)
    • Year and Date
      2013-12-05 – 2013-12-07
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Time-evolution of Roughening Process on Atomically Flat Ge (111) Surface by Diluted H2O2 Solution"2013

    • Author(s)
      W.F. Zhang, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      44th IEEE Semiconductor Interface Specialists Conference (SISC)
    • Place of Presentation
      Arlington (USA)
    • Year and Date
      2013-12-05 – 2013-12-07
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Network modification of GeO2 by intermixing with trivalent oxides (Sc, Y and La)"2013

    • Author(s)
      C. Lu
    • Organizer
      IWDTF
    • Place of Presentation
      University of Tsukuba (Tokyo Campus)(Bunkyo-ku, Tokyo)
    • Year and Date
      2013-11-07 – 2013-11-09
    • Related Report
      2013 Annual Research Report
  • [Presentation] "High Electron Mobility in Germanium Junctionless n-MOSFETs"2013

    • Author(s)
      Shoichi Kabuyanagi, Tomonori Nishimura, Kosuke Nagashio and Akira Toriumi
    • Organizer
      224th ECS Meeting
    • Place of Presentation
      San Francisco (USA)
    • Year and Date
      2013-10-30
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Atomically Flat Germanium (111) Surface by Hydrogen Annealing"2013

    • Author(s)
      T. Nishimura, S. Kabuyanagi, C. H. Lee, T. Yajima, K. Nagashio, and A. Toriumi
    • Organizer
      224th ECS Meeting
    • Place of Presentation
      San Francisco (USA)
    • Year and Date
      2013-10-29
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Demonstration of High Electron Mobility in Germanium n-channel Junctionless FETs"2013

    • Author(s)
      S. Kabuyanagi, T. Nishimura, K.Nagashio and A.Toriumi
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Hilton Fukuoka Sea Hawk (Fukuoka, Fukuoka)
    • Year and Date
      2013-09-27
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Charge neutrality level shift in the Bardeen limit of Fermi-level pinning at atomically flat Ge/metal interface"2013

    • Author(s)
      T. Nishimura, T. Nakamura, T. Yajima, K. Nagashio and A.Toriumi
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Hilton Fukuoka Sea Hawk (Fukuoka, Fukuoka)
    • Year and Date
      2013-09-26
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Thermodynamic consideration and experimental demonstration for solving the problems of GeO2 solubility in H2O and GeO desorption from GeO2/Ge"2013

    • Author(s)
      C. Lu, C.H. Lee, W.F.Zhang, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Hilton Fukuoka Sea Hawk (Fukuoka, Fukuoka)
    • Year and Date
      2013-09-26
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Layer-by-Layer GeO2 Formation in the Self-Limited Oxidation Regime of Ge"2013

    • Author(s)
      C.H. Lee, T. Nishimura, T. Tabata, K. Nagashio, and A. Toriumi
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Hilton Fukuoka Sea Hawk (Fukuoka, Fukuoka)
    • Year and Date
      2013-09-26
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Effects of the Interface-related and Bulk-fixed Charges in Ge/GeO2 Stack on Band Bending of Ge Studied by X-ray Photoemission Spectroscopy"2013

    • Author(s)
      W.F. Zhang, C.H. Lee, C.M. Lu, T. Nishimura, K. Nagashio, K. Kita and A. Toriumi
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Hilton Fukuoka Sea Hawk (Fukuoka, Fukuoka)
    • Year and Date
      2013-09-26
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Effect of Oxygen Potential Lowering in N-doped GeO2 on Suppression of GeO Desorption and Planarization of Ge Interface",2013

    • Author(s)
      T. Tabata, C.H. Lee, T. Nishimura, K. Nagashio and A. Toriumi
    • Organizer
      2013 International Conference on Solid State Devices and Materials (SSDM)
    • Place of Presentation
      Hilton Fukuoka Sea Hawk (Fukuoka, Fukuoka)
    • Year and Date
      2013-09-26
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「多結晶Ge薄膜トランジスタの電気特性に及ぼす水素および酸素の影響」2013

    • Author(s)
      株柳翔一, 西村知紀, 長汐晃輔, 鳥海明
    • Organizer
      2013年 第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス(京都府, 京田辺市)
    • Year and Date
      2013-09-18
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Significant Enhancement of High-Ns electron mobility in Ge n-MOSFETs」2013

    • Author(s)
      李忠賢, 魯辞莽, 田畑俊行, 西村知紀, 長汐晃輔, 鳥海明
    • Organizer
      2013年 第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス(京都府, 京田辺市)
    • Year and Date
      2013-09-17
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Y ドープGeO2 界面層のY 濃度に依存した界面酸化膜形成」2013

