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Physical Design Technology Development for Advanced Lithography

Research Project

Project/Area Number 25280013
Research Category

Grant-in-Aid for Scientific Research (B)

Allocation TypePartial Multi-year Fund
Section一般
Research Field Computer system
Research InstitutionTokyo Institute of Technology

Principal Investigator

Takahashi Atsushi  東京工業大学, 理工学研究科, 教授 (30236260)

Co-Investigator(Kenkyū-buntansha) KOHIRA YUKIHIDE  会津大学, コンピュータ理工学部, 上級准教授 (00549298)
Project Period (FY) 2013-04-01 – 2016-03-31
Project Status Completed (Fiscal Year 2015)
Budget Amount *help
¥13,260,000 (Direct Cost: ¥10,200,000、Indirect Cost: ¥3,060,000)
Fiscal Year 2015: ¥4,420,000 (Direct Cost: ¥3,400,000、Indirect Cost: ¥1,020,000)
Fiscal Year 2014: ¥3,250,000 (Direct Cost: ¥2,500,000、Indirect Cost: ¥750,000)
Fiscal Year 2013: ¥5,590,000 (Direct Cost: ¥4,300,000、Indirect Cost: ¥1,290,000)
Keywords計算機システム / 設計技術 / 設計工学 / 製造容易化 / リソグラフィ
Outline of Final Research Achievements

Advanced lithography such as double exposure techniques, self-aligned processes realizes a tiny circuit pattern on a wafer but requires various physical design technologies to realize high performance integrated circuits efficiently. In this research, various physical design technologies for advanced lithography such as pattern decomposition algorithm, shortest path algorithm with turn prohibition constraints, and intensity distribution estimation algorithm are developed.

Report

(4 results)
  • 2015 Annual Research Report   Final Research Report ( PDF )
  • 2014 Annual Research Report
  • 2013 Annual Research Report
  • Research Products

    (66 results)

All 2016 2015 2014 2013

All Journal Article (30 results) (of which Peer Reviewed: 17 results,  Acknowledgement Compliant: 22 results) Presentation (36 results) (of which Int'l Joint Research: 5 results,  Invited: 1 results)

  • [Journal Article] Yield-aware mask assignment by positive semidefinite relaxation in triple patterning using cut process2016

    • Author(s)
      Yukihide Kohira, Chikaaki Kodama, Tomomi Matsui, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Journal Title

      Journal of Micro/Nanolithography, MEMS, and MOEMS (JM3)

      Volume: 15 Issue: 2 Pages: 1-7

    • DOI

      10.1117/1.jmm.15.2.021207

    • NAID

      120006582497

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] A Fast Manufacturability Aware Optical Proximity Correction (OPC) Algorithm with Adaptive Wafer Image Estimation2016

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Chikaaki Kodama
    • Journal Title

      Proc. Design, Automation and Test in Europe (DATE 2016)

      Volume: 2016 Pages: 49-54

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Grid-based Self-Aligned Quadruple Patterning Aware Two Dimensional Routing Pattern2016

    • Author(s)
      Takeshi Ihara, Toshiyuki Hongo, Atsushi Takahashi, Chikaaki Kodama
    • Journal Title

      Proc. Design, Automation and Test in Europe (DATE 2016)

      Volume: 2016 Pages: 241-244

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] 半正定値計画緩和に基づくMPLレイアウト分割のための補正項2016

    • Author(s)
      半田昌平,高橋篤司,中田和秀,松井知己
    • Journal Title

      電子情報通信学会 総合大会 講演論文集

      Volume: A Pages: 86-86

    • NAID

      110010023125

    • Related Report
      2015 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Self-Aligned Quadruple Patterningのための3色グリッド上の異色ネットを考慮した配線手法2016

    • Author(s)
      本江俊幸,高橋篤司
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 115-465 Pages: 137-142

    • Related Report
      2015 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Self-Aligned Double and Quadruple Patterning Aware Grid Routing Methods2015

    • Author(s)
      Chikaaki Kodama, Hirotaka Ichikawa, Koichi Nakayama, Fumiharu Nakajima, Shigeki Nojima, Toshiya Kotani, Takeshi Ihara, Atsushi Takahashi
    • Journal Title

      IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)

      Volume: 34-5 Issue: 5 Pages: 753-765

    • DOI

      10.1109/tcad.2015.2404878

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Effective Two-Dimensional Pattern Generation for Self-Aligned Double Patterning2015

    • Author(s)
      Takeshi Ihara, Atsushi Takahashi, Chikaaki Kodama
    • Journal Title

