Development of precise on-the-machine measurement system for large optics
Project/Area Number |
25287038
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Research Category |
Grant-in-Aid for Scientific Research (B)
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Allocation Type | Partial Multi-year Fund |
Section | 一般 |
Research Field |
Astronomy
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Research Institution | Kyoto University |
Principal Investigator |
kurita mikio 京都大学, 理学(系)研究科(研究院), 准教授 (20419427)
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Co-Investigator(Kenkyū-buntansha) |
木野 勝 京都大学, 理学(系)研究科(研究院), 助教 (40377932)
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Project Period (FY) |
2013-04-01 – 2016-03-31
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Project Status |
Completed (Fiscal Year 2015)
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Budget Amount *help |
¥19,500,000 (Direct Cost: ¥15,000,000、Indirect Cost: ¥4,500,000)
Fiscal Year 2015: ¥1,170,000 (Direct Cost: ¥900,000、Indirect Cost: ¥270,000)
Fiscal Year 2014: ¥5,330,000 (Direct Cost: ¥4,100,000、Indirect Cost: ¥1,230,000)
Fiscal Year 2013: ¥13,000,000 (Direct Cost: ¥10,000,000、Indirect Cost: ¥3,000,000)
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Keywords | 精密計測 / データ処理 / 精密加工 / 光赤外線天文学 / 計測工学 / アルゴリズム / 光学 / 計測 / 光学素子 / データスティッチング |
Outline of Final Research Achievements |
Interferometers do not work well for a convex or free form optics which does not have real focal point, and need precise reference surface meet with each test surface and large space for the system. A measurement having a capability of more large and free form testing is required for the optics in future astronomy. We developed a measurement system applying three-probe method, and confirmed its performance with measuring a concave mirror 800 mm in diameter. The result shows the good agreement with a result of Fizeu interferometer. The method is based on the classical theory of least squares. This method regards serial data as elastic body and integrates individual serial data naturally by solving minimum energy problem. Excellent improvements are performed in data procedure. This method can be executed by conventional numerical algorithm: finite element method (FEM) and has potential to be applied for the various fields and numerous data obtained so far and in future.
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Report
(5 results)
Research Products
(24 results)
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[Presentation] 大型鏡の機上計測2015
Author(s)
栗田光樹夫
Organizer
精密工学会
Place of Presentation
(株)クリスタル光学
Year and Date
2015-01-22
Related Report
Invited
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[Patent(Industrial Property Rights)] 表面形状計測装置2014
Inventor(s)
栗田光樹夫, 清野慧, 板津武志, 所仁志, 高橋啓介
Industrial Property Rights Holder
京都大学ナガセインテグレックスアストロエアロスペース
Industrial Property Rights Type
特許
Filing Date
2014-03-12
Acquisition Date
2018-02-23
Related Report
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