Research on Built-in Self-Test to Enhance LSI Reliability through its Lifecycle
| Project/Area Number |
25280015
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| Research Category |
Grant-in-Aid for Scientific Research (B)
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| Allocation Type | Partial Multi-year Fund |
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| Section | 一般 |
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| Research Field |
Computer system
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| Research Institution | Nara Institute of Science and Technology |
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Principal Investigator |
Inoue Michiko 奈良先端科学技術大学院大学, 情報科学研究科, 教授 (30273840)
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| Co-Investigator(Kenkyū-buntansha) |
YONEDA Tomokazu 奈良先端科学技術大学院大学, 情報科学研究科, 助教 (20359871)
YAMATO Yuta 奈良先端科学技術大学院大学, 情報科学研究科, 助教 (20707244)
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| Project Period (FY) |
2013-04-01 – 2016-03-31
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| Project Status |
Completed (Fiscal Year 2015)
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| Budget Amount *help |
¥10,140,000 (Direct Cost: ¥7,800,000、Indirect Cost: ¥2,340,000)
Fiscal Year 2015: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
Fiscal Year 2014: ¥2,730,000 (Direct Cost: ¥2,100,000、Indirect Cost: ¥630,000)
Fiscal Year 2013: ¥4,680,000 (Direct Cost: ¥3,600,000、Indirect Cost: ¥1,080,000)
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| Keywords | LSI信頼性 / 組み込み自己テスト / IRドロップ / 組み込みメモリ / 計算機システム / ディペンダブル・コンピューティング / ディペダブル・コンピューティング |
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| Outline of Final Research Achievements |
We have conducted a research on LSI reliability through its lifecycle. Our achievement includes 1) reduction of test data volume and test application time of LSI Built-in Self-Test (BIST) so that LSI BIST can be applicable in field as well as at manufacturing test, 2) analysis of IR-drop and delay defects to improve test quality, and 3) embedded memory architecture to enhance reliability in field with combination of ECC and self-test and repair techniques.
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Report
(4 results)
Research Products
(13 results)