      Proc. International Symposium on Circuits and Systems (ISCAS 2015)

      Volume: 2015 Pages: 2141-2144

    • DOI

      10.1109/iscas.2015.7169103

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Self-Aligned Quadruple Patterningのための配線パターンの効率的な生成手法2015

    • Author(s)
      井原岳志,本江俊幸,高橋篤司
    • Journal Title

      DAシンポジウム2015論文集

      Volume: 2015 Pages: 125-130

    • NAID

      120006703934

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Mask Manufacturability Aware Post OPC Algorithm for Optical Lithography2015

    • Author(s)
      Ahmed Awad, Atsushi Takahashi
    • Journal Title

      DAシンポジウム2015論文集

      Volume: 2015 Pages: 119-124

    • NAID

      120006703932

    • Related Report
      2015 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] マスク位置ずれに対する耐性を持つLELECUTトリプルパターニングのためのマスク割り当て手法2015

    • Author(s)
      小平行秀,児玉親亮,松井知己,高橋篤司,野嶋茂樹,田中聡
    • Journal Title

      次世代リソグラフィワークショップNGL2015予稿集

      Volume: 2015 Pages: 35-36

    • Related Report
      2015 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Self-Aligned Quadruple Patterningのための3次配線アルゴリズムを用いた効率的な配線生成手法2015

    • Author(s)
      井原岳志,高橋篤司
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 115-338 Pages: 93-98

    • Related Report
      2015 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] 折れ曲がり制約を含む配線問題のNP完全性2015

    • Author(s)
      本江俊幸,高橋篤司
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 115-21 Pages: 13-18

    • NAID

      110009893644

    • Related Report
      2015 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Fast Mask Assignment using Positive Semidefinite Relaxation in LELECUT Triple Patterning Lithography2015

    • Author(s)
      Yukihide Kohira, Tomomi Matsui, Yoko Yokoyama, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Journal Title

      Proc. Asia and South Pacific Design Automation Conference 2015 (ASP-DAC 2015)

      Volume: 2015 Pages: 665-670

    • DOI

      10.1109/aspdac.2015.7059084

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Yield-aware mask assignment using positive semidefinite relaxation in LELECUT triple patterning2015

    • Author(s)
      Yukihide Kohira, Chikaaki Kodama, Tomomi Matsui, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Journal Title

      Proc. SPIE 9427, Design-Process-Technology Co-optimization for Manufacturability IX

      Volume: 9427 Pages: 1-9

    • DOI

      10.1117/12.2085285

    • NAID

      120006703558

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] A Fast Lithographic Mask Correction Algorithm2015

    • Author(s)
      Ahmed Awad, Atsushi Takahashi
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 114-476 Pages: 1-6

    • NAID

      110010018827

    • Related Report
      2014 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] 側壁プロセス配線におけるカットパターン削減手法2015

    • Author(s)
      高橋紀之,井原岳志,高橋篤司
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 114-476 Pages: 7-12

    • Related Report
      2014 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Rip-up and Reroute based Routing Algorithm for Self-Aligned Double Patterning2015

    • Author(s)
      Takeshi Ihara, Atsushi Takahashi, Chikaaki Kodama
    • Journal Title

      Proc. the 19th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI 2015)

      Volume: 19 Pages: 83-88

    • NAID

      120006703654

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] 半正定値緩和法を用いたLELECUTトリプルパターニングのためのレイアウト分割手法2014

    • Author(s)
      小平行秀,松井知己,横山陽子,児玉親亮,高橋篤司,野嶋茂樹,田中聡
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 114-59 Pages: 27-32

    • NAID

      110009781844

    • Related Report
      2014 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] LELEダブルパターニングのための歩留まりを考慮した高速マスク割り当て手法2014

    • Author(s)
      小平行秀,松井知己,横山陽子,児玉親亮,高橋篤司,野嶋茂樹,田中聡
    • Journal Title

      次世代リソグラフィワークショップNGL2014予稿集

      Volume: 2014 Pages: 41-42

    • Related Report
      2014 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] A New Intensity Based Edge Placement Error Optimization Algorithm for Optical Lithography2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Journal Title

      Proc. the 27th Workshop on Circuits and Systems

      Volume: 27 Pages: 422-427

    • NAID

      120006703318

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Mask Optimization With Minimal Number of Convolutions Using Intensity Difference Map2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Journal Title

      DAシンポジウム2014論文集

      Volume: 2014 Pages: 145-150

    • NAID

      120006703316

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] A Process Variability Band Area Reduction Algorithm For Optical Lithography2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Journal Title