    • Author(s)
      Lu Cimang, 李忠賢, 西村知紀, 長汐晃輔, 鳥海明
    • Organizer
      2013年 第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス(京都府, 京田辺市)
    • Year and Date
      2013-09-17
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Atomically Flat Planarization of Ge (110) and (100) Surface by H2 Annealing」2013

    • Author(s)
      西村知紀, 矢嶋赳彬, 長汐晃輔, 鳥海明
    • Organizer
      2013年 第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス(京都府, 京田辺市)
    • Year and Date
      2013-09-17
    • Related Report
      2013 Annual Research Report
  • [Presentation] 「Oxygen Potential Lowering in N-doped GeO2 for Ge MIS Gate Stack Design in Extremely Thin EOT Region 」2013

    • Author(s)
      田畑俊行, 李忠賢, 西村知紀, 長汐晃輔, 鳥海明
    • Organizer
      2013年 第74回応用物理学会秋季学術講演会
    • Place of Presentation
      同志社大学京田辺キャンパス(京都府, 京田辺市)
    • Year and Date
      2013-09-17
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Enhancement of High-Ns Electron Mobility in Sub-nm EOT Ge n-MOSFETs"2013

    • Author(s)
      C.H. Lee, C. Lu, T. Tabata, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      2013 Symposia on VLSI Technology
    • Place of Presentation
      Rihga Royal Hotel (Kyoto, Kyoto)
    • Year and Date
      2013-06-11
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Ultra-thin GeO2 Formation by Oxygen Radicals (O*) for Advanced Ge Gate Stacks - Reaction kinetics, film quality and MIS characteristics -"2013

    • Author(s)
      W. J. Song, W. F. Zhang, C. H. Lee, T. Nishimura, and A. Toriumi
    • Organizer
      2013 Silicon Nanoelectronics Workshop
    • Place of Presentation
      Rihga Royal Hotel (Kyoto, Kyoto)
    • Year and Date
      2013-06-09
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Impact of Oxidation Pressure on the Band Alignment at GeO2/GeProbed by Internal Photoemission Spectroscopy"2013

    • Author(s)
      W.F. Zhang, T. Nishimura, K. Nagashio, K. Kita, and A. Toriumi
    • Organizer
      ICSI-8 and ISCSI-VI
    • Place of Presentation
      Kyushu University School of Medicine (Fukuoka, Fukuoka)
    • Year and Date
      2013-06-06
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Study of Strong Fermi Level Pinning at Metal/Germanium Interface Based on the Impact of Ultra-thin Insulator Insertion"2013

    • Author(s)
      T. Nishimura, T. Nakamura, and A. Toriumi
    • Organizer
      ICSI-8 and ISCSI-VI
    • Place of Presentation
      Kyushu University School of Medicine (Fukuoka, Fukuoka)
    • Year and Date
      2013-06-04
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Ion Implantation-Induced Defects Generated in PN Junction Formation of Germanium"2013

    • Author(s)
      C. H. Lee, T. Nishimura, T. Tabata, K. Nagashio, and A. Toriumi
    • Organizer
      ICSI-8 and ISCSI-VI
    • Place of Presentation
      Kyushu University School of Medicine (Fukuoka, Fukuoka)
    • Year and Date
      2013-06-03
    • Related Report
      2013 Annual Research Report
  • [Presentation] "Effects of PDA Ambient on Leakage Current in Poly-Ge TFTs"2013

    • Author(s)
      S. Kabuyanagi, T. Nishimura, K. Nagashio, and A. Toriumi
    • Organizer
      ICSI-8 and ISCSI-VI
    • Place of Presentation
      Kyushu University School of Medicine (Fukuoka, Fukuoka)
    • Year and Date
      2013-06-03
    • Related Report
      2013 Annual Research Report
  • [Presentation] "High performance Ge n- and p-MOSFETs for advanced CMOS"2013

    • Author(s)
      A. Toriumi, C. H. Lee, T. Tabata, and T. Nishimura
    • Organizer
      E-MRS 2013 SPRING MEETING
    • Place of Presentation
      Strasbourg (France)
    • Year and Date
      2013-05-27
    • Related Report
      2013 Annual Research Report
    • Invited
  • [Remarks] 東京大学大学院工学系研究科 マテリアル工学専攻 鳥海研究室 成果発表

    • URL

      http://www.adam.t.u-tokyo.ac.jp/publication.html

    • Related Report
      2015 Annual Research Report
  • [Remarks] 鳥海研究室ホームページ

    • URL

      http://www.adam.t.u-tokyo.ac.jp/publication.html

    • Related Report
      2014 Annual Research Report 2013 Annual Research Report

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Published: 2013-05-15   Modified: 2017-05-10  

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