      電子情報通信学会 ソサイエティ大会 講演論文集

      Volume: A Pages: 50-50

    • NAID

      110009881485

    • Related Report
      2014 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] A Fast Process Variation and Pattern Fidelity Aware Mask Optimization Algorithm2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Journal Title

      Proc. IEEE/ACM 2014 International Conference on Computer-Aided Design (ICCAD 2014)

      Volume: 2014 Pages: 238-245

    • DOI

      10.1109/iccad.2014.7001358

    • Related Report
      2014 Annual Research Report
    • Peer Reviewed / Acknowledgement Compliant
  • [Journal Article] Multi Patterning Techniques for Manufacturability Enhancement in Optical Lithography2014

    • Author(s)
      Atsushi Takahashi, Ahmed Awad, Yukihide Kohira, Tomomi Matsui, Chikaaki Kodama, Shigeki Nojima, Satoshi Tanaka
    • Journal Title

      Proc. the 2014 International Conference on Integrated Circuits, Design, and Verification (ICDV 2014)

      Volume: 2014 Pages: 117-122

    • Related Report
      2014 Annual Research Report
    • Acknowledgement Compliant
  • [Journal Article] Positive Semidefinite Relaxation and Approximation Algorithm for Triple Patterning Lithography2014

    • Author(s)
      Tomomi Matsui, Yukihide Kohira, Chikaaki Kodama, Atsushi Takahashi
    • Journal Title

      Algorithms and computation, Lecture Notes in Computer Science

      Volume: 8889 Pages: 365-375

    • DOI

      10.1007/978-3-319-13075-0_29

    • ISBN
      9783319130743, 9783319130750
    • Related Report
      2014 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Yield-aware decomposition for LELE double patterning2014

    • Author(s)
      Yukihide Kohira, Yoko Yokoyama, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Journal Title

      Proc. SPIE 9053, Design-Process-Technology Co-optimization for Manufacturability VIII

      Volume: 9053 Pages: 1-10

    • DOI

      10.1117/12.2046180

    • NAID

      120006703278

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] Localization concept of re-decomposition area to fix hotspots for LELE process2014

    • Author(s)
      Yoko Yokoyama, Keishi Sakanushi, Yukihide Kohira, Atsushi Takahashi, Chikaaki Kodama, Satoshi Tanaka, Shigeki Nojima
    • Journal Title

      Proc. SPIE 9053, Design-Process-Technology Co-optimization for Manufacturability VIII

      Volume: 9053 Pages: 1-8

    • DOI

      10.1117/12.2046263

    • NAID

      120006702996

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Journal Article] ダブルパターニングにおけるリソグラフィECOのためのパターン局所修正法2014

    • Author(s)
      宮辺祐太郎,高橋篤司,松井知己,小平行秀,横山陽子
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 113-454 Pages: 87-92

    • Related Report
      2013 Annual Research Report
  • [Journal Article] 側壁ダブルパターニングのための修正2色グリッド配線法2014

    • Author(s)
      井原岳志,高橋篤司,児玉親亮
    • Journal Title

      電子情報通信学会技術研究報告

      Volume: 113-454 Pages: 93-98

    • Related Report
      2013 Annual Research Report
  • [Journal Article] Overlap Area Maximization in Stitch Selection for LELE Double Patterning2013

    • Author(s)
      Yukihide Kohira, Yoko Takekawa, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Journal Title

      第26回 回路とシステムワークショップ論文集

      Volume: 26 Pages: 466-471

    • NAID

      120006702711

    • Related Report
      2013 Annual Research Report
    • Peer Reviewed
  • [Presentation] 半正定値計画緩和に基づくMPLレイアウト分割のための補正項2016

    • Author(s)
      半田昌平,高橋篤司,中田和秀,松井知己
    • Organizer
      電子情報通信学会 総合大会
    • Place of Presentation
      九州大学(福岡県)
    • Year and Date
      2016-03-15
    • Related Report
      2015 Annual Research Report
  • [Presentation] A Fast Manufacturability Aware Optical Proximity Correction (OPC) Algorithm with Adaptive Wafer Image Estimation2016

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      Design, Automation and Test in Europe (DATE 2016)
    • Place of Presentation
      ドレスデン国際会議センタ(ドイツ)
    • Year and Date
      2016-03-14
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Grid-based Self-Aligned Quadruple Patterning Aware Two Dimensional Routing Pattern2016

    • Author(s)
      Takeshi Ihara, Toshiyuki Hongo, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      Design, Automation and Test in Europe (DATE 2016)
    • Place of Presentation
      ドレスデン国際会議センタ(ドイツ)
    • Year and Date
      2016-03-14
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Self-Aligned Quadruple Patterningのための3色グリッド上の異色ネットを考慮した配線手法2016

    • Author(s)
      本江俊幸,高橋篤司
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      沖縄県青年会館(沖縄県)
    • Year and Date
      2016-02-29
    • Related Report
      2015 Annual Research Report
  • [Presentation] Self-Aligned Quadruple Patterningのための3次配線アルゴリズムを用いた効率的な配線生成手法2015

    • Author(s)
      井原岳志,高橋篤司
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      長崎県勤労福祉会館(長崎県)
    • Year and Date
      2015-12-01
    • Related Report
      2015 Annual Research Report
  • [Presentation] A Fast Lithographic Mask Manufacturing Cost Aware Optical Proximity Correction (OPC) Algorithm With Process Variability Consideration2015

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      IEEE/ACM the Workshop on Variability Modeling and Characterization (VMC)
    • Place of Presentation
      ダブルツリーオースチンホテル(米国)
    • Year and Date
      2015-11-05
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Self-Aligned Quadruple Patterningのための配線パターンの効率的な生成手法2015

    • Author(s)
      井原岳志,本江俊幸,高橋篤司
    • Organizer
      DAシンポジウム2015
    • Place of Presentation
      ゆのくに天祥(福井県)
    • Year and Date
      2015-08-26
    • Related Report
      2015 Annual Research Report
  • [Presentation] Mask Manufacturability Aware Post OPC Algorithm for Optical Lithography2015

    • Author(s)
      Ahmed Awad, Atsushi Takahashi
    • Organizer
      DAシンポジウム2015
    • Place of Presentation
      ゆのくに天祥(福井県)
    • Year and Date
      2015-08-26
    • Related Report
      2015 Annual Research Report
  • [Presentation] マスク位置ずれに対する耐性を持つLELECUTトリプルパターニングのためのマスク割り当て手法2015

    • Author(s)
      小平行秀,児玉親亮,松井知己,高橋篤司,野嶋茂樹,田中聡
    • Organizer
      次世代リソグラフィワークショップNGL2015
    • Place of Presentation
      蔵前会館(東京都)
    • Year and Date
      2015-07-06
    • Related Report
      2015 Annual Research Report
  • [Presentation] Effective Routing Pattern Generation for Self-Aligned Quadruple Patterning2015

    • Author(s)
      Takeshi Ihara, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      Design Automation Conference 2015 (DAC 2015)
    • Place of Presentation
      モスコーンセンタ(米国)
    • Year and Date
      2015-06-07
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] Effective Two-Dimensional Pattern Generation for Self-Aligned Double Patterning2015

    • Author(s)
      Takeshi Ihara, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      International Symposium on Circuits and Systems
    • Place of Presentation
      べレムカルチャーセンタ(ポルトガル)
    • Year and Date
      2015-05-24
    • Related Report
      2015 Annual Research Report
    • Int'l Joint Research
  • [Presentation] 折れ曲がり制約を含む配線問題のNP完全性2015

    • Author(s)
      本江俊幸,高橋篤司
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      北九州国際会議場(福岡県)
    • Year and Date
      2015-05-14
    • Related Report
      2015 Annual Research Report
  • [Presentation] Rip-up and Reroute based Routing Algorithm for Self-Aligned Double Patterning2015

    • Author(s)
      Takeshi Ihara, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      the 19th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI 2015)
    • Place of Presentation
      長栄鳳凰酒店(台湾)
    • Year and Date
      2015-03-16 – 2015-03-17
    • Related Report
      2014 Annual Research Report
  • [Presentation] A Fast Lithographic Mask Correction Algorithm2015

    • Author(s)
      Ahmed Awad, Atsushi Takahashi
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      沖縄県青年会館(沖縄県)
    • Year and Date
      2015-03-02 – 2015-03-04
    • Related Report
      2014 Annual Research Report
  • [Presentation] 側壁プロセス配線におけるカットパターン削減手法2015

    • Author(s)
      高橋紀之,井原岳志,高橋篤司
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      沖縄県青年会館(沖縄県)
    • Year and Date
      2015-03-02 – 2015-03-04
    • Related Report
      2014 Annual Research Report
  • [Presentation] Yield-aware mask assignment using positive semidefinite relaxation in LELECUT triple patterning2015

    • Author(s)
      Yukihide Kohira, Chikaaki Kodama, Tomomi Matsui, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      SPIE (Design-Process-Technology Co-optimization for Manufacturability IX)
    • Place of Presentation
      サンノゼ会議センタ(米国)
    • Year and Date
      2015-02-21 – 2015-02-25
    • Related Report
      2014 Annual Research Report
  • [Presentation] Fast Mask Assignment using Positive Semidefinite Relaxation in LELECUT Triple Patterning Lithography2015

    • Author(s)
      Yukihide Kohira, Tomomi Matsui, Yoko Yokoyama, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      Asia and South Pacific Design Automation Conference 2015 (ASP-DAC 2015)
    • Place of Presentation
      幕張メッセ(千葉県)
    • Year and Date
      2015-01-19 – 2015-01-22
    • Related Report
      2014 Annual Research Report
  • [Presentation] Positive Semidefinite Relaxation and Approximation Algorithm for Triple Patterning Lithography2014

    • Author(s)
      Tomomi Matsui, Yukihide Kohira, Chikaaki Kodama, Atsushi Takahashi
    • Organizer
      the 25th International Symposium on Algorithms and Computation (ISAAC 2014)
    • Place of Presentation
      全州伝統文化センター(韓国)
    • Year and Date
      2014-12-15 – 2014-12-17
    • Related Report
      2014 Annual Research Report
  • [Presentation] Multi Patterning Techniques for Manufacturability Enhancement in Optical Lithography2014

    • Author(s)
      Atsushi Takahashi, Ahmed Awad, Yukihide Kohira, Tomomi Matsui, Chikaaki Kodama, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      the 2014 International Conference on Integrated Circuits, Design, and Verification (ICDV 2014)
    • Place of Presentation
      工業技術大学(ベトナム)
    • Year and Date
      2014-11-14 – 2014-11-15
    • Related Report
      2014 Annual Research Report
    • Invited
  • [Presentation] A Fast Process Variation and Pattern Fidelity Aware Mask Optimization Algorithm2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Organizer
      IEEE/ACM 2014 International Conference on Computer-Aided Design (ICCAD 2014)
    • Place of Presentation
      ヒルトンサンノゼ(米国)
    • Year and Date
      2014-11-02 – 2014-11-06
    • Related Report
      2014 Annual Research Report
  • [Presentation] A Process Variability Band Area Reduction Algorithm For Optical Lithography2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Organizer
      電子情報通信学会 ソサイエティ大会
    • Place of Presentation
      徳島大学(徳島県)
    • Year and Date
      2014-09-23 – 2014-09-26
    • Related Report
      2014 Annual Research Report
  • [Presentation] Mask Optimization With Minimal Number of Convolutions Using Intensity Difference Map2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Organizer
      DAシンポジウム2014
    • Place of Presentation
      下呂温泉水明館(岐阜県)
    • Year and Date
      2014-08-28 – 2014-08-29
    • Related Report
      2014 Annual Research Report
  • [Presentation] A New Intensity Based Edge Placement Error Optimization Algorithm for Optical Lithography2014

    • Author(s)
      Ahmed Awad, Atsushi Takahashi, Satoshi Tanaka, Chikaaki Kodama
    • Organizer
      第27回 回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場(兵庫県)
    • Year and Date
      2014-08-04 – 2014-08-05
    • Related Report
      2014 Annual Research Report
  • [Presentation] LELEダブルパターニングのための歩留まりを考慮した高速マスク割り当て手法2014

    • Author(s)
      小平行秀,横山陽子,児玉親亮,高橋篤司,野嶋茂樹,田中聡
    • Organizer
      次世代リソグラフィワークショップNGL2014
    • Place of Presentation
      蔵前会館(東京都)
    • Year and Date
      2014-07-17 – 2014-07-18
    • Related Report
      2014 Annual Research Report
  • [Presentation] Positive Semidefinite Relaxation and Approximation Algorithm for Triple Patterning Lithography2014

    • Author(s)
      Tomomi Matsui, Yukihide Kohira, Chikaaki Kodama, Atsushi Takahashi
    • Organizer
      Design Automation Conference 2014 (DAC 2014)
    • Place of Presentation
      モスコーンセンタ(米国)
    • Year and Date
      2014-06-01 – 2014-06-05
    • Related Report
      2014 Annual Research Report
  • [Presentation] Density Balanced Layout Decomposition for Multiple Patterning Lithography by Positive Smidefinite Relaxation with Liner Objective Function2014

    • Author(s)
      Tomomi Matsui, Yukihide Kohira, Chikaaki Kodama, Atsushi Takahashi
    • Organizer
      Design Automation Conference 2014 (DAC 2014)
    • Place of Presentation
      モスコーンセンタ(米国)
    • Year and Date
      2014-06-01 – 2014-06-05
    • Related Report
      2014 Annual Research Report
  • [Presentation] LELECUT Triple Patterning Lithography Layout Decomposition using Positive Semidefinite Relaxation2014

    • Author(s)
      Yukihide Kohira, Tomomi Matsui, Yoko Yokoyama, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      Design Automation Conference 2014 (DAC 2014)
    • Place of Presentation
      モスコーンセンタ(米国)
    • Year and Date
      2014-06-01 – 2014-06-05
    • Related Report
      2014 Annual Research Report
  • [Presentation] Enhanced Two-color Grid Routing for Self-Aligned Double Patterning2014

    • Author(s)
      Takeshi Ihara, Atsushi Takahashi, Chikaaki Kodama
    • Organizer
      Design Automation Conference 2014 (DAC 2014)
    • Place of Presentation
      モスコーンセンタ(米国)
    • Year and Date
      2014-06-01 – 2014-06-05
    • Related Report
      2014 Annual Research Report
  • [Presentation] 半正定値緩和法を用いたLELECUTトリプルパターニングのためのレイアウト分割手法2014

    • Author(s)
      小平行秀,松井知己,横山陽子,児玉親亮,高橋篤司,野嶋茂樹,田中聡
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      北九州国際会議場(福岡県)
    • Year and Date
      2014-05-28 – 2014-05-29
    • Related Report
      2014 Annual Research Report
  • [Presentation] Yield-aware decomposition for LELE double patterning2014

    • Author(s)
      Yukihide Kohira, Yoko Yokoyama, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      SPIE (Design-Process-Technology Co-optimization for Manufacturability VIII)
    • Place of Presentation
      サンノゼ会議センタ(米国)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Localization concept of re-decomposition area to fix hotspots for LELE process2014

    • Author(s)
      Yoko Yokoyama, Keishi Sakanushi, Yukihide Kohira, Atsushi Takahashi, Chikaaki Kodama, Satoshi Tanaka, Shigeki Nojima
    • Organizer
      SPIE (Design-Process-Technology Co-optimization for Manufacturability VIII)
    • Place of Presentation
      サンノゼ会議センタ(米国)
    • Related Report
      2013 Annual Research Report
  • [Presentation] ダブルパターニングにおけるリソグラフィECOのためのパターン局所修正法2014

    • Author(s)
      宮辺祐太郎,高橋篤司,松井知己,小平行秀,横山陽子
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      沖縄県青年会館(沖縄県)
    • Related Report
      2013 Annual Research Report
  • [Presentation] 側壁ダブルパターニングのための修正2色グリッド配線法2014

    • Author(s)
      井原岳志,高橋篤司,児玉親亮
    • Organizer
      VLSI設計技術研究会
    • Place of Presentation
      沖縄県青年会館(沖縄県)
    • Related Report
      2013 Annual Research Report
  • [Presentation] A Study of Robust Stitch Design for Litho-etch-litho-etch Double Patterning2013

    • Author(s)
      Yoko Takekawa, Chikaaki Kodama, Atsushi Takahashi, Yukihide Kohira, Satoshi Tanaka, Keishi Sakanushi, Jiro Higuchi, Shigeki Nojima
    • Organizer
      Design for Manufacturability and Yield 2013 (DFM&Y2013)
    • Place of Presentation
      オースチン会議センタ(米国)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Minimum Cost Stitch Selection in LELE Double Patterning2013

    • Author(s)
      Yukihide Kohira, Yoko Takekawa, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      Design for Manufacturability and Yield 2013 (DFM&Y2013)
    • Place of Presentation
      オースチン会議センタ(米国)
    • Related Report
      2013 Annual Research Report
  • [Presentation] Overlap Area Maximization in Stitch Selection for LELE Double Patterning2013

    • Author(s)
      Yukihide Kohira, Yoko Takekawa, Chikaaki Kodama, Atsushi Takahashi, Shigeki Nojima, Satoshi Tanaka
    • Organizer
      第26回 回路とシステムワークショップ
    • Place of Presentation
      淡路夢舞台国際会議場(兵庫県)
    • Related Report
      2013 Annual Research Report

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Published: 2013-05-21   Modified: 2019-07-29  

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